Method of Producing a Freestanding Thin Film of Nano-Crystalline Carbon
    1.
    发明申请
    Method of Producing a Freestanding Thin Film of Nano-Crystalline Carbon 有权
    制备纳米晶碳独立薄膜的方法

    公开(公告)号:US20160096734A2

    公开(公告)日:2016-04-07

    申请号:US14560919

    申请日:2014-12-04

    IPC分类号: C01B31/04 H01J37/31 H01J37/22

    摘要: A freestanding thin film of nano-crystalline graphite is described, as well as a method of producing a freestanding thin film of nano-crystalline graphite including: providing a freestanding thin film of amorphous carbon, heating the freestanding thin film to a high temperature in an inert atmosphere or in a vacuum; and allowing the freestanding thin film to cool down, as a result of which a freestanding thin film of nano-crystalline graphite is formed. The films can be used, for example, as phase plates in a Transmission Electron Microscope.

    摘要翻译: 描述了独立的纳米晶体石墨薄膜,以及制造纳米晶体石墨的独立薄膜的方法,包括:提供独立的无定形碳薄膜,将独立的薄膜加热到高温下 惰性气氛或真空中; 并且允许独立的薄膜冷却,由此形成独立的纳米晶体石墨薄膜。 这些膜可以用作例如透射电子显微镜中的相位板。

    METHOD OF EXAMINING A SAMPLE IN A CHARGED-PARTICLE MICROSCOPE
    2.
    发明申请
    METHOD OF EXAMINING A SAMPLE IN A CHARGED-PARTICLE MICROSCOPE 有权
    在充电颗粒显微镜中检测样品的方法

    公开(公告)号:US20150243474A1

    公开(公告)日:2015-08-27

    申请号:US14629387

    申请日:2015-02-23

    申请人: FEI Company

    摘要: Examining a sample in a charged-particle microscope of a scanning transmission type includes: Providing a beam of charged particles that is directed from a source through an illuminator so as to irradiate the sample; Providing a detector for detecting a flux of charged particles traversing the sample; Causing said beam to scan across a surface of the sample, and recording an output of the detector as a function of scan position, resulting in accumulation of a charged-particle image of the sample, Embodying the detector to comprise a plurality of detection segments; Combining signals from different segments of the detector so as to produce a vector output from the detector at each scan position, and compiling this data to yield a vector field; and Mathematically processing said vector field by subjecting it to a two-dimensional integration operation, thereby producing an integrated vector field image.

    摘要翻译: 在扫描透射型的带电粒子显微镜中检查样品包括:提供从源通过照射器引导以便照射样品的带电粒子束; 提供检测器,用于检测穿过样品的带电粒子的通量; 使所述光束扫描穿过样品的表面,并记录检测器的输出作为扫描位置的函数,导致样品的带电粒子图像的累积,使检测器包含多个检测段; 组合来自检测器的不同段的信号,以便在每个扫描位置产生从检测器输出的矢量,并且编译该数据以产生矢量场; 并通过使其进行二维积分操作来数字处理所述矢量场,由此产生积分矢量场图像。

    Method of examining a sample in a charged-particle microscope
    3.
    发明授权
    Method of examining a sample in a charged-particle microscope 有权
    在带电粒子显微镜中检查样品的方法

    公开(公告)号:US09312098B2

    公开(公告)日:2016-04-12

    申请号:US14629387

    申请日:2015-02-23

    申请人: FEI Company

    摘要: Examining a sample in a charged-particle microscope of a scanning transmission type includes: Providing a beam of charged particles that is directed from a source through an illuminator so as to irradiate the sample; Providing a detector for detecting a flux of charged particles traversing the sample; Causing said beam to scan across a surface of the sample, and recording an output of the detector as a function of scan position, resulting in accumulation of a charged-particle image of the sample, Embodying the detector to comprise a plurality of detection segments; Combining signals from different segments of the detector so as to produce a vector output from the detector at each scan position, and compiling this data to yield a vector field; and Mathematically processing said vector field by subjecting it to a two-dimensional integration operation, thereby producing an integrated vector field image.

    摘要翻译: 在扫描透射型的带电粒子显微镜中检查样品包括:提供从源通过照射器引导以便照射样品的带电粒子束; 提供检测器,用于检测穿过样品的带电粒子的通量; 使所述光束扫描穿过样品的表面,并记录检测器的输出作为扫描位置的函数,导致样品的带电粒子图像的累积,使检测器包含多个检测段; 组合来自检测器的不同段的信号,以便在每个扫描位置产生从检测器输出的矢量,并且编译该数据以产生矢量场; 并通过使其进行二维积分操作来数字处理所述矢量场,由此产生积分矢量场图像。

    METHOD OF PRODUCING A FREESTANDING THIN FILM OF NANO-CRYSTALLINE GRAPHITE
    5.
    发明申请
    METHOD OF PRODUCING A FREESTANDING THIN FILM OF NANO-CRYSTALLINE GRAPHITE 有权
    生产纳米结晶石墨片的薄膜的方法

    公开(公告)号:US20150151972A1

    公开(公告)日:2015-06-04

    申请号:US14560919

    申请日:2014-12-04

    申请人: FEI Company

    IPC分类号: C01B31/04 H01J37/31 H01J37/22

    摘要: A freestanding thin film of nano-crystalline graphite is described, as well as a method of producing a freestanding thin film of nano-crystalline graphite including: providing a freestanding thin film of amorphous carbon, heating the freestanding thin film to a high temperature in an inert atmosphere or in a vacuum; and allowing the freestanding thin film to cool down, as a result of which a freestanding thin film of nano-crystalline graphite is formed. The films can be used, for example, as phase plates in a Transmission Electron Microscope.

    摘要翻译: 描述了独立的纳米晶体石墨薄膜,以及制造纳米晶体石墨的独立薄膜的方法,包括:提供独立的无定形碳薄膜,将独立的薄膜加热到高温下 惰性气氛或真空中; 并且允许独立的薄膜冷却,由此形成独立的纳米晶体石墨薄膜。 这些膜可以用作例如透射电子显微镜中的相位板。