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    PIPELINED PIXEL APPLICATIONS IN LIQUID CRYSTAL ON SILICON CHIP
    1.
    发明申请
    PIPELINED PIXEL APPLICATIONS IN LIQUID CRYSTAL ON SILICON CHIP 有权
    液晶硅胶管中的管道像素应用

    公开(公告)号：US20140204330A1

    公开(公告)日：2014-07-24

    申请号：US13749536

    申请日：2013-01-24

    Applicant: FINISAR CORPORATION

    Inventor： Jonathan B. Ashbrook ,  Nicholas F. Jungels

    IPC: G02F1/13

    CPC classification number: G09G3/3688 ,  G02F2001/136281 ,  G02F2203/585 ,  G09G2310/0251 ,  G09G2310/0259 ,  G09G2310/0294 ,  H04Q11/0005 ,  H04Q2011/0035 ,  H04Q2011/0039

    Abstract: An example embodiment includes a LCOS IC. The LCOS IC includes multiple pixels, a column driver, and multiple conductive lines. The pixels are arranged in a pixel array. The column driver is configured to supply multiple signals to a column of pixels included in the pixel array. Each of the conductive lines couples the column driver to a subset of pixels in the column of pixels. The conductive lines are configured such that two or more of the signals can be supplied to two or more of the subsets of pixels with some overlapping duration.

    Abstract translation: 示例性实施例包括LCOS IC。 LCOS IC包括多个像素，列驱动器和多条导线。 像素被排列成像素阵列。 列驱动器被配置为向像素阵列中包括的像素列提供多个信号。 每个导线将列驱动器耦合到像素列中的像素的子集。 导线被配置为使得两个或更多个信号可以以一些重叠的持续时间提供给像素的两个或更多个子集。

    Pixel test in a liquid crystal on silicon chip
    3.
    发明授权
    Pixel test in a liquid crystal on silicon chip 有权
    硅晶片中的液晶像素测试

    公开(公告)号：US09310420B2

    公开(公告)日：2016-04-12

    申请号：US13749525

    申请日：2013-01-24

    Applicant: FINISAR CORPORATION

    Inventor： Jonathan B. Ashbrook ,  Lionel Li ,  Brian R. Carey

    IPC: G02F1/1365 ,  G01R31/26 ,  G02F1/1362 ,  G09G3/00 ,  H04Q11/00

    CPC classification number: G01R31/2607 ,  G02F1/136277 ,  G09G3/006 ,  G09G2330/12 ,  H04Q11/0005 ,  H04Q2011/0035 ,  H04Q2011/0039

    Abstract: An example embodiment includes a continuity testing method of a pixel in a liquid crystal on silicon integrated circuit. The method includes writing a first voltage to a pixel. The pixel is isolated and a wire that is selectively coupled to the pixel is discharged. The method also includes enabling a sensing amplifier configured to sense voltage on the wire. The pixel is electrically coupled to the wire and a resultant voltage on the wire is sensed.

    Abstract translation: 示例性实施例包括硅集成电路中的液晶中的像素的连续性测试方法。 该方法包括向像素写入第一电压。 像素被隔离，并且选择性地耦合到像素的导线被放电。 该方法还包括启用被配置为感测导线上的电压的感测放大器。 像素电耦合到导线，并且感测到线上的合成电压。

    LOCAL BUFFERS IN A LIQUID CRYSTAL ON SILICON CHIP
    6.
    发明申请
    LOCAL BUFFERS IN A LIQUID CRYSTAL ON SILICON CHIP 有权
    硅胶液体中的局部缓冲液

    公开(公告)号：US20140204299A1

    公开(公告)日：2014-07-24

    申请号：US13749529

    申请日：2013-01-24

    Applicant: FINISAR CORPORATION

    Inventor： Jonathan B. Ashbrook ,  Lionel Li ,  Brian R. Carey ,  Nicholas F. Jungels

    IPC: G02F1/13

    CPC classification number: H04Q11/0005 ,  G02F2001/136281 ,  G02F2203/585 ,  G09G3/3685 ,  G09G2310/0259 ,  G09G2310/027 ,  G09G2310/0291 ,  H04Q2011/0035 ,  H04Q2011/0039

    Abstract: An example embodiment includes a liquid crystal on silicon (LCOS) system. The LCOS system includes multiple pixels, a pixel voltage supply source (voltage source), an external buffer, and a local buffer. The voltage source is configured to supply an analog ramp to the pixels. The external buffer is configured to buffer the voltage source from the pixels. The local buffer is configured to buffer the external buffer from a subset of pixels of the plurality of pixels.

    Abstract translation: 一个示例性实施例包括硅上液晶（LCOS）系统。 LCOS系统包括多个像素，像素电压源（电压源），外部缓冲器和本地缓冲器。 电压源被配置为向像素提供模拟斜坡。 外部缓冲器配置为从像素缓冲电压源。 本地缓冲器被配置为从多个像素的像素的子集中缓冲外部缓冲器。

    PIXEL TEST IN A LIQUID CRYSTAL ON SILICON CHIP
    7.
    发明申请
    PIXEL TEST IN A LIQUID CRYSTAL ON SILICON CHIP 有权
    硅胶片中液晶的像素测试

    公开(公告)号：US20140204298A1

    公开(公告)日：2014-07-24

    申请号：US13749525

    申请日：2013-01-24

    Applicant: FINISAR CORPORATION

    Inventor： Jonathan B. Ashbrook ,  Lionel Li ,  Brian R. Carey

    IPC: G01R31/26 ,  G02F1/1362

    CPC classification number: G01R31/2607 ,  G02F1/136277 ,  G09G3/006 ,  G09G2330/12 ,  H04Q11/0005 ,  H04Q2011/0035 ,  H04Q2011/0039

    Abstract: An example embodiment includes a continuity testing method of a pixel in a liquid crystal on silicon integrated circuit. The method includes writing a first voltage to a pixel. The pixel is isolated and a wire that is selectively coupled to the pixel is discharged. The method also includes enabling a sensing amplifier configured to sense voltage on the wire. The pixel is electrically coupled to the wire and a resultant voltage on the wire is sensed.

    Abstract translation: 示例性实施例包括硅集成电路中的液晶中的像素的连续性测试方法。 该方法包括向像素写入第一电压。 像素被隔离，并且选择性地耦合到像素的导线被放电。 该方法还包括启用被配置为感测导线上的电压的感测放大器。 像素被电耦合到线，并且感测到线上的合成电压。

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