摘要:
An integrated circuit for protecting against transient electrical stress events includes a rail clamp device, and a trigger circuit including a resistive-capacitive (RC) filter, a drive circuit including a first inverter stage receiving an input signal from the RC filter, the drive circuit is configured to enable the rail clamp device during a transient electrical stress event, and a stress event detection circuit coupled to the RC filter. The drive circuit includes a configurable activation voltage which is controlled by the stress event detection circuit, wherein the activation voltage is reduced when the transient electrical stress event is detected.
摘要:
A transmission gate circuit includes a pass gate and a control circuit and provides High Voltage protection to a flash memory in a characterization mode and a low resistive path with true open-drain functionality in a normal mode. A native NMOSFET in series with the pass gate provides overvoltage protection for additional circuitry. Well biasing, gate tracking and internal node clamping circuits ensure that all of the devices of the pass gate and control circuit operated within safe operational voltage levels. The two modes of operation can be selected by an enable signal. The transmission gate circuit can support up to a 5.5 volts input in a true open drain mode while an input/output supply voltage of 3.3 volts is supplied.
摘要:
Boosted Electrostatic Discharge (ESD) clamp circuit with high effective holding voltage. In some embodiments, an integrated circuit may include a trigger circuit operably coupled to a first voltage bus and to a reference bus; a diode including an anode terminal operably coupled to a second voltage bus, the second voltage bus distinct from the first voltage bus; a transistor including a gate operably coupled to an output terminal of the trigger circuit, a drain operably coupled to a cathode terminal of the diode, and a source operably coupled to the reference bus; and an input/output (I/O) cell operably coupled to the first voltage bus, the second voltage bus, and the reference bus.
摘要:
An integrated circuit includes an I/O pad and a protection device coupled to the I/O pad and a first supply node. A transient event detector includes a latch; a first transistor having a first current electrode coupled to the I/O pad, a control electrode coupled to a first supply node, and a second current electrode coupled to a data input of the latch, wherein the latch is configured to store an indication that a transient event occurred. An event level sensor includes a first transistor having a first current electrode coupled to the I/O pad, a control electrode coupled to the protection device, and a second current electrode coupled to a load circuit; a rectifier device coupled between the second current electrode and a capacitor; a second transistor having a control electrode coupled to the capacitor; and an output circuit configured to place a current on a first sense bus proportional to a current through the load circuit.
摘要:
An integrated circuit with protection against transient electrical stress events includes a trigger circuit having a first detection circuit coupled to a first supply voltage, a second detection circuit coupled to a second supply voltage, and a rail clamp device. During a first type of electrical stress event, the rail clamp device is activated in response to a first output signal provided by the first detection circuit. During a second type of electrical stress event, the rail clamp device is activated in response to a second output signal provided by the second detection circuit.
摘要:
Boosted Electrostatic Discharge (ESD) clamp circuit with high effective holding voltage. In some embodiments, an integrated circuit may include a trigger circuit operably coupled to a first voltage bus and to a reference bus; a diode including an anode terminal operably coupled to a second voltage bus, the second voltage bus distinct from the first voltage bus; a transistor including a gate operably coupled to an output terminal of the trigger circuit, a drain operably coupled to a cathode terminal of the diode, and a source operably coupled to the reference bus; and an input/output (I/O) cell operably coupled to the first voltage bus, the second voltage bus, and the reference bus.
摘要:
A transmission gate circuit includes a pass gate and a control circuit and provides High Voltage protection to a flash memory in a characterization mode and a low resistive path with true open-drain functionality in a normal mode. A native NMOSFET in series with the pass gate provides overvoltage protection for additional circuitry. Well biasing, gate tracking and internal node clamping circuits ensure that all of the devices of the pass gate and control circuit operated within safe operational voltage levels. The two modes of operation can be selected by an enable signal. The transmission gate circuit can support up to a 5.5 volts input in a true open drain mode while an input/output supply voltage of 3.3 volts is supplied.
摘要:
An integrated circuit including ESD circuitry that is shared among more than one terminal segment of the integrated circuit to discharge current from an ESD event on any of the terminal segments. The shared ESD circuitry includes a clamp circuit that is coupled to power buses of each segment to discharge current from ESD events on each segment. The shared ESD circuitry includes a trigger circuit that is coupled to nodes coupled to terminals of each segment to detect an ESD event on each segment.