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公开(公告)号:US20250129308A1
公开(公告)日:2025-04-24
申请号:US19005399
申请日:2024-12-30
Applicant: FUJIFILM CORPORATION
Inventor: Yuta Shigenoi , Tetsuya Kamimura , Atsushi Mizutani , Shimpei Yamada
Abstract: An object of the present invention is to provide a semiconductor treatment liquid which has excellent anticorrosion properties against at least one metal selected from the group consisting of Cu and Co in a case of being brought into contact with an object containing the metal, and also has excellent cleanability for organic residues on a surface of the object to be treated; and to provide a treatment method for an object to be treated and a manufacturing method of an electronic device. The treatment liquid of the present invention contains a purine compound and an amine compound, in which the purine compound includes at least one selected from the group consisting of purine and a purine derivative, the amine compound includes at least two of one amine compound A and one or two or more amine compounds B different from the amine compound A, the amine compound A is a tertiary amine compound, and a mass ratio of a content of the purine compound to a content of the amine compound is 0.0001 to 0.1.
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2.
公开(公告)号:US20240018442A1
公开(公告)日:2024-01-18
申请号:US18473501
申请日:2023-09-25
Applicant: FUJIFILM Corporation
Inventor: Naoko OUCHI , Tetsuya Kamimura , Shimpei Yamada , Naotsugu Muro
CPC classification number: C11D1/62 , C11D11/0047 , C11D3/0073 , C11D3/28 , C11D3/30 , C11D3/2082 , C11D3/2086 , H01L21/02074
Abstract: An object of the present invention is to provide a cleaning liquid for a semiconductor substrate, which is excellent in cleaning performance of organic impurities, and a cleaning method for a semiconductor substrate. The cleaning liquid for a semiconductor substrate according to the present invention is a cleaning liquid for a semiconductor substrate used for cleaning a semiconductor substrate, and includes a compound represented by Formula (A).
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