IONIZATION DEVICE
    3.
    发明申请
    IONIZATION DEVICE 审中-公开

    公开(公告)号:US20180284083A1

    公开(公告)日:2018-10-04

    申请号:US15764249

    申请日:2015-12-09

    Applicant: HITACHI, LTD.

    Abstract: In order to implement a high-sensitivity mass spectrometry through an improvement in solvent removal efficiency during electrospray ionization and the like, an ionization device is provided with a light guide path 28 which guides light from a light source to sample microparticles generated by a micronization device to irradiate the microparticles. A closest distance d2 between a spatial area 34 in which the sample microparticles are present and a distal end 29 of the light guide path is greater than or equal to 0.1 mm and less than or equal to 20 mm. A closest distance d1 between an area of light irradiation 35 by the light guide path and any of a sample surface, a micronization device, and a sample holding unit that is the closest is greater than or equal to 0.01 mm and less than or equal to 10 mm.

    Adhering Substance Collecting Device and Inspection System

    公开(公告)号:US20200319061A1

    公开(公告)日:2020-10-08

    申请号:US16305812

    申请日:2017-05-29

    Applicant: Hitachi, Ltd.

    Abstract: In order to detach substances stably from an inspection object, an adhering substance collecting device includes: ejection openings configured to eject gas; a housing on which the ejection openings are provided; and supporting portions which are installed on a surface of the housing on which the ejection openings are provided, and have a prescribed height. The supporting portions include protruded portions formed on the housing. The supporting portions each have a cuboid shape, and are installed such that a distance therebetween becomes smaller toward a direction of a recovery opening that is configured to collect substances having been detached from an inspection object, from the gas.

    MASS SPECTROMETER AND MASS SPECTROMETRY METHOD

    公开(公告)号:US20240038524A1

    公开(公告)日:2024-02-01

    申请号:US18213974

    申请日:2023-06-26

    Applicant: HITACHI, LTD.

    CPC classification number: H01J49/4225 H01J49/065 H01J49/429 H01J49/0031

    Abstract: The present disclosure proposes a mass spectrometer including a linear ion trap section and an analyzer that analyzes the ions ejected from the linear ion trap section having a multipole rod electrode including a plurality of segments arranged in a direction of a center axis of the linear ion trap section. A first radio frequency voltage in opposite phase is applied to adjacent rod electrodes. An electrostatic voltage having the same amplitude and a second radio frequency voltage are applied to the segments having the same position in the direction of the center axis. The electrostatic voltage is applied to the segments such that the electrostatic voltage decreases from an inlet to an outlet of the linear ion trap section. The second radio frequency voltage is applied to the segments such that the second radio frequency voltage increases from the inlet to the outlet of the linear ion trap section.

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