Semiconductor Device
    1.
    发明申请
    Semiconductor Device 审中-公开
    半导体器件

    公开(公告)号:US20160254803A1

    公开(公告)日:2016-09-01

    申请号:US15028568

    申请日:2013-10-16

    Applicant: HITACHI, LTD.

    Abstract: Provided is a semiconductor device capable of reducing a penalty associated with ensuring reliability. The semiconductor device includes a latch circuit which has input/output paths of three systems or more independent from each other. The latch circuit includes a plurality of storage elements STE1 to STE3 which are provided on the input/output paths of the three systems or more, respectively, and hold input data in synchronization with a clock signal. At least one storage element (for example, STE1) of the plurality of storage elements STE1 to STE3 includes a majority decision unit (for example, 81a) executing a majority decision using data from the storage elements provided on other input/output paths different from the input/output path thereof and outputs data in which a result of the majority decision is reflected.

    Abstract translation: 提供了能够减少与确保可靠性相关联的惩罚的半导体器件。 半导体器件包括具有彼此独立的三个系统或更多个输入/输出路径的锁存电路。 锁存电路包括分别设置在三个或更多个系统的输入/输出路径上的多个存储元件STE1至STE3,并且与时钟信号同步地保持输入数据。 多个存储元件STE1至STE3中的至少一个存储元件(例如,STE1)包括使用来自不同于其它输入/输出路径的其他输入/输出路径上提供的存储元件的数据执行多数决定的多数决定单元(例如,81a) 其输入/输出路径并输出反映多数决定结果的数据。

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