MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS
    5.
    发明申请
    MICROLITHOGRAPHIC PROJECTION EXPOSURE APPARATUS 审中-公开
    微波投影曝光装置

    公开(公告)号:US20080316452A1

    公开(公告)日:2008-12-25

    申请号:US12199998

    申请日:2008-08-28

    IPC分类号: G03G15/08

    摘要: A microlithographic projection exposure apparatus contains an illumination system (12) for generating projection light (13) and a projection lens (20; 220; 320; 420; 520; 620; 720; 820; 920; 1020; 1120) with which a reticle (24) that is capable of being arranged in an object plane (22) of the projection lens can be imaged onto a light-sensitive layer (26) that is capable of being arranged in an image plane (28) of the projection lens. The projection lens is designed for immersion mode, in which a final lens element (L5; L205; L605; L705; L805; L905; L1005; L1105) of the projection lens on the image side is immersed in an immersion liquid (34; 334a; 434a; 534a). A terminating element (44; 244; 444; 544; 644; 744; 844; 944; 1044; 1144) that is transparent in respect of the projection light (13) is fastened between the final lens element on the image side and the light-sensitive layer.

    摘要翻译: 微光刻投影曝光装置包括用于产生投影光(13)和投影透镜(20; 220; 320; 420; 520; 620; 720; 820; 920; 1020; 1120)的照明系统(12) 能够布置在投影透镜的物平面(22)中的光源(24)可以被成像到能够被布置在投影透镜的像平面(28)中的感光层(26)上。 投影透镜被设计用于浸没模式,其中在像侧的投影透镜的最终透镜元件(L5; L205; L605; L705; L805; L905; L1005; L1105)浸没在浸没液体(34; 334a ; 434a; 534a)。 关于投影光(13)透明的终端元件(44; 244; 444; 544; 644; 744; 844; 944; 1044; 1144)被紧固在图像侧的最终透镜元件与光 敏感层。

    Projection objective of a microlithographic exposure apparatus
    7.
    发明授权
    Projection objective of a microlithographic exposure apparatus 有权
    微光刻曝光设备的投影目标

    公开(公告)号:US07277231B2

    公开(公告)日:2007-10-02

    申请号:US11097398

    申请日:2005-04-01

    IPC分类号: G02B1/06

    摘要: A projection objective of a microlithographic projection exposure apparatus has a correction device which can correct photoinduced imaging errors without optical elements having to be removed for this purpose. The correction device includes a first optical element and a second optical element, whose surface facing the first optical element is provided with a local surface deformation for improving the imaging properties of the projection objective. In a wall, which seals an intermediate space formed between the first optical element and the second optical element, an opening is provided through which the intermediate space can be filled with a fluid. By modifying the refractive index of the fluid adjacent to the surface, the effect of the surface deformation can be modified in a straightforward way.

    摘要翻译: 微光刻投影曝光装置的投影物镜具有校正装置,该校正装置可以校正光诱导的成像误差,而不需要为此而移除光学元件。 校正装置包括第一光学元件和第二光学元件,其面向第一光学元件的表面设置有用于改善投影物镜的成像特性的局部表面变形。 在密封形成在第一光学元件和第二光学元件之间的中间空间的壁中,设置有可以用流体填充中间空间的开口。 通过改变与表面相邻的流体的折射率,可以以直接的方式修改表面变形的影响。

    Projection objective of a microlithographic exposure apparatus
    8.
    发明申请
    Projection objective of a microlithographic exposure apparatus 有权
    微光刻曝光设备的投影目标

    公开(公告)号:US20050219707A1

    公开(公告)日:2005-10-06

    申请号:US11097398

    申请日:2005-04-01

    摘要: A projection objective of a microlithographic projection exposure apparatus has a correction device which can correct photoinduced imaging errors without optical elements having to be removed for this purpose. The correction device includes a first optical element and a second optical element, whose surface facing the first optical element is provided with a local surface deformation for improving the imaging properties of the projection objective. In a wall, which seals an intermediate space formed between the first optical element and the second optical element, an opening is provided through which the intermediate space can be filled with a fluid. By modifying the refractive index of the fluid adjacent to the surface, the effect of the surface deformation can be modified in a straightforward way.

    摘要翻译: 微光刻投影曝光装置的投影物镜具有校正装置,该校正装置可以校正光诱导的成像误差,而不需要为此而移除光学元件。 校正装置包括第一光学元件和第二光学元件,其面向第一光学元件的表面设置有用于改善投影物镜的成像特性的局部表面变形。 在密封形成在第一光学元件和第二光学元件之间的中间空间的壁中,设置有可以用流体填充中间空间的开口。 通过改变与表面相邻的流体的折射率,可以以直接的方式修改表面变形的影响。