公开(公告)号：US12204081B1

公开(公告)日：2025-01-21

申请号：US18812680

申请日：2024-08-22

Applicant: Harbin Institute of Technology

Inventor： Jian Liu ,  Chenguang Liu ,  Zijie Hua ,  Xiaoyu You

IPC: G02B21/00 ,  G02B21/26

Abstract: This application relates to the technical field of confocal microscopy measurement and provides a dark-field confocal microscopy measurement apparatus and method based on time-varying fractional-order vortex demodulation. The apparatus includes a time-varying modulated illumination module, an optical scanning module, a signal collection and demodulation module, a function generator, and a sample platform. The function generator is separately connected with. The time-varying modulated illumination module is configured to emit fractional-order vortex light to the optical scanning module. The optical scanning module is configured to transmit the fractional-order vortex light to the to-be-measured sample on the sample platform and transmit a reflected light signal to the signal collection and demodulation module. The signal collection and demodulation module is configured to collect the reflected light signal, and perform dark-field confocal detection on the reflected light signal based on a reference signal, to obtain measurement information of the to-be-measured sample.

公开(公告)号：US12196686B1

公开(公告)日：2025-01-14

申请号：US18813695

申请日：2024-08-23

Applicant: Harbin Institute of Technology

Inventor： Jian Liu ,  Chenguang Liu ,  Zijie Hua ,  Xiaoyu You

IPC: G01N21/88 ,  G01N21/95 ,  G02B21/00 ,  G02B21/10

Abstract: This application provides a vortex dichroism dark-field confocal microscopy measurement apparatus based on spiral transformation. An opposite-order vortex beam generation module is configured to generate a mixed vortex beam, a sample scanning module is configured to irradiate a scanning position of a to-be-measured sample by using the mixed vortex beam, to obtain a sample reflection beam. A spiral transformation module is configured to spatially separate the sample reflection beam to obtain spatially separated beams. A multi-order detection module is configured to detect the spatially separated beams to obtain a vortex dichroism signal at the scanning position. When the scanning position of the to-be-measured sample is defect-free, the vortex dichroism signal is zero. Conversely, when defects are present at the scanning position, the vortex dichroism signal is non-zero. The positive and negative the vortex dichroism signal respectively correspond to the left-handed and right-handed chirality of the defects.

公开(公告)号：US12216264B2

公开(公告)日：2025-02-04

申请号：US18739866

申请日：2024-06-11

Applicant: Harbin Institute of Technology

Inventor： Jian Liu ,  Chenguang Liu ,  Zijie Hua

IPC: G02B21/00 ,  G01N21/88 ,  G02B21/26

Abstract: Disclosed are a dark-field confocal microscopic measurement apparatus and method based on vortex dichroism. The apparatus includes an array vortex light generation module, an array vortex light illumination module and an array dark-field confocal detection module; an array vortex wave plate of the array vortex light generation module generates vortex light to illuminate a sample of the array vortex light illumination module; and the array dark-field confocal detection module extracts scattering signals, and identifies differences between scattering signals collected under the illumination of opposite-order vortex light. Three-dimensional distribution information of defects, such as subsurface scratches, abrasion, subsurface cracks, and bubbles, can be extracted by directly analyzing the scattering signals under the 1-order vortex illumination; and chirality information of the micro-nano material can be obtained by analyzing difference values of the scattering signals under the illumination of the opposite-order vortex light.

公开(公告)号：US20240329377A1

公开(公告)日：2024-10-03

申请号：US18739866

申请日：2024-06-11

Applicant: Harbin Institute of Technology

Inventor： Jian Liu ,  Chenguang Liu ,  Zijie Hua

IPC: G02B21/00 ,  G01N21/88 ,  G02B21/26

CPC classification number: G02B21/0032 ,  G01N21/8806 ,  G02B21/26 ,  G01N2021/8822 ,  G01N2021/8848

Abstract: Disclosed are a dark-field confocal microscopic measurement apparatus and method based on vortex dichroism. The apparatus includes an array vortex light generation module, an array vortex light illumination module and an array dark-field confocal detection module; an array vortex wave plate of the array vortex light generation module generates vortex light to illuminate a sample of the array vortex light illumination module; and the array dark-field confocal detection module extracts scattering signals, and identifies differences between scattering signals collected under the illumination of opposite-order vortex light. Three-dimensional distribution information of defects, such as subsurface scratches, abrasion, subsurface cracks, and bubbles, can be extracted by directly analyzing the scattering signals under the 1-order vortex illumination; and chirality information of the micro-nano material can be obtained by analyzing difference values of the scattering signals under the illumination of the opposite-order vortex light.

公开(公告)号：US20240310613A1

公开(公告)日：2024-09-19

申请号：US18424711

申请日：2024-01-26

Applicant: Harbin Institute of Technology

Inventor： Jian Liu ,  Chenguang Liu ,  Chongliang Zou ,  Zijie Hua

IPC: G02B21/00 ,  G02B21/18

CPC classification number: G02B21/0032 ,  G02B21/0036 ,  G02B21/006 ,  G02B21/0068 ,  G02B21/18

Abstract: Disclosed are a differential dark-field confocal microscopic measurement apparatus and method based on a polarized vector light beam. The apparatus includes a vector polarized illumination light generation module, a light beam scanning illumination module and a differential dark-field confocal imaging module; a half wave plate and a vortex wave plate are regulated to generate radially polarized signal light and azimuthally polarized signal light respectively, and an acousto-optic modulator is controlled to modulate light beams into a pulse form, so that the radially polarized signal light and the azimuthally polarized signal light alternately illuminate during the same period, both of which have a time occupation ratio of 50%, separately. Difference values of scattering signals under separate illumination of the radially polarized signal light and the azimuthally polarized signal light are analyzed, and super-resolution detection imaging can be performed on the three-dimensional distribution information of defects such as subsurface scratches, and abrasion.

公开(公告)号：US12259344B1

公开(公告)日：2025-03-25

申请号：US18809820

申请日：2024-08-20

Applicant: Harbin Institute of Technology

Inventor： Chenguang Liu ,  Jian Liu ,  Zhao Chen

IPC: G01N23/2255 ,  G01T1/20 ,  G01T1/29

Abstract: Provided is a living cell microbeam directional and quantitative irradiation imaging apparatus. The problem that qualitative analysis of the mechanism of action of biological cells irradiated cannot accurately study the mechanism of action of different irradiation doses on biological cells as the cell irradiation technology can be only used to perform qualitative irradiation on living biological cells is solved. The apparatus includes a vertical microbeam terminal, a living cell directional irradiation module, a wide-field microscopic module, a mode switching module, and a single-proton counting and radiation synchronous control module. The vertical microbeam terminal, the living cell directional irradiation module, the mode switching module and the wide-field microscopic module are sequentially matched, the mode switching module is connected to the single-proton counting and radiation synchronous control module, and the vertical microbeam terminal is matched with the single-proton counting and radiation synchronous control module.

公开(公告)号：US12203867B1

公开(公告)日：2025-01-21

申请号：US18802309

申请日：2024-08-13

Applicant: Harbin Institute of Technology

Inventor： Jian Liu ,  Chenguang Liu ,  Zijie Hua ,  Kang Gu

IPC: G01N21/88 ,  G01R31/311

Abstract: Provided are a dark-field confocal microscopy measurement apparatus and method. The apparatus includes: a fractional vortex beam module configured to generate first fractional vortex beam and second fractional vortex beam; an optical scanning module configured to scan a sample by using the first fractional vortex beam and the second fractional vortex beam to obtain first signal return light and second signal return light respectively; a dark-field detection module configured to perform dark-field detection on the first signal return light and the second signal return light to obtain a first fractional-order dark-field image and a second fractional-order dark-field image respectively; a differential dark-field scattered image determining module configured to differentiate the first fractional-order dark-field image from the second fractional-order dark-field image to obtain a differential dark-field scattered image; and a defect determining module configured to process the differential dark-field scattered image to obtain a sample defect.

公开(公告)号：US12111453B1

公开(公告)日：2024-10-08

申请号：US18424711

申请日：2024-01-26

Applicant: Harbin Institute of Technology

Inventor： Jian Liu ,  Chenguang Liu ,  Chongliang Zou ,  Zijie Hua

IPC: G02B21/00 ,  G02B21/18

CPC classification number: G02B21/0032 ,  G02B21/0036 ,  G02B21/006 ,  G02B21/0068 ,  G02B21/18

Abstract: Disclosed are a differential dark-field confocal microscopic measurement apparatus and method based on a polarized vector light beam. The apparatus includes a vector polarized illumination light generation module, a light beam scanning illumination module and a differential dark-field confocal imaging module; a half wave plate and a vortex wave plate are regulated to generate radially polarized signal light and azimuthally polarized signal light respectively, and an acousto-optic modulator is controlled to modulate light beams into a pulse form, so that the radially polarized signal light and the azimuthally polarized signal light alternately illuminate during the same period, both of which have a time occupation ratio of 50%, separately. Difference values of scattering signals under separate illumination of the radially polarized signal light and the azimuthally polarized signal light are analyzed, and super-resolution detection imaging can be performed on the three-dimensional distribution information of defects such as subsurface scratches, and abrasion.