Bladed Ion Slicer
    2.
    发明申请
    Bladed Ion Slicer 审中-公开
    刀片离子切片机

    公开(公告)号:US20120217388A1

    公开(公告)日:2012-08-30

    申请号:US13406182

    申请日:2012-02-27

    IPC分类号: H01J49/40 H01J3/14

    摘要: Provided herein is a bladed ion slicer for blocking ions in an ion beam that have significant distance from the beam axis. In certain embodiments, the bladed ion slicer comprises a body; a first elongated blade; and a second elongated blade; wherein the ion slicer comprises a slit that extends through the body through which ions pass and wherein the edges of the first and second elongated blades define the entrance of the slit and are pointing towards the ion beam. A mass spectrometer system and method for removing unwanted ions are also provided.

    摘要翻译: 本文提供了一种叶片式离子限制器,用于阻挡离子束离子的距离远离束轴。 在某些实施例中,叶片离子限制器包括主体; 第一细长刀片; 和第二细长叶片; 其中所述离子限定器包括延伸穿过所述主体的狭缝,离子通过所述狭缝,并且所述第一和第二细长叶片的边缘限定所述狭缝的入口并指向所述离子束。 还提供了用于去除不想要的离子的质谱仪系统和方法。

    Device for time lag focusing time-of-flight mass spectrometry
    4.
    发明授权
    Device for time lag focusing time-of-flight mass spectrometry 失效
    时差聚焦飞行时间质谱仪的设备

    公开(公告)号:US5777325A

    公开(公告)日:1998-07-07

    申请号:US643708

    申请日:1996-05-06

    IPC分类号: H01J49/02 H01J49/40

    CPC分类号: H01J49/40 H01J49/025

    摘要: A laser desorption ionization instrument for and method of measuring the molecular weight of large organic molecules includes a time of flight mass spectrometer (TOF MS). The TOF MS instrument provides optimized optic design for both DC and TLF modes. The invention further provides dynamic resolution enhancement for a given ejection pulse, along with optimized ion ejection pulses relative to the ion optic elements. The invention also provides means for compensating for difference in total kinetic energy among ions of different mass; high resolution detection means for improved sensitivity for large molecular weight species. The invention further provides x-y-z stage for sample presentation of both standard MALDI and gel or membrane based samples.

    摘要翻译: 用于测量大型有机分子分子量的激光解吸电离仪及其测定方法包括飞行时间质谱仪(TOF MS)。 TOF MS仪器为DC和TLF模式提供优化的光学设计。 本发明还提供了对于给定的喷射脉冲的动态分辨率增强以及相对于离子光学元件的优化的离子喷射脉冲。 本发明还提供了补偿不同质量离子之间总动能差异的方法; 高分辨率检测手段,用于提高大分子量物种的灵敏度。 本发明还提供用于标准MALDI和基于凝胶或膜的样品的样品呈现的x-y-z级。