Method of manufacturing rotation sensor and structure of rotation sensor
    1.
    发明授权
    Method of manufacturing rotation sensor and structure of rotation sensor 失效
    制造旋转传感器的方法和旋转传感器的结构

    公开(公告)号:US5633062A

    公开(公告)日:1997-05-27

    申请号:US287196

    申请日:1994-08-08

    IPC分类号: B29C45/14 G01P1/02 G01P3/42

    摘要: A method of manufacturing a rotation sensor can effectively prevent a sensor element from moving during a resin molding process for forming a resin portion that covers the sensor element to provide excellent waterproofness and airtightness. During a first resin injection step, an end of a bobbin of the sensor element is fixed or held in place by a slide core. Thereafter the slide core is extracted and resin is again injected in a second injection step into a vacated portion that is formed by extraction of the slide core. In the finished rotation sensor, the resin completely surrounds and encloses the bobbin, except at an exposed end of a magnetic pole piece. A metal mounting bracket is embedded in the resin at a spacing away from the bobbin. The bobbin has a positioning cavity to receive the slide core during the molding. The resin covering an upper part of the bobbin is at least four times as thick as the resin covering the coil of the sensor element.

    摘要翻译: 制造旋转传感器的方法可以有效地防止传感器元件在用于形成覆盖传感器元件的树脂部分的树脂模制过程中移动以提供优异的防水性和气密性。 在第一树脂注入步骤期间,传感器元件的线轴的端部通过滑动芯固定或保持就位。 此后,提取滑动芯,并且在第二注射步骤中将树脂再次注入通过提取滑动芯而形成的空出部分。 在完成的旋转传感器中,除了磁极片的暴露端之外,树脂完全包围和包围线轴。 金属安装支架以与线轴相距的间隔嵌入树脂中。 筒管具有定位腔,用于在成型过程中接收滑动芯。 覆盖线轴上部的树脂至少是覆盖传感器元件线圈的树脂的四倍。

    Acceleration detector with differential transformer
    2.
    发明授权
    Acceleration detector with differential transformer 失效
    加速度检测器与差分变压器

    公开(公告)号:US5220834A

    公开(公告)日:1993-06-22

    申请号:US639063

    申请日:1991-01-09

    IPC分类号: G01P15/11

    CPC分类号: G01P15/11

    摘要: An acceleration detector has a case and a movable magnetic body mounted in the case and supported by a leaf spring secured to the case. The magnetic body is thus movable in either of two opposite directions in response to acceleration. Stoppers made of a magnetic material protrude from an inner surface of the case to locations adjacent both ends of the magenetic body, with predetermined gaps left therebetween. Two pairs of primary and secondary coils are provided around the magnetic body for producing a difference in induced voltages output by the secondary coils according to the displacement of the magnetic body. A yoke made of soft magnetic material extends from the case to location adjacent the magnetic body.

    Hermetically sealed magnetic sensor
    3.
    发明授权
    Hermetically sealed magnetic sensor 失效
    密封式磁传感器

    公开(公告)号:US4847557A

    公开(公告)日:1989-07-11

    申请号:US166228

    申请日:1988-03-10

    IPC分类号: G01P1/02 G01V3/10

    摘要: A hermetically sealed magnetic sensor for detecting variations in a magnetic field has a sensor element with an output terminal for detecting variations in the magnetic field and generating a signal. An output wire is connected with one end to the terminal for outputting a respective signal from the sensor element. A case having an opening on a side close to the output wire contains the sensor element. A first thermosetting resin fills the case for covering the sensor element. A second thermoplastic resin hermetically seals the opening in the case.

    Acceleration detector having highly accurate gaps in magnetic circuit
including a differential transformer
    5.
    发明授权
    Acceleration detector having highly accurate gaps in magnetic circuit including a differential transformer 失效
    加速度检测器在包括差动变压器的磁路中具有高精度的间隙

    公开(公告)号:US5359894A

    公开(公告)日:1994-11-01

    申请号:US851947

    申请日:1992-03-13

    IPC分类号: G01P15/11

    CPC分类号: G01P15/11

    摘要: An acceleration detector includes a magnetic body movable under acceleration, and a differential transformer having primary coils and secondary coils and arranged so that an output differential is produced between the secondary coils when the movable magnetic body is displaced. The movable magnetic body extends through the primary coils and the secondary coils and has opposite ends protruding from the coils. Leaf springs are provided to support the protruding ends of the movable magnetic body. The case comprises a cylindrical body surrounding the outer periphery of the differential transformer and lids closing openings of the body at both ends thereof. Between the lids and both ends of the movable body predetermined gaps are provided through which a magnetic flux can flow. The leaf springs are secured in position between end faces of the body and the lids.

    摘要翻译: 加速度检测器包括可加速移动的磁体和具有初级线圈和次级线圈的差动变压器,并且布置成当可移动磁体移位时在次级线圈之间产生输出差分。 可动磁体延伸穿过初级线圈和次级线圈,并且具有从线圈突出的相对端。 提供板簧以支撑可移动磁体的突出端。 壳体包括围绕差动变压器的外周的圆柱形主体,并且在其两端封闭主体的开口。 在可动体的盖子和两端之间提供预定的间隙,通过该间隙可以流过磁通量。 板簧固定在主体的端面和盖子之间的位置。

    Semiconductor memory device
    6.
    发明授权
    Semiconductor memory device 失效
    半导体存储器件

    公开(公告)号:US08649234B2

    公开(公告)日:2014-02-11

    申请号:US13285181

    申请日:2011-10-31

    IPC分类号: G11C7/00

    CPC分类号: G11C7/222 G11C16/10 G11C16/32

    摘要: According to one embodiment, an interface includes first to third input circuits, delay and selection circuits. The first input circuit outputs an active first internal signal in response to an active first control signal received by a memory device. The second input circuit outputs an active second internal signal in response to an active second control signal received by the device while the device is receiving the active first control signal. The delay circuit outputs a selection signal in first or second states after the elapse of a first period from inactivation or activation of the first control signal. The selection circuit outputs the first and second internal signals as an enable signal while receiving the selection signal of the first and second states. The third input circuit outputs an input signal received from the outside from the interface to inside the device while receiving the active enable signal.

    摘要翻译: 根据一个实施例,接口包括第一至第三输入电路,延迟和选择电路。 第一输入电路响应于由存储器件接收到的有效的第一控制信号而输出有效的第一内部信号。 第二输入电路响应于设备在接收到有效的第一控制信号时接收到的有效的第二控制信号而输出有效的第二内部信号。 延迟电路在从第一控制信号的失活或激活开始经过第一周期之后,输出第一或第二状态的选择信号。 选择电路在接收第一和第二状态的选择信号的同时,将第一和第二内部信号作为使能信号输出。 第三输入电路在接收到有效使能信号的同时,将从外部接收的输入信号输出到设备内部。

    Driving device and driving method of electrophoretic display
    7.
    发明授权
    Driving device and driving method of electrophoretic display 失效
    电泳显示器的驱动装置和驱动方法

    公开(公告)号:US08542184B2

    公开(公告)日:2013-09-24

    申请号:US12637020

    申请日:2009-12-14

    申请人: Hidetoshi Saito

    发明人: Hidetoshi Saito

    IPC分类号: G09G3/34

    摘要: A driving device of an electrophoretic display panel having a common electrode and a plurality of divided electrodes disposed opposite to the common electrode includes: a first driving circuit that outputs a plurality of voltages corresponding to a plurality of voltage data supplied as a series of data and supplies the plurality of voltages to the plurality of divided electrodes; and a second driving circuit that outputs a voltage corresponding to supplied data and supplies the voltage to the common electrode.

    摘要翻译: 具有公共电极和与公共电极相对设置的多个分割电极的电泳显示面板的驱动装置包括:第一驱动电路,其输出与作为一系列数据提供的多个电压数据相对应的多个电压;以及 将多个电压提供给所述多个分割电极; 以及第二驱动电路,其输出与所提供的数据相对应的电压,并将电压提供给公共电极。

    Voltage selection circuit, electrophoretic display apparatus, and electronic device
    8.
    发明授权
    Voltage selection circuit, electrophoretic display apparatus, and electronic device 有权
    电压选择电路,电泳显示装置和电子装置

    公开(公告)号:US08400376B2

    公开(公告)日:2013-03-19

    申请号:US12366103

    申请日:2009-02-05

    申请人: Hidetoshi Saito

    发明人: Hidetoshi Saito

    IPC分类号: G09G3/30

    摘要: Provided is a voltage selection circuit for outputting a potential selected from a plurality of input potentials, the voltage selection circuit capable of selectively outputting a first high-level potential being a highest potential, a second high-level potential, or a third high-level potential being a lowest potential from an output terminal thereof. The voltage selection circuit includes a first switching circuit that supplies the first high-level potential to the output terminal, a second switching circuit that supplies the second high-level potential to the output terminal, and a third switching circuit that supplies the third high-level potential to the output terminal. The first switching circuit includes a high-voltage transistor and a level shifter connected to a gate terminal of the high-voltage transistor. The second switching circuit includes a first low-voltage transistor, a level shifter connected to a gate terminal of the first low-voltage transistor, and a diode disposed between the first low-voltage transistor and the output terminal. The third switching circuit includes a second low-voltage transistor and a diode disposed between the second low-voltage transistor and the output terminal.

    摘要翻译: 提供了一种电压选择电路,用于输出从多个输入电位中选择的电位,该电压选择电路能够选择性地输出最高电位的第一高电平电位,第二高电位电位或第三高电平 电位是其输出端子的最低电位。 电压选择电路包括向输出端提供第一高电平电位的第一开关电路,向输出端提供第二高电位电位的第二开关电路和供给第三高电位电位的第三开关电路, 电平电位到输出端子。 第一开关电路包括高压晶体管和连接到高电压晶体管的栅极端子的电平移位器。 第二开关电路包括第一低压晶体管,连接到第一低压晶体管的栅极端子的电平移位器和设置在第一低压晶体管和输出端子之间的二极管。 第三开关电路包括第二低压晶体管和设置在第二低压晶体管和输出端之间的二极管。

    Nonvolatile semiconductor memory device and method of self-testing the same
    9.
    发明授权
    Nonvolatile semiconductor memory device and method of self-testing the same 有权
    非易失性半导体存储器件及其自检方法相同

    公开(公告)号:US07739560B2

    公开(公告)日:2010-06-15

    申请号:US11567995

    申请日:2006-12-07

    申请人: Hidetoshi Saito

    发明人: Hidetoshi Saito

    IPC分类号: G11C29/00

    摘要: A test interface receives a test command designating execution of a test for a memory cell. The test storage circuit stores test information necessary to execute the test. The test storage circuit includes an erasable programmable storage unit. The decoder decodes the test command input to the test interface, and selects the test information stored in the test storage circuit. The sense amplifier reads out, from the test storage circuit, the test information selected by the decoder. The holding circuit holds the test information read out by the sense amplifier. The control circuit controls a test operation of checking whether the memory cell normally operates, on the basis of the test information held in the holding circuit. The defect storage circuit is formed for the memory cell, and stores fail information indicating that the memory cell is defective if the memory cell does not normally operate in the test operation.

    摘要翻译: 测试接口接收指定执行存储器单元的测试的测试命令。 测试存储电路存储执行测试所需的测试信息。 测试存储电路包括可擦除可编程存储单元。 解码器对测试接口的测试命令输入进行解码,并选择存储在测试存储电路中的测试信息。 读出放大器从测试存储电路读出由解码器选择的测试信息。 保持电路保持由读出放大器读出的测试信息。 控制电路基于保持在保持电路中的测试信息来控制检查存储单元是否正常工作的测试操作。 为存储单元形成缺陷存储电路,并且如果在测试操作中存储单元不正常地操作,则存储指示存储单元有故障的故障信息。

    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF SELF-TESTING THE SAME
    10.
    发明申请
    NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF SELF-TESTING THE SAME 有权
    非易失性半导体存储器件及其自身测试方法

    公开(公告)号:US20070165454A1

    公开(公告)日:2007-07-19

    申请号:US11567995

    申请日:2006-12-07

    申请人: Hidetoshi Saito

    发明人: Hidetoshi Saito

    IPC分类号: G11C16/04

    摘要: A test interface receives a test command designating execution of a test for a memory cell. The test storage circuit stores test information necessary to execute the test. The test storage circuit includes an erasable programmable storage unit. The decoder decodes the test command input to the test interface, and selects the test information stored in the test storage circuit. The sense amplifier reads out, from the test storage circuit, the test information selected by the decoder. The holding circuit holds the test information read out by the sense amplifier. The control circuit controls a test operation of checking whether the memory cell normally operates, on the basis of the test information held in the holding circuit. The defect storage circuit is formed for the memory cell, and stores fail information indicating that the memory cell is defective if the memory cell does not normally operate in the test operation.

    摘要翻译: 测试接口接收指定执行存储器单元的测试的测试命令。 测试存储电路存储执行测试所需的测试信息。 测试存储电路包括可擦除可编程存储单元。 解码器对测试接口的测试命令输入进行解码,并选择存储在测试存储电路中的测试信息。 读出放大器从测试存储电路读出由解码器选择的测试信息。 保持电路保持由读出放大器读出的测试信息。 控制电路基于保持在保持电路中的测试信息来控制检查存储单元是否正常工作的测试操作。 为存储单元形成缺陷存储电路,并且如果在测试操作中存储单元不正常地操作,则存储指示存储单元有故障的故障信息。