公开(公告)号：US07265363B2

公开(公告)日：2007-09-04

申请号：US11129471

申请日：2005-05-16

申请人： Hirofumi Takatsuka ,  Yoshiharu Saito ,  Yasushi Aono

发明人： Hirofumi Takatsuka ,  Yoshiharu Saito ,  Yasushi Aono

IPC分类号： G01N21/64 ,  G21K5/00

CPC分类号： G01N21/6428 ,  G01N21/6458 ,  G02B21/16 ,  G02B21/32

摘要： While carrying out microscope examination, it is possible to specify a position to be irradiated with optical stimulus light and to accurately apply an optical stimulus to the specified irradiation position. A microscope examination method includes a step of introducing into a specimen a substance in which a structural change is caused by irradiation with light of a first wavelength; a step of specifying an optical stimulation site in the specimen by irradiating the specimen with visible light of a second wavelength that does not cause a structural change in the substance, while examining the specimen in which the substance is introduced using a microscope examination apparatus; and a step of irradiating the specified optical stimulus site with the light of the first wavelength.

摘要翻译： 在进行显微镜检查时，可以指定用光刺激光照射的位置，并且将光学刺激精确地应用于指定的照射位置。 显微镜检查方法包括：通过用第一波长的光照射引起结构变化的物质向样本中导入的物体的步骤; 在使用显微镜检查装置检查其中导入了物质的样本的同时，通过用不会引起物质结构变化的第二波长的可见光照射样本，来在样本中指定光刺激部位的步骤; 以及用第一波长的光照射指定的光刺激位点的步骤。

公开(公告)号：US20050258376A1

公开(公告)日：2005-11-24

申请号：US11129471

申请日：2005-05-16

申请人： Hirofumi Takatsuka ,  Yoshiharu Saito ,  Yasushi Aono

发明人： Hirofumi Takatsuka ,  Yoshiharu Saito ,  Yasushi Aono

IPC分类号： G01N21/64 ,  G02B21/00 ,  G02B21/06

CPC分类号： G01N21/6428 ,  G01N21/6458 ,  G02B21/16 ,  G02B21/32

摘要： While carrying out microscope examination, it is possible to specify a position to be irradiated with optical stimulus light and to accurately apply an optical stimulus to the specified irradiation position. A microscope examination method includes a step of introducing into a specimen a substance in which a structural change is caused by irradiation with light of a first wavelength; a step of specifying an optical stimulation site in the specimen by irradiating the specimen with visible light of a second wavelength that does not cause a structural change in the substance, while examining the specimen in which the substance is introduced using a microscope examination apparatus; and a step of irradiating the specified optical stimulus site with the light of the first wavelength.

摘要翻译： 在进行显微镜检查时，可以指定用光刺激光照射的位置，并且将光学刺激精确地应用于指定的照射位置。 显微镜检查方法包括：通过用第一波长的光照射引起结构变化的物质向样本中导入的物体的步骤; 在使用显微镜检查装置检查其中导入了物质的样本的同时，通过用不会引起物质结构变化的第二波长的可见光照射样本，来在样本中指定光刺激部位的步骤; 以及用第一波长的光照射指定的光刺激位点的步骤。

公开(公告)号：US20090040601A1

公开(公告)日：2009-02-12

申请号：US11913941

申请日：2006-05-17

申请人： Yoshiharu Saito ,  Hirofumi Takatsuka ,  Eiji Nakasho

发明人： Yoshiharu Saito ,  Hirofumi Takatsuka ,  Eiji Nakasho

IPC分类号： G02B21/06

CPC分类号： G02B21/14 ,  G02B21/0092

摘要： It in an object to acquire a high-precision polarization image. Provided is a polarization microscope comprising an illumination optical system 3 including a light source, a polarizer for converting a polarization state of illumination light from the light source, and a condenser lens for condensing the illumination light transmitted through the polarizer onto a specimen; an image-acquisition optical system including an objective lens for collecting observation light from the specimen, an analyzer for converting a polarization state of the observation light collected by the objective lens, and an image-acquisition device for acquiring the observation light transmitted through the analyzer; an observation-light angle correcting element for correcting changes in rotation angle of a polarization plane of the observation light in the image-acquisition optical system; and an observation-light phase-difference correcting element for correcting changes in phase difference between P-polarization and S-polarization of the observation light in the image-acquisition optical system, wherein amounts of correction of these correcting elements vary in directions intersecting an optical axis.

摘要翻译： 其目的在于获得高精度偏振图像。 本发明提供一种偏振显微镜，包括：照明光学系统3，包括光源;偏振器，用于转换来自光源的照明光的偏振状态;以及聚光透镜，用于将透过偏振器的照明光聚焦到样本上; 包括用于收集来自样本的观察光的物镜的图像采集光学系统，用于转换由物镜收集的观察光的偏振状态的分析器和用于获取透射通过分析器的观察光的图像获取装置 ; 观察光角度校正元件，用于校正图像采集光学系统中的观察光的偏振面的旋转角度的变化; 以及观察光相位差校正元件，用于校正图像采集光学系统中的观察光的P偏振和S偏振之间的相位差的变化，其中这些校正元件的校正量在与光学相交的方向上变化 轴。

公开(公告)号：US08149403B2

公开(公告)日：2012-04-03

申请号：US12388587

申请日：2009-02-19

申请人： Hirofumi Takatsuka

发明人： Hirofumi Takatsuka

IPC分类号： G01J4/00

CPC分类号： G02B21/16 ,  G01J3/4406 ,  G01N21/21 ,  G01N21/6458 ,  G02B21/0068 ,  G02B21/0076 ,  G02B27/10 ,  G02B27/144 ,  G02B27/145 ,  G02B27/56

摘要： Optical equipment for detecting beams emitted from a sample by irradiating the sample with linear polarization according to an aspect of the present invention includes a wavelength-independent optical path division element arranged at a position of coupling of a illumination optical path of the linear polarization and a detection optical path of the beams, and the linear polarization is reflected by the interface of the optical path division element entered as S polarization and led to the sample, and the beams pass through the optical path division element and are detected.

摘要翻译： 根据本发明的一个方面，通过用线偏振光照射样品来检测从样品发射的光束的光学设备包括布置在线偏振的照明光路的耦合位置处的波长无关的光路分割元件和 光束的检测光路，并且线偏振被作为S偏振输入的光路分割元件的界面反射并导向样本，并且光束通过光路分割元件并被检测。