MICROSCOPE EXAMINATION APPARATUS
    1.
    发明申请
    MICROSCOPE EXAMINATION APPARATUS 审中-公开
    显微镜检查装置

    公开(公告)号:US20080043323A1

    公开(公告)日:2008-02-21

    申请号:US11923138

    申请日:2007-10-24

    IPC分类号: G02B21/00

    摘要: The invention provides a microscope examination apparatus including a light source; an illumination optical system configured to guide light from the light source to a specimen; an objective lens configured to collimate return light from the specimen, the objective lens being provided in such a manner as to be displaceable at least in a direction intersecting an optical axis of the objective lens; an image-forming lens configured to image the return light from the specimen, which is collimated by the objective lens; an optical detector configured to detect the return light imaged by the image-forming lens; a microscope main body including the image-forming lens and the optical detector; and an objective-lens driving mechanism configured to drive the objective lens in a direction correcting image blur due to a displacement of the specimen.

    摘要翻译: 本发明提供一种包括光源的显微镜检查装置; 照明光学系统,被配置为将来自所述光源的光引导到样本; 物镜,被配置为准直来自所述样本的返回光,所述物镜以至少在与所述物镜的光轴相交的方向可位移的方式设置; 成像透镜,被配置为对由所述物镜准直的来自所述样本的返回光进行成像; 光学检测器,被配置为检测由图像形成透镜成像的返回光; 包括图像形成透镜和光学检测器的显微镜主体; 以及物镜驱动机构,被配置为在校正由于样本的位移造成的图像模糊的方向上驱动物镜。