公开(公告)号：US20190164101A1

公开(公告)日：2019-05-30

申请号：US16173020

申请日：2018-10-29

Applicant: Hitachi, Ltd.

Inventor： Hikaru KOYAMA ,  Toshio OKOCHI ,  Toshihiro KUJIRAI

IPC: G06Q10/06 ,  G05B23/02 ,  G05B19/418

Abstract: A data analysis apparatus generates M (M is an integer of 3 or greater) groups each including data regarding a plurality of units from data where first KPIs and K (K is an integer of 2 or greater) explanatory variables are given by 1:1, generates a second KPI indicating the state of the group based on the values of a plurality of first KPIs included in the group, and selects a feature for the first KPIs based on a correlation analysis between the second KPI of each group and the feature of each group calculated based on the explanatory variables.

公开(公告)号：US20240280635A1

公开(公告)日：2024-08-22

申请号：US18570157

申请日：2022-03-22

Applicant: Hitachi, Ltd.

Inventor： Takashi ENDO ,  Takeshi IWATA ,  Toshiaki ROKUNOHE ,  Hikaru KOYAMA ,  Kota DOHI

IPC: G01R31/327 ,  H04R3/00

CPC classification number: G01R31/327 ,  H04R3/00

Abstract: The acoustic diagnosis device extracts a second feature amount of an acoustic signal in which a delay of an acoustic signal collected by the microphone is corrected, the delay being generated from a relative distance between the circuit breaker and the microphone, during diagnosis of the circuit breaker, calculates a similarity between the second feature amount of the acoustic signal during the diagnosis and the first feature amount in the plurality of event models for each time, estimates the time at which the similarity becomes highest, as an occurrence timing of each event, and diagnoses the circuit breaker from a plurality of estimated occurrence timings.

公开(公告)号：US20200328101A1

公开(公告)日：2020-10-15

申请号：US16911669

申请日：2020-06-25

Applicant: Hitachi, Ltd.

Inventor： Takeshi OHMORI ,  Junichi TANAKA ,  Hikaru KOYAMA ,  Masaru KURIHARA

IPC: H01L21/67 ,  G06F16/903 ,  H01L21/66 ,  G01D1/00 ,  G06N5/04

Abstract: A search apparatus receives each input of a target value and a reference value indicated by the target value; generates a prediction model indicating a relation between the condition and the result based on a setting value of the condition inside the search area and a measured value of the result; acquires a prediction value from the prediction model by assigning the target value to the prediction model and specifies a presence area of the prediction value from the search area; determines whether the prediction value is closer to the target value than the reference value; sets the measured value of the result corresponding to the prediction value to the reference value when the prediction value is closer to the target value, and sets the prediction value presence area to the search area; and outputs a prediction value satisfying an achievement condition when the prediction value satisfies the achievement condition.

公开(公告)号：US20180082873A1

公开(公告)日：2018-03-22

申请号：US15658844

申请日：2017-07-25

Applicant: Hitachi, Ltd.

Inventor： Takeshi OHMORI ,  Junichi TANAKA ,  Hikaru KOYAMA ,  Masaru KURIHARA

IPC: H01L21/67 ,  G06F17/30 ,  G06N5/04 ,  G01D1/00

Abstract: A search apparatus receives an input target value, which indicates a condition to be set in a semiconductor processing apparatus or a result obtained by processing the semiconductor using the processing apparatus, a reference value of the condition inside a search area, and the result, wherein the reference value is indicated by the target value. A prediction model indicating a relation between the condition and the result based on a setting value of the condition inside the search area is generated and, a measured value of the result is obtained. A prediction value is acquired by assigning the target value to the prediction model. The prediction value is set to the reference value when it is determined that the prediction value is closer to the target value, and a prediction value satisfying an achievement condition is set when the prediction value satisfies the achievement condition of the target value.