LIQUID DROPLET GENERATION METHOD
    2.
    发明公开

    公开(公告)号:US20230173807A1

    公开(公告)日:2023-06-08

    申请号:US17926198

    申请日:2021-05-06

    申请人: HITACHI, LTD.

    IPC分类号: B41J2/14 B41J2/015 B05B17/06

    摘要: Provided is a liquid droplet generation method capable of generating liquid droplets having a diameter of 100 µm or more. The liquid droplet generation method for generating liquid droplets from a liquid layer 20 by using a plurality of transducers 18, the method including irradiating the liquid layer 20 with a plurality of ultrasonic waves from the plurality of transducers 18 to scatter primary liquid droplets 21A and 21B from the liquid layer 20, and causing the primary liquid droplets 21A and 21B being scattered to aggregate and grow into a secondary liquid droplet 22A.

    MANUFACTURING MONITORING ASSISTANCE DEVICE, MANUFACTURING MONITORING ASSISTANCE METHOD, AND MANUFACTURING MONITORING ASSISTANCE PROGRAM

    公开(公告)号:US20220057789A1

    公开(公告)日:2022-02-24

    申请号:US17413417

    申请日:2020-01-30

    申请人: HITACHI, LTD.

    IPC分类号: G05B19/418

    摘要: A manufacturing monitoring assistance device includes: a model creation unit creating a computation model when a product as a sample is normal, based on a three-dimensional form acquired from the product; a simulation unit creating a corrective computation model when the product is abnormal, by adding a sample of an abnormal portion in the product to the created computation model, and performing a simulation on each of the computation model and the corrective computation model; and a monitoring method determination unit determining a method for monitoring a manufacturing process for the product, based on an abnormality index being a difference between an output from a sensor as a result of the simulation performed on the computation model and an output from a sensor as a result of the simulation performed on the corrective computation model, and causing an output device to display the determined method and the abnormality index.

    Stress Distribution Measurement Device and Stress Distribution Measurement Method

    公开(公告)号:US20210063255A1

    公开(公告)日:2021-03-04

    申请号:US17008838

    申请日:2020-09-01

    申请人: Hitachi, Ltd.

    IPC分类号: G01L1/12 G01R33/032 G01L1/22

    摘要: A stress distribution measurement device includes: a first magnetostrictive sensor and a second magnetostrictive sensor each including an excitation coil that excites AC magnetism in a measurement target using alternating current, and a detection coil to which alternating current is induced due to the AC magnetism flowing in the measurement target; an excitation circuit that applies a first excitation voltage to the excitation coil of the first magnetostrictive sensor and applies a second excitation voltage to the excitation coil of the second magnetostrictive sensor, the second excitation voltage having a phase or a waveform different from the first excitation voltage; and a detection circuit that includes a first detector that performs synchronous detection of current flowing in the detection coil of the first magnetostrictive sensor based on the first excitation voltage and a second detector that performs synchronous detection of current flowing in the detection coil of the second magnetostrictive sensor based on the second excitation voltage.