ICP emission spectrometer
    1.
    发明授权
    ICP emission spectrometer 有权
    ICP发射光谱仪

    公开(公告)号:US09500524B2

    公开(公告)日:2016-11-22

    申请号:US14674052

    申请日:2015-03-31

    Inventor: Osamu Matsuzawa

    CPC classification number: G01J3/443 G01J3/06 G01N21/68 G01N21/73

    Abstract: An ICP emission spectrometer is schematically configured to include an inductively coupled plasma generation unit, a light condensing unit, a spectroscope, a two-dimensional detection unit and a controller. The two-dimensional detection unit includes a CCD image sensor which has multiple pixels laid in a planar shape and detects emission light by causing the emission light emitted from the spectroscope to be imaged on the multiple pixels. Then, the controller determines a pixel used in detecting the emission light among the multiple pixels in accordance with an imaging shape of detection-targeted emission light.

    Abstract translation: ICP发射光谱仪被示意性地配置为包括电感耦合等离子体产生单元,聚光单元,分光镜,二维检测单元和控制器。 二维检测单元包括具有平面形状的多个像素的CCD图像传感器,并且通过使从分光器发射的发射光成像在多个像素上来检测发射光。 然后,控制器根据检测目标发射光的成像形状来确定用于检测多个像素中的发射光的像素。

    ICP Emission Spectrometer
    2.
    发明申请
    ICP Emission Spectrometer 有权
    ICP发射光谱仪

    公开(公告)号:US20150276484A1

    公开(公告)日:2015-10-01

    申请号:US14674052

    申请日:2015-03-31

    Inventor: Osamu Matsuzawa

    CPC classification number: G01J3/443 G01J3/06 G01N21/68 G01N21/73

    Abstract: An ICP emission spectrometer is schematically configured to include an inductively coupled plasma generation unit, a light condensing unit, a spectroscope, a two-dimensional detection unit and a controller. The two-dimensional detection unit includes a CCD image sensor which has multiple pixels laid in a planar shape and detects emission light by causing the emission light emitted from the spectroscope to be imaged on the multiple pixels. Then, the controller determines a pixel used in detecting the emission light among the multiple pixels in accordance with an imaging shape of detection-targeted emission light.

    Abstract translation: ICP发射光谱仪被示意性地配置为包括电感耦合等离子体产生单元,聚光单元,分光镜,二维检测单元和控制器。 二维检测单元包括具有平面形状的多个像素的CCD图像传感器,并且通过使从分光器发射的发射光成像在多个像素上来检测发射光。 然后,控制器根据检测目标发射光的成像形状来确定用于检测多个像素中的发射光的像素。

Patent Agency Ranking