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公开(公告)号:US20170359222A1
公开(公告)日:2017-12-14
申请号:US15177895
申请日:2016-06-09
Applicant: Honeywell International Inc.
Inventor: MANAS DUTTA , RAMAKRISHNAN GANAPATHI , ABHISHEK NIKHRA , PRAVEEN SHETTY , JAGANMOHAN Y. REDDY
CPC classification number: H04L41/12 , H04L41/22 , H04L43/0811 , H04L61/103 , H04L61/6022
Abstract: A method of automatic network topology determination for at least one Control & Instrumentation (C&I) system in an industrial facility. A network type, and all nodes and interconnecting networking devices including switches in the C&I system(s) are discovered. Additional connectivity information including a connection of the nodes to a specific port is collected. The network relationships of the nodes and interconnecting networking devices in the C&I system are determined. A network topology diagram of the C&I system is automatically generated from the nodes and interconnecting networking devices, additional connectivity information, and network relationships.
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公开(公告)号:US20170357702A1
公开(公告)日:2017-12-14
申请号:US15177792
申请日:2016-06-09
Applicant: Honeywell International Inc.
Inventor: ABHISHEK NIKHRA , RAMAKRISHNAN GANAPATHI , MANAS DUTTA , KIRAN N , RAVI KUMAR R , AVINASH RAJAN
CPC classification number: G06F17/30569 , G05B19/00 , G06F17/30551 , H04L63/08
Abstract: A system and method of engineering configuration data (ECD) collection for an industrial facility having a first control and instrumentation (C&I) system with first ECD using a first file format and a second C&I system with second ECD data using a second file format, and a data collection server. A first data agent has collection information regarding the first C&I system and a second data agent has collection information regarding the second C&I system. The first data agent collects the first ECD and the second data agent collects the second ECD. The first ECD and the second ECD are translated into one common generic data format. The first ECD and the second ECD are stored after being translated.
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公开(公告)号:US20170357245A1
公开(公告)日:2017-12-14
申请号:US15177951
申请日:2016-06-09
Applicant: Honeywell International Inc.
Inventor: ABHISHEK NIKHRA , MANAS DUTTA , RAMAKRISHNAN GANAPATHI
IPC: G05B19/414 , G05B19/05
CPC classification number: G05B19/414 , G05B19/05 , G05B19/41885 , G05B2219/31334 , G05B2219/31343 , Y02P90/16 , Y02P90/185 , Y02P90/26
Abstract: A method of automatically determining interconnections between control and instrumentation (C&I) systems within an industrial facility (IF). A data collection system including a data collection algorithm that provides a data collection block and a data agents block is coupled to the IF which has C&I systems collectively utilizing different data formats each including C&I devices, where the C&I systems are coupled to field devices coupled to processing equipment configured for implementing an industrial process. A data collection process is initiated using respective data formats for obtaining engineering configuration data used in the C&I systems stored therein. The engineering configuration data from each C&I system is used to determine connections within and interconnections between the C&I systems. The format of the engineering configuration data can be converted to common format engineering configuration data and then be stored.
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公开(公告)号:US20170357232A1
公开(公告)日:2017-12-14
申请号:US15177844
申请日:2016-06-09
Applicant: Honeywell International Inc.
Inventor: ABHISHEK NIKHRA , RAMAKRISHNAN GANAPATHI , MANAS DUTTA , KIRAN N , RAVI KUMAR R
IPC: G05B19/048 , G05B19/042
CPC classification number: G05B19/0428 , G05B2219/25074
Abstract: A method of detecting and tracking changes in engineering configuration data (ECD) for control and instrumentation (C&I) systems an industrial facility. First ECD in a first data format used in a first C&I system and second ECD in a second data format used in a second C&I system are converted into a common format. The first and second ECD are stored together as reference snapshot data with a timestamp in a single information source. At a second time, after the first time reflected in the timestamp, the first and second ECD are obtained. The first ECD and the second ECD obtained at the second time are converted into the common format that collectively provides updated snapshot data. Changes are detected between the first ECD and the second ECD by comparing the reference snapshot data to the updated snapshot data.
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