Integrated isotropic illumination source for translucent item inspection
    2.
    发明授权
    Integrated isotropic illumination source for translucent item inspection 失效
    用于半透明物品检查的集成各向同性照明源

    公开(公告)号:US5440385A

    公开(公告)日:1995-08-08

    申请号:US13965

    申请日:1993-02-05

    IPC分类号: G01N21/88 G01N21/90

    CPC分类号: G01N21/8806 G01N21/90

    摘要: A substantially isotropic illumination source utilizes a generally spherical, translucent diffuser. The spherical diffuser has an inner wall and a diffusive outer wall. Light is communicated inwardly to the sphere along a first hemisphere. Light is diffused and homogenized by internal reflection within the sphere and communicated outwardly through a complimentary hemisphere. This light, upon being diffused by the external or outer wall is substantially isotropic. The isotropic light so generated is utilized for video inspection of translucent specimens with improved contrast to facilitate detection of flaws therein. Another aspect utilizes a specimen itself as the isotropic diffuser.

    摘要翻译: 一个基本上各向同性的照明光源使用一般为球形,半透明的漫射器。 球形扩散器具有内壁和漫射外壁。 光沿第一半球向内传播到球体。 光通过球内的内部反射扩散和均匀化,并通过补充半球向外传播。 该光在被外壁或外壁扩散时基本上是各向同性的。 所产生的各向同性光被用于具有改善的对比度的半透明样品的视频检查,以便于检测其中的缺陷。 另一方面利用样本本身作为各向同性扩散器。

    Method and apparatus for providing patterned illumination fields for machine vision systems
    4.
    发明授权
    Method and apparatus for providing patterned illumination fields for machine vision systems 有权
    用于为机器视觉系统提供图案化照明场的方法和装置

    公开(公告)号:US08598557B2

    公开(公告)日:2013-12-03

    申请号:US10519180

    申请日:2003-06-20

    IPC分类号: G01N21/86 G01N21/00

    CPC分类号: G01N21/8806

    摘要: This application relates to an apparatus and method for providing patterned illumination fields for use within process control and article inspection applications. More specifically, it pertains to the use of patterned illuminators to enable visual surface inspection of polished objects such as ball bearings. The use of patterned illuminators properly disposed in relation to a polished part under inspection allows small surface imperfections such as scratches and pits to become visible against the normal surface background. The use of carefully engineered illuminators facilitates advantageous defect-site scattering from generally dark field sources. The patterned nature of the illuminators defined by this invention allows the complete surface of three-dimensional parts to be effectively highlighted using dark field illumination fields.

    摘要翻译: 本申请涉及一种用于提供在过程控制和物品检查应用中使用的图案化照明场的装置和方法。 更具体地说,它涉及图案化照明器的使用以使得诸如球轴承之类的抛光物体的视觉表面检查。 相对于被检查的抛光部分适当地设置的图案照明器的使用允许诸如划痕和凹坑的小表面缺陷对于正常表面背景变得可见。 使用精心设计的照明器有助于从一般暗场光源获得有利的缺陷点散射。 由本发明限定的照明器的图案性质允许使用暗场照明场有效地突出显示三维部分的完整表面。