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公开(公告)号:US20190237556A1
公开(公告)日:2019-08-01
申请号:US16341055
申请日:2017-10-11
Applicant: Idemitsu Kosan Co., Ltd.
Inventor: Yuki TSURUMA , Emi KAWASHIMA , Yoshikazu NAGASAKI , Takashi SEKIYA , Yoshihiro UEOKA
IPC: H01L29/47 , H01L27/146 , H01L29/78 , H01L29/812 , H01L29/872 , H01L31/07 , H01L31/108
CPC classification number: H01L29/47 , H01L27/146 , H01L29/78 , H01L29/812 , H01L29/872 , H01L31/07 , H01L31/10 , H01L31/108 , Y02E10/50
Abstract: A structure including a metal oxide semiconductor layer and a noble metal oxide layer, wherein the metal oxide semiconductor layer and the noble metal oxide layer are adjacent to each other, and a film thickness of the noble metal oxide layer is more than 10 nm.
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公开(公告)号:US20190013389A1
公开(公告)日:2019-01-10
申请号:US16065943
申请日:2016-12-26
Applicant: IDEMITSU KOSAN CO., LTD.
Inventor: Emi KAWASHIMA , Takashi SEKIYA , Yuki TSURUMA , Yoshihiro UEOKA , Shigekazu TOMAI , Motohiro TAKESHIMA
IPC: H01L29/47 , H01L29/872 , H01L29/868
CPC classification number: H01L29/47 , H01L21/28 , H01L21/44 , H01L29/0619 , H01L29/0649 , H01L29/24 , H01L29/247 , H01L29/66143 , H01L29/868 , H01L29/872
Abstract: A laminated body comprising a substrate, an ohmic electrode layer, a metal oxide semiconductor layer, a Schottky electrode layer and a buffer electrode layer in this order, wherein a reduction suppressing layer is provided between the Schottky electrode layer and the buffer electrode layer.
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公开(公告)号:US20200266304A1
公开(公告)日:2020-08-20
申请号:US16065239
申请日:2016-12-26
Applicant: IDEMITSU KOSAN CO., LTD.
Inventor: Yoshihiro UEOKA , Takashi SEKIYA , Shigekazu TOMAI , Emi KAWASHIMA , Yuki TSURUMA , Motohiro TAKESHIMA
IPC: H01L29/872 , H01L29/04 , H01L29/786
Abstract: A laminated body comprising a substrate, one or more layers selected from a contact resistance reducing layer and a reduction suppressing layer, a Schottky electrode layer and a metal oxide semiconductor layer in this order.
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公开(公告)号:US20190006473A1
公开(公告)日:2019-01-03
申请号:US16064210
申请日:2016-12-21
Applicant: IDEMITSU KOSAN CO., LTD.
Inventor: Yuki TSURUMA , Takashi SEKIYA , Shigekazu TOMAI , Emi KAWASHIMA , Yoshihiro UEOKA
IPC: H01L29/24 , H01L29/47 , H01L29/872 , H01L21/02 , H01L29/812
CPC classification number: H01L29/247 , H01L21/02381 , H01L21/02565 , H01L21/02631 , H01L29/45 , H01L29/47 , H01L29/812 , H01L29/872
Abstract: A semiconductor device 1 which comprises a pair of an ohmic electrode 20 and a Schottky electrode 10 separated from each other, and a semiconductor layer 30 in contact with the ohmic electrode 20 and the Schottky electrode 10, and which satisfies the following formula (I): n
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