-
公开(公告)号:US20220388908A1
公开(公告)日:2022-12-08
申请号:US17885147
申请日:2022-08-10
IPC分类号: C04B35/01 , C23C14/34 , H01L27/146 , H01L29/786
摘要: A sintered oxide contains In element, Y element, and Ga element at respective atomic ratios as defined in formulae (1) to (3) below, 0.80≤In/(In+Y+Ga)≤0.96 (1), 0.02≤Y/(In+Y+Ga)≤0.10 (2), and 0.02≤Ga/(In+Y+Ga)≤0.10 (3), and Al element at an atomic ratio as defined in a formula (4) below, 0.005≤Al/(In+Y+Ga+Al)≤0.07 (4), where In, Y, Ga, and Al in the formulae represent the number of atoms of the In element, Y element, Ga element, and Al element in the sintered oxide, respectively.
-
公开(公告)号:US20190006473A1
公开(公告)日:2019-01-03
申请号:US16064210
申请日:2016-12-21
IPC分类号: H01L29/24 , H01L29/47 , H01L29/872 , H01L21/02 , H01L29/812
CPC分类号: H01L29/247 , H01L21/02381 , H01L21/02565 , H01L21/02631 , H01L29/45 , H01L29/47 , H01L29/812 , H01L29/872
摘要: A semiconductor device 1 which comprises a pair of an ohmic electrode 20 and a Schottky electrode 10 separated from each other, and a semiconductor layer 30 in contact with the ohmic electrode 20 and the Schottky electrode 10, and which satisfies the following formula (I): n
-
公开(公告)号:US20200266304A1
公开(公告)日:2020-08-20
申请号:US16065239
申请日:2016-12-26
发明人: Yoshihiro UEOKA , Takashi SEKIYA , Shigekazu TOMAI , Emi KAWASHIMA , Yuki TSURUMA , Motohiro TAKESHIMA
IPC分类号: H01L29/872 , H01L29/04 , H01L29/786
摘要: A laminated body comprising a substrate, one or more layers selected from a contact resistance reducing layer and a reduction suppressing layer, a Schottky electrode layer and a metal oxide semiconductor layer in this order.
-
4.
公开(公告)号:US20160343554A1
公开(公告)日:2016-11-24
申请号:US15107993
申请日:2014-12-18
发明人: Shigekazu TOMAI , Kazuyoshi INOUE , Kazuaki EBATA , Masatoshi SHIBATA , Futoshi UTSUNO , Yuki TSURUMA , Yu ISHIHARA
CPC分类号: H01J37/3429 , C04B35/01 , C04B35/64 , C04B2235/3217 , C04B2235/3222 , C04B2235/3224 , C04B2235/3225 , C04B2235/3227 , C04B2235/3229 , C04B2235/3286 , C04B2235/3293 , C04B2235/5445 , C04B2235/602 , C04B2235/604 , C04B2235/6562 , C04B2235/6567 , C04B2235/762 , C04B2235/764 , C04B2235/786 , C04B2235/80 , C23C14/08 , C23C14/083 , C23C14/086 , C23C14/3414 , H01J37/3426 , H01J37/3491 , H01L21/02565 , H01L21/02631 , H01L29/66969 , H01L29/7869
摘要: An oxide sintered body comprising a bixbyite phase composed of In2O3 and an A3B5O12 phase (wherein A is one or more elements selected from the group consisting of Sc, Y, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb and Lu, and B is one or more elements selected from the group consisting of Al and Ga).
摘要翻译: 一种氧化物烧结体,包括由In 2 O 3和A 3 B 5 O 12相构成的双相晶相(其中A是选自Sc,Y,La,Ce,Pr,Nd,Pm,Sm,Eu,Gd,Tb中的一种或多种元素 ,Dy,Ho,Er,Tm,Yb和Lu,B是选自Al和Ga的一种或多种元素)。
-
5.
公开(公告)号:US20190237556A1
公开(公告)日:2019-08-01
申请号:US16341055
申请日:2017-10-11
IPC分类号: H01L29/47 , H01L27/146 , H01L29/78 , H01L29/812 , H01L29/872 , H01L31/07 , H01L31/108
CPC分类号: H01L29/47 , H01L27/146 , H01L29/78 , H01L29/812 , H01L29/872 , H01L31/07 , H01L31/10 , H01L31/108 , Y02E10/50
摘要: A structure including a metal oxide semiconductor layer and a noble metal oxide layer, wherein the metal oxide semiconductor layer and the noble metal oxide layer are adjacent to each other, and a film thickness of the noble metal oxide layer is more than 10 nm.
-
公开(公告)号:US20190013389A1
公开(公告)日:2019-01-10
申请号:US16065943
申请日:2016-12-26
发明人: Emi KAWASHIMA , Takashi SEKIYA , Yuki TSURUMA , Yoshihiro UEOKA , Shigekazu TOMAI , Motohiro TAKESHIMA
IPC分类号: H01L29/47 , H01L29/872 , H01L29/868
CPC分类号: H01L29/47 , H01L21/28 , H01L21/44 , H01L29/0619 , H01L29/0649 , H01L29/24 , H01L29/247 , H01L29/66143 , H01L29/868 , H01L29/872
摘要: A laminated body comprising a substrate, an ohmic electrode layer, a metal oxide semiconductor layer, a Schottky electrode layer and a buffer electrode layer in this order, wherein a reduction suppressing layer is provided between the Schottky electrode layer and the buffer electrode layer.
-
公开(公告)号:US20180219098A1
公开(公告)日:2018-08-02
申请号:US15748356
申请日:2016-07-29
IPC分类号: H01L29/786 , C01G15/00 , C23C14/08 , C23C14/34 , C23C14/58 , C30B1/02 , C30B29/16 , H01L29/24 , H01L29/04 , H01L21/02 , H01L29/66
CPC分类号: H01L29/7869 , C01G15/00 , C01P2002/54 , C01P2002/70 , C01P2004/61 , C01P2006/40 , C23C14/08 , C23C14/086 , C23C14/34 , C23C14/5806 , C30B1/023 , C30B29/16 , H01L21/02565 , H01L21/02592 , H01L21/02595 , H01L21/02631 , H01L21/02667 , H01L29/04 , H01L29/24 , H01L29/66969
摘要: A crystalline oxide semiconductor thin film that is composed mainly of indium oxide and comprises surface crystal grains having a single crystal orientation.
-
-
-
-
-
-