公开(公告)号：US20240100518A1

公开(公告)日：2024-03-28

申请号：US18474589

申请日：2023-09-26

Applicant: ILLUMINA, INC.

Inventor： Matthew Hage ,  John Earney ,  Gregory Holst ,  Mark Majette

IPC: B01L3/00

CPC classification number: B01L3/502715 ,  B01L2300/0654 ,  B01L2300/0893 ,  B01L2300/0896

Abstract: The presently described techniques relate generally to providing motion feedback (e.g., motion system calibration and/or sample alignment) in the context of an imaging system (such as a time delay and integration (TDI) based imaging system). The architecture and techniques discussed may achieve nanoscale control and calibration of a movement feedback system without a high-resolution encoder subsystem or, in the alternative embodiments, with a lower resolution (and correspondingly less expensive) encoder subsystem than might otherwise be employed. By way of example, certain embodiments described herein relate to ascertaining or calibrating linear motion of a sample holder surface using nanoscale features (e.g., sample sites or nanowells or lithographically patterned features) provided on a surface of the sample holder.