公开(公告)号：US10387235B2

公开(公告)日：2019-08-20

申请号：US15161462

申请日：2016-05-23

Applicant: International Business Machines Corporation

Inventor： Rajiv V. Joshi ,  Rouwaida N. Kanj ,  Sani R. Nassif ,  Carl J. Radens

IPC: G06F11/00 ,  G06F11/07 ,  G06F17/50

Abstract: A mechanism is provided for reusing importance sampling for efficient cell failure rate estimation of process variations and other design considerations. First, the mechanism performs a search across circuit parameters to determine failures with respect to a set of performance variables. For a single failure region, the initial search may be a uniform sampling of the parameter space. Mixture importance sampling (MIS) efficiently may estimate the single failure region. The mechanism then finds a center of gravity for each metric and finds importance samples. Then, for each new origin corresponding to a process variation or other design consideration, the mechanism finds a suitable projection and recomputes new importance sampling (IS) ratios.

公开(公告)号：US09999788B2

公开(公告)日：2018-06-19

申请号：US14596940

申请日：2015-01-14

Applicant: International Business Machines Corporation

Inventor： Anne E. Gattiker ,  Damir A. Jamsek ,  Sani R. Nassif ,  Thomas H. Osiecki ,  William E. Speight ,  Chin Ngai Sze ,  Min-Yu Tsai

IPC: G06F7/60 ,  G06F17/10 ,  A61N5/10 ,  G06F17/50

CPC classification number: A61N5/1048 ,  A61N5/1031 ,  A61N2005/1074 ,  A61N2005/1087 ,  G06F17/50

Abstract: Simulating particle beam interactions includes identifying a set of n functions F1, F2, . . . , Fn corresponding to a plurality of different physical aspects of a particle beam, performing simulations of each Fi using a full physics model, selecting for each Fi a distribution function fi that models relevant behavior and reducing computation of the full physics model for each Fi by replacing Fi with a distribution function fi. The computation reduction includes comparing a set of simulations wherein each fi replaces its respective Fi to determine if relevant behavior is accurately modeled and selecting one of fi or Fi for each n, for a Monte Carlo simulation based on a runtime and accuracy criteria.

公开(公告)号：US10474774B2

公开(公告)日：2019-11-12

申请号：US14017634

申请日：2013-09-04

Applicant: International Business Machines Corporation

Inventor： Emrah Acar ,  Moyra K. McManus ,  Sani R. Nassif ,  Matthew J. Sullivan

IPC: G06F17/50

Abstract: A system, method and computer program product for sorting Integrated Circuits (chips), particularly microprocessor chips, and particularly that predicts chip performance or power for sorting purposes. The system and method described herein uses a combination of performance-predicting parameters that are measured early in the process, and applies a unique method to project where the part, e.g., microprocessor IC, will eventually be sorted. Sorting includes classifying the IC product to a subset of a family of products with the product satisfying certain performance characteristics or specifications, in the early stages of manufacturing, e.g., before the end product is fully fabricated.

公开(公告)号：US11372701B2

公开(公告)日：2022-06-28

申请号：US16543776

申请日：2019-08-19

Applicant: International Business Machines Corporation

Inventor： Rajiv V. Joshi ,  Rouwaida N. Kanj ,  Sani R. Nassif ,  Carl J. Radens

IPC: G06F30/33 ,  G06F30/20 ,  G06F111/08 ,  G06F11/07 ,  G06F11/00

Abstract: A mechanism is provided for reusing importance sampling for efficient cell failure rate estimation of process variations and other design considerations. First, the mechanism performs a search across circuit parameters to determine failures with respect to a set of performance variables. For a single failure region, the initial search may be a uniform sampling of the parameter space. Mixture importance sampling (MIS) efficiently may estimate the single failure region. The mechanism then finds a center of gravity for each metric and finds importance samples. Then, for each new origin corresponding to a process variation or other design consideration, the mechanism finds a suitable projection and recomputes new importance sampling (IS) ratios.

公开(公告)号：US09987502B1

公开(公告)日：2018-06-05

申请号：US15371002

申请日：2016-12-06

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Anne E. Gattiker ,  Sani R. Nassif ,  Tom Osiecki ,  Chin Ngai Sze

IPC: A61N5/10 ,  G06T15/08

CPC classification number: A61N5/103 ,  A61N5/1084 ,  A61N2005/1087 ,  G06T15/08 ,  G06T2210/41

Abstract: A method and system are provided. The method includes splitting, by a processor based on radiation beamlet contributions to neighboring voxels, at least one row in a voxel-beamlet matrix and corresponding elements of a target dose vector prior to, and in preparation for, a regression operation. The voxel-beamlet matrix has a row for each of a plurality of voxels in a three-dimensional patient volume and a column for each of a plurality of radiation beamlets. The target dose vector represents a desired energy amount for each of the plurality of voxels in the three-dimensional patient volume. The target dose vector corresponds voxel-by-voxel to rows in the voxel-beamlet matrix. The method further includes performing, by the processor, the regression operation on the voxel-beamlet matrix and target dose vector to obtain beamlet weights. The method also includes determining an actual radiation dosing scheme for a given patient based on the beamlet weights.

公开(公告)号：US09987501B1

公开(公告)日：2018-06-05

申请号：US15370953

申请日：2016-12-06

Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION

Inventor： Anne E. Gattiker ,  Damir A. Jamsek ,  Sani R. Nassif ,  Tom Osiecki ,  Chin Ngai Sze

IPC: G06K9/00 ,  A61N5/10

CPC classification number: A61N5/103 ,  A61N2005/1087

Abstract: A method and system are provided. The method includes condensing, by a processor, an original voxel-beamlet matrix stored in a memory device into a reduced dataset for proton beam simulation and therapy. The original voxel-beamlet matrix has a row for each of a plurality of voxels in a three-dimensional patient volume and a column for each of a plurality of radiation beamlets. The condensing step includes determining protobeams to be extracted from the original voxel-beamlet matrix. The protobeams are columns (i) selected from the original voxel-beamlet matrix based on comparisons performed between the columns in the original voxel-beamlet matrix or (ii) created by combining at least some of the columns in the original voxel-beamlet matrix, in a matrix condensing process. The condensing step further includes extracting the protobeams from the original voxel-beamlet matrix. The condensing step also includes storing the protobeams as the reduced dataset in the memory device.

公开(公告)号：US09946824B2

公开(公告)日：2018-04-17

申请号：US14086610

申请日：2013-11-21

Applicant: International Business Machines Corporation

Inventor： Charles J. Alpert ,  Zhuo Li ,  Sani R. Nassif ,  Yilin Zhang ,  Ying Zhou

IPC: G06F17/50

CPC classification number: G06F17/5036 ,  G06F2217/84

Abstract: A slew-based effective capacitance (Ceff) is used to compute gate output slew during early synthesis of an integrated circuit design. A π model is constructed for the gate and reduced to two parameters which are used to compute a slew value for the model, given a slew definition. A capacitance coefficient is then calculated as a function of this slew value. The effective capacitance is the product of the coefficient and the total capacitance of the π model. The output slew of the gate may in turn be computed using the slew-based Ceff. The coefficient may be computed by iteratively solving an equation representing output voltage over time dependent on the first and second parameters, by directly solving a closed-form equation which is a function of the first and second parameters, or by looking up the capacitance coefficient in a table indexed by the first and second parameters.

公开(公告)号：US09348680B2

公开(公告)日：2016-05-24

申请号：US14242418

申请日：2014-04-01

Applicant: International Business Machines Corporation

Inventor： Rajiv V. Joshi ,  Rouwaida N. Kanj ,  Sani R. Nassif ,  Carl J. Radens

IPC: G06F11/00 ,  G06F17/50

CPC classification number: G06F11/076 ,  G06F11/008 ,  G06F11/079 ,  G06F17/5009 ,  G06F17/5022 ,  G06F2217/10

Abstract: A mechanism is provided for reusing importance sampling for efficient cell failure rate estimation of process variations and other design considerations. First, the mechanism performs a search across circuit parameters to determine failures with respect to a set of performance variables. For a single failure region, the initial search may be a uniform sampling of the parameter space. Mixture importance sampling (MIS) efficiently may estimate the single failure region. The mechanism then finds a center of gravity for each metric and finds importance samples. Then, for each new origin corresponding to a process variation or other design consideration, the mechanism finds a suitable projection and recomputes new importance sampling (IS) ratios.

Abstract translation: 提供了一种用于重用采样的机制，用于有效地进行细胞故障率估计过程变化和其他设计考虑。 首先，该机制对电路参数进行搜索，以确定相对于一组性能变量的故障。 对于单个故障区域，初始搜索可以是参数空间的均匀采样。 混合重要性抽样（MIS）有效地估计单个故障区域。 然后，该机制找到每个度量的重心，并发现重要性样本。 然后，对于对应于过程变化或其他设计考虑的每个新的原点，机制找到合适的投影并重新计算新的重要性抽样（IS）比率。

公开(公告)号：US20150352374A1

公开(公告)日：2015-12-10

申请号：US14596940

申请日：2015-01-14

Applicant: International Business Machines Corporation

Inventor： Anne E. Gattiker ,  Damir A. Jamsek ,  Sani R. Nassif ,  Thomas H. Osiecki ,  William E. Speight ,  Chin Ngai Sze ,  Min-Yu Tsai

IPC: A61N5/10 ,  G06F19/00 ,  G06F17/50

CPC classification number: A61N5/1048 ,  A61N5/1031 ,  A61N2005/1074 ,  A61N2005/1087 ,  G06F17/50

Abstract: Simulating particle beam interactions includes identifying a set of n functions F1, F2, . . . , Fn corresponding to a plurality of different physical aspects of a particle beam, performing simulations of each Fi using a full physics model, selecting for each Fi a distribution function fi that models relevant behavior and reducing computation of the full physics model for each Fi by replacing Fi with a distribution function fi. The computation reduction includes comparing a set of simulations wherein each fi replaces its respective Fi to determine if relevant behavior is accurately modeled and selecting one of fi or Fi for each n, for a Monte Carlo simulation based on a runtime and accuracy criteria.

Abstract translation: 模拟粒子束相互作用包括识别一组n个函数F1，F2。 。 。 ，Fn对应于粒子束的多个不同物理方面，使用完整物理模型对每个Fi进行模拟，为每个Fi选择分配函数fi，其分配函数fi模拟相关行为，并减少每个Fi的完整物理模型的计算 用分配功能fi代替Fi。 计算减少包括比较一组模拟，其中每个fi替换其各自的Fi以确定相关行为是否被精确地建模，并且基于运行时间和准确度准则为蒙特卡罗模拟选择每个n的fi或Fi中的一个。

公开(公告)号：US20150143326A1

公开(公告)日：2015-05-21

申请号：US14086610

申请日：2013-11-21

Applicant: International Business Machines Corporation

Inventor： Charles J. Alpert ,  Zhuo Li ,  Sani R. Nassif ,  Yilin Zhang ,  Ying Zhou

IPC: G06F17/50

CPC classification number: G06F17/5036 ,  G06F2217/84

Abstract: A slew-based effective capacitance (Ceff) is used to compute gate output slew during early synthesis of an integrated circuit design. A π model is constructed for the gate and reduced to two parameters which are used to compute a slew value for the model, given a slew definition. A capacitance coefficient is then calculated as a function of this slew value. The effective capacitance is the product of the coefficient and the total capacitance of the π model. The output slew of the gate may in turn be computed using the slew-based Ceff. The coefficient may be computed by iteratively solving an equation representing output voltage over time dependent on the first and second parameters, by directly solving a closed-form equation which is a function of the first and second parameters, or by looking up the capacitance coefficient in a table indexed by the first and second parameters.

Abstract translation: 在集成电路设计的早期合成期间，使用基于摆率的有效电容（Ceff）来计算栅极输出压摆。 A＆pgr 模型构造为门，并减少为两个参数，用于计算模型的摆动值，给定一个转换定义。 然后根据该转换值计算电容系数。 有效电容是系数和总电容的乘积。 模型。 栅极的输出电压可以使用基于摆率的Ceff进行计算。 可以通过直接求解作为第一和第二参数的函数的闭式方程式，或通过查找第一和第二参数的函数的闭合方程式，或者通过查找第 由第一和第二参数索引的表。