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公开(公告)号:US20180149525A1
公开(公告)日:2018-05-31
申请号:US15573568
申请日:2016-05-13
发明人: Sang Won YOON , Min Ki KIM
CPC分类号: G01K5/56 , G01K5/72 , G01L1/16 , H01L41/0805 , H01L41/1132 , H01L41/257
摘要: An apparatus for measuring a temperature of a power device using a piezoelectric device according to an exemplary embodiment of the present disclosure includes: a substrate; at least one power device formed on one surface of the substrate; and at least one piezoelectric device disposed on the substrate as spaced from the power device and configured to measure a thermal stress generated on the substrate to sense a temperature caused by heat generation of the power device.
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公开(公告)号:US20180294209A1
公开(公告)日:2018-10-11
申请号:US15573955
申请日:2016-05-13
发明人: Sang Won YOON
IPC分类号: H01L23/48 , H01L21/768 , H01L21/3065 , H01L21/683 , H01L21/02
CPC分类号: H01L23/481 , G01D11/26 , H01L21/02118 , H01L21/3065 , H01L21/3212 , H01L21/6835 , H01L21/76831 , H01L21/7684 , H01L21/76871 , H01L21/76877 , H01L21/76898 , H01L23/00 , H01L23/48 , H01L2221/68359
摘要: A method for manufacturing a sensor packaging according to an exemplary embodiment of the present disclosure includes: forming a via hole penetrating a main substrate by etching each of both surfaces of the main substrate; forming an insulating layer on a wall surface of the via hole and the both surfaces of the main substrate; combining a sub-substrate on which a metallic seed layer and a bonding layer having a pattern for exposing a part of the seed layer are laminated with the main substrate; forming a filling layer configured to cover an upper surface of the main substrate by filling metal in the via hole; and removing the sub-substrate from the main substrate.
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