公开(公告)号：US09459288B2

公开(公告)日：2016-10-04

申请号：US14157181

申请日：2014-01-16

Applicant: Infineon Technologies AG

Inventor： Rianda Rizza

IPC: G01R1/073 ,  G01R1/04 ,  G01R31/28

CPC classification number: G01R1/07378 ,  G01R1/0433 ,  G01R31/2886

Abstract: A test interposer includes an interposer layer configured to receive a test socket, and a stiffening layer attached to the interposer layer so that the interposer layer is kept in an unalterable shape.

Abstract translation: 测试插入器包括被配置为接收测试插座的插入层，以及附接到插入层的加强层，使得插入层保持不可改变的形状。

公开(公告)号：US20150198633A1

公开(公告)日：2015-07-16

申请号：US14157181

申请日：2014-01-16

Applicant: Infineon Technologies AG

Inventor： Rianda Rizza

IPC: G01R1/073 ,  G01R1/04 ,  G01R31/28

CPC classification number: G01R1/07378 ,  G01R1/0433 ,  G01R31/2886

Abstract: A test interposer includes an interposer layer configured to receive a test socket, and a stiffening layer attached to the interposer layer so that the interposer layer is kept in an unalterable shape.

Abstract translation: 测试插入器包括被配置为接收测试插座的插入层，以及附接到插入层的加强层，使得插入层保持不可改变的形状。