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公开(公告)号:US20210072016A1
公开(公告)日:2021-03-11
申请号:US16948088
申请日:2020-09-02
Applicant: Infineon Technologies AG
Inventor: Benjamin KOLLMITZER , Thomas GANNER
Abstract: The present disclosure relates to an apparatus for ascertaining a rotation angle of a magnetic field orientation-influencing test object with an axis of rotation in the z-direction. The apparatus may include at least three first magnetic field sensor elements, which are sensitive to magnetic field components in the z-direction. The apparatus may include at least three second magnetic field sensor elements, which are sensitive to magnetic field components in an xy-plane. The apparatus may include a device for ascertaining the rotation angle on the basis of a first combination signal which is based on multiple combinations of measurement signals from the first magnetic field sensor elements and the second magnetic field sensor elements.
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公开(公告)号:US20200219972A1
公开(公告)日:2020-07-09
申请号:US16733329
申请日:2020-01-03
Applicant: Infineon Technologies AG
Inventor: Caspar LEENDERTZ , Rudolf ELPELT , Romain ESTEVE , Thomas GANNER , Jens Peter KONRATH , Larissa WEHRHAHN-KILIAN
Abstract: A silicon carbide device includes a silicon carbide body including a source region of a first conductivity type, a cathode region of the first conductivity type and separation regions of a second conductivity type. A stripe-shaped gate structure extends along a first direction and adjoins the source region and the separation regions. The silicon carbide device includes a first load electrode. Along the first direction, the cathode region is between two separation regions of the separation regions and at least one separation region of the separation regions is between the cathode region and the source region. The source region and the first load electrode form an ohmic contact. The first load electrode and the cathode region form a Schottky contact.
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