公开(公告)号：US20240027512A1

公开(公告)日：2024-01-25

申请号：US18336939

申请日：2023-06-16

Applicant: Innolux Corporation

Inventor： Ker-Yih Kao ,  Kuang-Ming Fan ,  Wang-Chih Tsai ,  Chien-Li Lin

IPC: G01R31/26 ,  G01N21/84

CPC classification number: G01R31/2607 ,  G01N21/84

Abstract: A measuring equipment and a measuring method for measuring electronic properties and optical properties are disclosed. The measuring equipment is used to measure electronic and optical properties. The measuring equipment includes a test socket, a light-emitting element circuit, an optical device, a signal conversion circuit, and a control host. The test socket has measuring probes. The test socket tests the electronic properties of the semiconductor device through the measuring probes. The light-emitting element circuit has a light-emitting element. The optical device measures the optical properties of the light-emitting element. The signal conversion circuit converts the electronic properties to an electronic signal. The control host analyzes and stores the electronic signal and the optical properties.