Bidirectional optical grating coupler with multiple light paths for testing photonics devices

    公开(公告)号:US12158625B2

    公开(公告)日:2024-12-03

    申请号:US17132967

    申请日:2020-12-23

    Abstract: Embodiments described herein may be related to apparatuses, processes, and techniques related to a bidirectional optical grating coupler that may be used for testing. A photonic apparatus includes a first layer with electro-optical circuitry that is optically coupled with a bidirectional optical grating coupler. A second layer is physically coupled with a first side of the first layer and includes a first light path to optically coupled with the bidirectional optical grating coupler. A third layer is physically coupled with a second side of the first layer opposite the first side of the first layer, and includes a second light path that optically couples with the bidirectional grating coupler. Operational testing of the electro-optical circuitry is based in part on light received or transmitted through the second light path. Other embodiments may be described and/or claimed.

    ERROR HANDLING IN AN INTERCONNECT
    2.
    发明申请

    公开(公告)号:US20200174873A1

    公开(公告)日:2020-06-04

    申请号:US16784768

    申请日:2020-02-07

    Abstract: A system level error detection and handling of the network IO in a multi-chip-package (MCP) die is provided. The error detection and handling mechanism conceived may be used between a system-on-chip (SoC) die and a different type of die, such as a die manufactured by a third-party (e.g., a high-bandwidth network IO die). To provide a timely indication in case of any part of the network is at fault, a control unit on the SoC die handles error detection on the network IO links using various indicators. After errors are detected, the control unit groups the errors into two categories: a link failure and a virtual channel failure. Such an error handling mechanism may consolidate the actions and provide consistency in hardware behavior.

    Error handling in an interconnect

    公开(公告)号:US11815984B2

    公开(公告)日:2023-11-14

    申请号:US16784768

    申请日:2020-02-07

    Abstract: A system level error detection and handling of the network IO in a multi-chip-package (MCP) die is provided. The error detection and handling mechanism conceived may be used between a system-on-chip (SoC) die and a different type of die, such as a die manufactured by a third-party (e.g., a high-bandwidth network IO die). To provide a timely indication in case of any part of the network is at fault, a control unit on the SoC die handles error detection on the network IO links using various indicators. After errors are detected, the control unit groups the errors into two categories: a link failure and a virtual channel failure. Such an error handling mechanism may consolidate the actions and provide consistency in hardware behavior.

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