公开(公告)号：US20170186498A1

公开(公告)日：2017-06-29

申请号：US15457326

申请日：2017-03-13

Applicant: Intel Corporation

Inventor： ASHOK RAJ ,  RON GABOR ,  HISHAM SHAFI ,  MOHAN J. KUMAR ,  THEODROS YIGZAW

IPC: G11C29/38 ,  G11C29/44

CPC classification number: G11C29/38 ,  G11C13/0004 ,  G11C29/04 ,  G11C29/44 ,  G11C29/52 ,  G11C2029/0401

Abstract: Methods and apparatuses relating to a hardware memory test unit to check a section of a data storage device for a transient fault before the data is stored in and/or loaded from the section of the data storage device are described. In one embodiment, an integrated circuit includes a hardware processor to operate on data in a section of a data storage device, and a memory test unit to check the section of the data storage device for a transient fault before the data is stored in the section of the data storage device, wherein the transient fault is to cause a machine check exception if accessed by the hardware processor.