公开(公告)号：US08570510B2

公开(公告)日：2013-10-29

申请号：US13390650

申请日：2010-07-28

Applicant: Ippei Kamimura

Inventor： Ippei Kamimura

IPC: G01J3/28

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/1895 ,  G01J3/2803 ,  G01J3/36 ,  G01J3/51 ,  G02B5/1809 ,  G02B5/204 ,  G02B27/1013 ,  G02B27/1086 ,  G02B27/4244

Abstract: An optical unit has a filter member that disperses transmitted light and a photodetector that has light receiving elements. The filter member has a light transmissive substrate, protrusions including a first metallic material and formed on one surface of the substrate, and a metal film including a second metallic material having a refractive index higher than that of the first metallic material and formed so as to cover the protrusions as well as the one surface of the substrate. The metal film located between adjacent protrusions can be a diffraction grating and the protrusions can be waveguides. At least one of the grating cycle of the diffraction grating, the height of the protrusions, and the thickness of the metal film is set to a value different for each portion such that a wavelength of light transmitted through the filter member changes for each portion.

Abstract translation: 光学单元具有分散透射光的过滤构件和具有光接收元件的光电检测器。 过滤构件具有透光基板，包括第一金属材料并形成在基板的一个表面上的突起，以及包括折射率高于第一金属材料的第二金属材料的金属膜，并形成为 覆盖突起以及基底的一个表面。 位于相邻突起之间的金属膜可以是衍射光栅，并且突起可以是波导。 衍射光栅的光栅周期，突起的高度和金属膜的厚度中的至少一个被设定为对于每个部分不同的值，使得透过过滤构件的光的波长对于每个部分而变化。

公开(公告)号：US20120147373A1

公开(公告)日：2012-06-14

申请号：US13390650

申请日：2010-07-28

Applicant: Ippei Kamimura

Inventor： Ippei Kamimura

IPC: G01J3/28

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/1895 ,  G01J3/2803 ,  G01J3/36 ,  G01J3/51 ,  G02B5/1809 ,  G02B5/204 ,  G02B27/1013 ,  G02B27/1086 ,  G02B27/4244

Abstract: An optical unit is provided with a filter member (1) that disperses transmitted light and a photodetector (2) that has a plurality of light receiving elements. The filter member (1) is provided with a light transmissive substrate, a plurality of protrusions comprising a first metallic material and formed on one surface of the substrate, and a metal film comprising a second metallic material having a refractive index higher than that of the first metallic material and formed so as to cover the plurality of protrusions as well as the one surface of the substrate. The plurality of protrusions is disposed such that the metal film located between adjacent protrusions can be a diffraction grating and the protrusions can be waveguides. At least one of the grating cycle of the diffraction grating, the height of the protrusions, or the thickness of the metal film is set to a value different each portion such that a wavelength of light transmitted through the filter member changes each portion. The photodetector (2) is disposed such that each of the light receiving elements (21) receives the light transmitted through the filter member (1).

Abstract translation: 光学单元设置有分散透射光的过滤构件（1）和具有多个光接收元件的光电检测器（2）。 过滤器构件（1）设置有透光基板，多个突起，包括第一金属材料并形成在基板的一个表面上，金属膜包括折射率高于基板的第二金属材料 第一金属材料并且形成为覆盖多个突起以及基板的一个表面。 多个突起被布置成使得位于相邻突起之间的金属膜可以是衍射光栅，并且突起可以是波导。 将衍射光栅的光栅周期，突起的高度或金属膜的厚度中的至少一个设定为不同于每个部分的值，使得透过过滤部件的光的波长改变每个部分。 光检测器（2）被布置成使得每个光接收元件（21）接收透过过滤构件（1）的光。

公开(公告)号：US20130003054A1

公开(公告)日：2013-01-03

申请号：US13634207

申请日：2011-02-21

Applicant: Ippei Kamimura

Inventor： Ippei Kamimura

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J3/10 ,  G01J3/18 ,  G01J3/36 ,  G01J3/42 ,  G01N21/255 ,  G01N21/274 ,  G01N21/31 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/3577 ,  G01N2021/3166 ,  G01N2021/3177 ,  G02B5/1809 ,  G02B5/201 ,  G02B5/203

Abstract: An analysis device capable of handling analysis of a wide variety of components while suppressing an increase in device size is provided. An analysis device 1 is provided with a light emitting unit 10, a transmissive spectral filter 22, a light detector 23, and an analysis unit 31. The spectral filter 22 is provided with a light transmissive substrate, a plurality of raised portions formed with a first metal material on one surface of the substrate, and a metal film formed using a second metal material having a higher refractive index than the first metal material, so as to cover the raised portions and the one surface. The raised portions are disposed such that the metal film existing between the raised portions serves as a diffraction grating and the raised portions serve as a waveguide. The grating pitch of the diffraction grating, the height of the raised portions and the thickness of the metal film are set to a different value for each portion of the spectral filter, such that the wavelength of the transmitted light of the spectral filter changes for each of the portions. The light detector 23 is disposed such that each light receiving element 24 receives transmitted light of the spectral filter. The analysis unit 31 acquires the spectrum of the object 40 from the output signals of the light receiving elements 24.

Abstract translation: 提供能够在抑制设备尺寸增加的同时处理各种部件的分析的分析装置。 分析装置1设置有发光单元10，透射光谱滤波器22，光检测器23和分析单元31.光谱滤波器22设置有透光基板，多个凸起部分形成有 在所述基板的一个表面上的第一金属材料和使用具有比所述第一金属材料更高的折射率的第二金属材料形成的金属膜，以覆盖所述凸起部分和所述一个表面。 凸起部分被布置成使得存在于凸起部分之间的金属膜用作衍射光栅，并且凸起部分用作波导。 衍射光栅的光栅间距，凸起部分的高度和金属膜的厚度被设置为对于光谱滤光器的每个部分的不同值，使得光谱滤光器的透射光的波长针对每个 的部分。 光检测器23被布置成使得每个光接收元件24接收光谱滤波器的透射光。 分析单元31从光接收元件24的输出信号获取物体40的光谱。

公开(公告)号：US09279720B2

公开(公告)日：2016-03-08

申请号：US13634207

申请日：2011-02-21

Applicant: Ippei Kamimura

Inventor： Ippei Kamimura

IPC: G01J3/02 ,  G01J3/42 ,  G01N21/25 ,  G02B5/20 ,  G01N21/31 ,  G01J3/10 ,  G01J3/18 ,  G01J3/36 ,  G02B5/18 ,  G01N21/27 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/3577

CPC classification number: G01J3/02 ,  G01J3/10 ,  G01J3/18 ,  G01J3/36 ,  G01J3/42 ,  G01N21/255 ,  G01N21/274 ,  G01N21/31 ,  G01N21/35 ,  G01N21/3563 ,  G01N21/3577 ,  G01N2021/3166 ,  G01N2021/3177 ,  G02B5/1809 ,  G02B5/201 ,  G02B5/203

Abstract: An analysis device for analyzing components contained in an object includes a light emitting unit that irradiates the object with light, a transmissive spectral filter, a light detector including a plurality of light receiving elements, an analysis unit. The spectral filter includes a substrate having light transmissivity and being disposed on a light path of the light after being reflected by the object or the light after passing through the object, a plurality of raised portions formed with a metal material on one surface of the substrate, and a metal oxide film including a metal oxide material having a higher refractive index than the metal material, so as to cover the plurality of raised portions and the one surface of the substrate.

Abstract translation: 用于分析物体中包含的成分的分析装置包括用光照射物体的发光单元，透射光谱滤波器，包括多个光接收元件的光检测器，分析单元。 光谱滤光器包括具有透光性的基板，并且在被物体反射之后设置在光的光路上，或者通过物体之后的光，在基板的一个表面上形成有金属材料的多个凸起部分 以及包含比金属材料折射率高的金属氧化物材料的金属氧化物膜，以覆盖多个凸起部分和基板的一个表面。