Contact probe
    1.
    发明授权

    公开(公告)号:US09774121B2

    公开(公告)日:2017-09-26

    申请号:US14430557

    申请日:2013-11-27

    IPC分类号: H01R13/24 G01R1/067 G01R1/073

    摘要: The present invention intends to suppress a contact probe from interfering with a guide plate to produce shavings. The present invention has stacked structure that sandwiches an intermediate metallic layer 12 between outer metallic layers 11 and 13, and includes: a contact part 2 that is brought into abutting with a test object; an elastic deformation part 4 that is elastically deformed so as to be curved in a predetermine direction of curvature N by compression force in the longer direction; and a fore end part 3 that is formed between the contact part 2 and the elastic deformation part 4 and supported by a through-hole 121 of a guide plate 120 so as to make the contact part 2 movable in the longer direction, in which side surfaces of the fore end part 3 formed in the direction of curvature N and a direction N′ opposite to the N of the elastic deformation part 4 are configured to include the three metallic layers 11 to 13, and on the side surfaces, the intermediate metallic layer 12 is configured to protrude relative to the outer metallic layers 11 and 13.

    Contact Probe
    2.
    发明申请

    公开(公告)号:US20170346211A1

    公开(公告)日:2017-11-30

    申请号:US15674541

    申请日:2017-08-11

    IPC分类号: H01R13/24 G01R1/067 G01R1/073

    摘要: The present invention intends to suppress a contact probe from interfering with a guide plate to produce shavings. The present invention has stacked structure that sandwiches an intermediate metallic layer 12 between outer metallic layers 11 and 13, and includes: a contact part 2 that is brought into abutting with a test object; an elastic deformation part 4 that is elastically deformed so as to be curved in a predetermine direction of curvature N by compression force in the longer direction; and a fore end part 3 that is formed between the contact part 2 and the elastic deformation part 4 and supported by a through-hole 121 of a guide plate 120 so as to make the contact part 2 movable in the longer direction, in which side surfaces of the fore end part 3 formed in the direction of curvature N and a direction N′ opposite to the N of the elastic deformation part 4 are configured to include the three metallic layers 11 to 13, and on the side surfaces, the intermediate metallic layer 12 is configured to protrude relative to the outer metallic layers 11 and 13.

    Electrical Contact
    3.
    发明申请
    Electrical Contact 有权
    电气接触

    公开(公告)号:US20150280345A1

    公开(公告)日:2015-10-01

    申请号:US14430557

    申请日:2013-11-27

    IPC分类号: H01R13/24

    摘要: The present invention intends to suppress a contact probe from interfering with a guide plate to produce shavings. The present invention has stacked structure that sandwiches an intermediate metallic layer 12 between outer metallic layers 11 and 13, and includes: a contact part 2 that is brought into abutting with a test object; an elastic deformation part 4 that is elastically deformed so as to be curved in a predetermine curve direction N by compression force in the longer direction; and a fore end part 3 that is formed between the contact part 2 and the elastic deformation part 4 and supported by a through-hole 121 of a guide plate 120 so as to make the contact part 2 movable in the longer direction, in which side surfaces of the fore end part 3 formed in the curve direction N and a direction N′ opposite to the N of the elastic deformation part 4 are configured to include the three metallic layers 11 to 13, and on the side surfaces, the intermediate metallic layer 12 is configured to protrude relative to the outer metallic layers 11 and 13.

    摘要翻译: 本发明旨在抑制接触探针干扰引导板以产生刨花。 本发明具有在外侧金属层11,13之间夹持中间金属层12的层叠结构,具有:与被检体抵接的接触部2; 弹性变形部4,通过长度方向的压缩力弹性变形成预定曲线方向N弯曲; 以及前端部3,其形成在接触部2和弹性变形部4之间,并且由导向板120的通孔121支撑,以使接触部2能够在较长的方向上移动,在该侧 形成在弯曲方向N上的前端部3的表面和与弹性变形部4的N相反的方向N'构成为包括三个金属层11〜13,在侧面,中间金属层 12被配置为相对于外部金属层11和13突出。

    Contact probe
    4.
    发明授权

    公开(公告)号:US09972933B2

    公开(公告)日:2018-05-15

    申请号:US15674541

    申请日:2017-08-11

    IPC分类号: H01R13/24 G01R1/073 G01R1/067

    摘要: The present invention intends to suppress a contact probe from interfering with a guide plate to produce shavings. The present invention has stacked structure that sandwiches an intermediate metallic layer 12 between outer metallic layers 11 and 13, and includes: a contact part 2 that is brought into abutting with a test object; an elastic deformation part 4 that is elastically deformed so as to be curved in a predetermine direction of curvature N by compression force in the longer direction; and a fore end part 3 that is formed between the contact part 2 and the elastic deformation part 4 and supported by a through-hole 121 of a guide plate 120 so as to make the contact part 2 movable in the longer direction, in which side surfaces of the fore end part 3 formed in the direction of curvature N and a direction N′ opposite to the N of the elastic deformation part 4 are configured to include the three metallic layers 11 to 13, and on the side surfaces, the intermediate metallic layer 12 is configured to protrude relative to the outer metallic layers 11 and 13.