公开(公告)号：US20080018354A1

公开(公告)日：2008-01-24

申请号：US11727851

申请日：2007-03-28

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Jae-Sung Park ,  Su-Myung Lee

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Jae-Sung Park ,  Su-Myung Lee

IPC分类号： G01R1/04

CPC分类号： G01R31/2893

摘要： A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.

摘要翻译： 在本发明中公开了一种测试处理器。 测试处理器可以包括其上布置有多个插入件以装载至少一个半导体器件的测试托盘，用于同时打开排列在测试托盘的一部分上的多个插入件的一部分的至少一个开口单元， 以及测试托盘传送装置，用于允许打开单元同时打开在传送测试托盘时排列在测试托盘的另一部分上的多个插入件的其他部分。 因此，尽管要测试的半导体器件改变其尺寸，但是测试处理器的更换部件数量减少，从而降低制造成本和更换工作时间。 本发明的测试处理器减少半导体器件的加载时间，减少干扰，提高教学效率并提高空间利用效率。 此外，测试处理程序可以应用于各种类型的测试器。

公开(公告)号：US07557564B2

公开(公告)日：2009-07-07

申请号：US11727851

申请日：2007-03-28

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Jae-Sung Park ,  Su-Myung Lee

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Jae-Sung Park ,  Su-Myung Lee

IPC分类号： G01R31/26 ,  G01R31/28

CPC分类号： G01R31/2893

摘要： A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.

摘要翻译： 在本发明中公开了一种测试处理器。 测试处理器可以包括其上布置有多个插入件以装载至少一个半导体器件的测试托盘，用于同时打开排列在测试托盘的一部分上的多个插入件的一部分的至少一个开口单元， 以及测试托盘传送装置，用于允许打开单元同时打开在传送测试托盘时排列在测试托盘的另一部分上的多个插入件的其他部分。 因此，尽管要测试的半导体器件改变其尺寸，但是测试处理器的更换部件数量减少，从而降低制造成本和更换工作时间。 本发明的测试处理器减少半导体器件的加载时间，减少干扰，提高教学效率并提高空间利用效率。 此外，测试处理程序可以应用于各种类型的测试器。

公开(公告)号：US08026735B2

公开(公告)日：2011-09-27

申请号：US12368930

申请日：2009-02-10

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Jae-Sung Park ,  Su-Myung Lee

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Jae-Sung Park ,  Su-Myung Lee

IPC分类号： G01R31/26 ,  G01R31/28

CPC分类号： G01R31/2893

摘要： A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.

摘要翻译： 在本发明中公开了一种测试处理器。 测试处理器可以包括其上布置有多个插入件以装载至少一个半导体器件的测试托盘，用于同时打开排列在测试托盘的一部分上的多个插入件的一部分的至少一个开口单元， 以及测试托盘传送装置，用于允许打开单元同时打开在传送测试托盘时排列在测试托盘的另一部分上的多个插入件的其他部分。 因此，尽管要测试的半导体器件改变其尺寸，但是测试处理器的更换部件数量减少，从而降低制造成本和更换工作时间。 本发明的测试处理器减少半导体器件的加载时间，减少干扰，提高教学效率并提高空间利用效率。 此外，测试处理程序可以应用于各种类型的测试器。

公开(公告)号：US08013620B2

公开(公告)日：2011-09-06

申请号：US12634900

申请日：2009-12-10

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Hyun-Jun Yoo

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Hyun-Jun Yoo

IPC分类号： G01R31/00

CPC分类号： G01R31/2893 ,  G01R31/2867

摘要： When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.

摘要翻译： 当测试处理器将用户托盘的半导体器件加载到测试托盘上时，测试处理器调整半导体器件之间的前/后间距或右/左间距，调整右/左节距或前/后间距，以及负载 半导体器件。 测试处理器可以分别顺序地调节半导体器件之间的前/后间距和右/左间距，从而减少设备重量和加载时间。

公开(公告)号：US07656150B2

公开(公告)日：2010-02-02

申请号：US11627276

申请日：2007-01-25

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Hyun-Jun Yoo

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Hyun-Jun Yoo

IPC分类号： G01R31/28

CPC分类号： G01R31/2893 ,  G01R31/2867

摘要： When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.

摘要翻译： 当测试处理器将用户托盘的半导体器件加载到测试托盘上时，测试处理器调整半导体器件之间的前/后间距或右/左间距，调整右/左节距或前/后间距，以及负载 半导体器件。 测试处理器可以分别顺序地调节半导体器件之间的前/后间距和右/左间距，从而减少设备重量和加载时间。

公开(公告)号：US20070182437A1

公开(公告)日：2007-08-09

申请号：US11639418

申请日：2006-12-15

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

IPC分类号： G01R31/26

CPC分类号： G01R31/2867

摘要： A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.

摘要翻译： 公开了一种测试处理程序。 用于改变已经装载了半导体装置的测试盘的姿势的姿势改变单元改变了在浸泡室中的测试托盘的姿势。 当测试托盘的姿势改变时，可以预先加热/预冷装置，从而减少浸泡室长度和预热/预冷时间。

公开(公告)号：US08258804B2

公开(公告)日：2012-09-04

申请号：US12513039

申请日：2007-10-22

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Jung-Woo Hwang

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Jung-Woo Hwang

IPC分类号： G01R31/00

CPC分类号： G01R31/2893

摘要： A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.

摘要翻译： 公开了一种用于测试处理器的测试盘，其装载有半导体器件，然后沿着预定的循环路线携带它们。 测试托盘允许一个固定单元将多个相邻的插入模块固定到框架的接收空间，从而有效地使用框架的空间并且允许相对大量的插入模块安装在相同的区域中 到常规的测试托盘。

公开(公告)号：US07948255B2

公开(公告)日：2011-05-24

申请号：US11997974

申请日：2006-08-14

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku

IPC分类号： G01R31/20 ,  G01R31/00

CPC分类号： H01L21/67745 ,  G01R31/2893 ,  H01L21/67271 ,  H01L21/67778

摘要： A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in the horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices.

摘要翻译： 公开了一种测试处理程序。 测试处理器包括用于传送用户托盘的第一至第三传送，以及适于在水平方向上分别移动第一至第三传送的第一至第三水平移动单元。 第一至第三水平移动单元独立地操作，使得第一至第三传送中的每一个可以独立地执行水平移动。 第一至第三传送中的每一个基于其先前分配的功能执行，从而提高设备的测试处理速度。

公开(公告)号：US07898271B2

公开(公告)日：2011-03-01

申请号：US12385790

申请日：2009-04-20

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

IPC分类号： G01R31/00

CPC分类号： G01R31/2867

摘要： A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.

摘要翻译： 公开了一种测试处理程序。 用于改变已经装载了半导体装置的测试盘的姿势的姿势改变单元改变了在浸泡室中的测试托盘的姿势。 当测试托盘的姿势改变时，可以预先加热/预冷装置，从而减少浸泡室长度和预热/预冷时间。

公开(公告)号：US07538542B2

公开(公告)日：2009-05-26

申请号：US11639418

申请日：2006-12-15

申请人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

发明人： Jae-Gyun Shim ,  Yun-Sung Na ,  In-Gu Jeon ,  Tae-Hung Ku ,  Dong-Han Kim

IPC分类号： G01R31/26

CPC分类号： G01R31/2867

摘要： A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.

摘要翻译： 公开了一种测试处理程序。 用于改变已经装载了半导体装置的测试盘的姿势的姿势改变单元改变了在浸泡室中的测试托盘的姿势。 当测试托盘的姿势改变时，可以预先加热/预冷装置，从而减少浸泡室长度和预热/预冷时间。