AP-MALDI target illumination device and method for using an AP-MALDI target illumination device
    1.
    发明授权
    AP-MALDI target illumination device and method for using an AP-MALDI target illumination device 有权
    AP-MALDI目标照明装置和使用AP-MALDI目标照明装置的方法

    公开(公告)号:US06707039B1

    公开(公告)日:2004-03-16

    申请号:US10246997

    申请日:2002-09-19

    IPC分类号: H01S4900

    CPC分类号: H01J49/164

    摘要: An atmospheric pressure MALDI (AP-MALDI) apparatus and method are disclosed wherein a laser beam is reflected from a surface on an ion transfer interface between an analyte target and a mass analyzer. After reflection, the laser beam irradiates the target, which may be disposed on a target substrate. An embodiment includes using a reflective surface on the interface also for viewing the target and, e.g., by means of signals from a processor, adjusting the relative position of the target substrate and the laser beam. The apparatus can also be operated at pressures that are less than or greater than atmospheric.

    摘要翻译: 公开了一种大气压MALDI(AP-MALDI)装置和方法,其中激光束从分析物靶和质量分析器之间的离子传递界面上的表面反射。 在反射之后,激光束照射可以设置在目标基板上的靶。 实施例包括在接口上还使用反射表面来观察目标,并且例如通过来自处理器的信号,调整目标衬底和激光束的相对位置。 该装置还可以在小于或大于大气压的压力下操作。

    Apparatus and method for ion production enhancement

    公开(公告)号:US07132670B2

    公开(公告)日:2006-11-07

    申请号:US11015190

    申请日:2004-12-16

    IPC分类号: H01J27/00

    CPC分类号: H01J49/164 H01J49/0477

    摘要: The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

    Apparatus and method for ion production enhancement
    3.
    发明申请
    Apparatus and method for ion production enhancement 有权
    用于离子生产增强的装置和方法

    公开(公告)号:US20050274905A1

    公开(公告)日:2005-12-15

    申请号:US11155070

    申请日:2005-06-16

    IPC分类号: H01J27/00 H01J49/16

    摘要: The invention described herein provides a matrix-based ion source including a gas heating device for providing heated gas at a defined temperature to the ionization region of the ion source. The ion source may also include a temperature sensor. The heating device and temperature sensor may be operably connected to work as a closed feedback loop to provide gas at a constant, pre-determined, temperature to the ionization region. Also disclosed is a mass spectrometer system having the matrix-based ion source. A method of producing ions employing gas that is heated to a pre-determined temperature is also provided.

    摘要翻译: 本文描述的本发明提供了一种基于矩阵的离子源,其包括用于在限定的温度下向离子源的电离区域提供加热气体的气体加热装置。 离子源还可以包括温度传感器。 加热装置和温度传感器可以可操作地连接以作为闭合反馈回路工作,以将恒定的预定温度的气体提供给电离区域。 还公开了具有基于基质的离子源的质谱仪系统。 还提供了使用被加热到预定温度的气体产生离子的方法。

    Apparatus and method for ion production enhancement
    4.
    发明授权
    Apparatus and method for ion production enhancement 有权
    用于离子生产增强的装置和方法

    公开(公告)号:US07372043B2

    公开(公告)日:2008-05-13

    申请号:US11155070

    申请日:2005-06-16

    IPC分类号: H01J27/00

    摘要: The invention described herein provides a matrix-based ion source including a gas heating device for providing heated gas at a defined temperature to the ionization region of the ion source. The ion source may also include a temperature sensor. The heating device and temperature sensor may be operably connected to work as a closed feedback loop to provide gas at a constant, pre-determined, temperature to the ionization region. Also disclosed is a mass spectrometer system having the matrix-based ion source. A method of producing ions employing gas that is heated to a pre-determined temperature is also provided.

    摘要翻译: 本文描述的本发明提供了一种基于矩阵的离子源,其包括用于在限定的温度下向离子源的电离区域提供加热气体的气体加热装置。 离子源还可以包括温度传感器。 加热装置和温度传感器可以可操作地连接以作为闭合反馈回路工作,以将恒定的预定温度的气体提供给电离区域。 还公开了具有基于基质的离子源的质谱仪系统。 还提供了使用被加热到预定温度的气体产生离子的方法。

    Apparatus and method for ion production enhancement

    公开(公告)号:US07135689B2

    公开(公告)日:2006-11-14

    申请号:US11041118

    申请日:2005-01-21

    IPC分类号: H01J27/00

    CPC分类号: H01J49/164 H01J49/0477

    摘要: The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

    Apparatus and method for ion production enhancement

    公开(公告)号:US20050161613A1

    公开(公告)日:2005-07-28

    申请号:US11041118

    申请日:2005-01-21

    IPC分类号: H01J49/04 H01J49/16 H01J27/00

    CPC分类号: H01J49/164 H01J49/0477

    摘要: The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

    Apparatus and method for ion production enhancement

    公开(公告)号:US20050077464A1

    公开(公告)日:2005-04-14

    申请号:US10966454

    申请日:2004-10-15

    IPC分类号: H01J49/04 H01J49/16 H01J49/00

    CPC分类号: H01J49/164 H01J49/0477

    摘要: The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

    Apparatus and method for ion production enhancement
    9.
    发明申请
    Apparatus and method for ion production enhancement 有权
    用于离子生产增强的装置和方法

    公开(公告)号:US20050151090A1

    公开(公告)日:2005-07-14

    申请号:US11015190

    申请日:2004-12-16

    IPC分类号: H01J49/04 H01J49/16 H01J27/00

    CPC分类号: H01J49/164 H01J49/0477

    摘要: The present invention relates to an apparatus and method for use with a mass spectrometer. The ion enhancement system of the present invention is used to direct a heated gas toward ions produced by a matrix based ion source and detected by a detector. The ion enhancement system is interposed between the ion source and the detector. The analyte ions that contact the heated gas are enhanced and an increased number of ions are more easily detected by a detector. The method of the invention comprises producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the enhanced analyte ions with a detector.

    摘要翻译: 本发明涉及一种与质谱仪一起使用的装置和方法。 本发明的离子增强系统用于将加热气体引导到由基于基质的离子源产生的离子并由检测器检测。 离子增强系统介于离子源和检测器之间。 接触加热气体的分析物离子增强,并且更多的离子更容易被检测器检测。 本发明的方法包括从基于基质的离子源产生分析物离子,用离子增强系统增强分析物离子并用检测器检测增强的分析物离子。

    Apparatus and method for ion production enhancement
    10.
    发明授权
    Apparatus and method for ion production enhancement 有权
    用于离子生产增强的装置和方法

    公开(公告)号:US06825462B2

    公开(公告)日:2004-11-30

    申请号:US10080879

    申请日:2002-02-22

    IPC分类号: H01J4904

    CPC分类号: H01J49/164 H01J49/0477

    摘要: An apparatus and method for use with a mass spectrometer, in which an ion enhancement system directs a heated gas to heat ions produced by a matrix based ion source and detected by a detector of the mass spectrometer. The ion enhancement system is interposed between the ion source and the detector of the mass spectrometer. The analyte ions that contact the heated gas are enhanced to increase the number and/or intensity of ions detected by the detector of the mass spectrometer. The method includes producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the analyte ions with the detector of the mass spectrometer.

    摘要翻译: 一种与质谱仪一起使用的装置和方法,其中离子增强系统引导加热的气体以加热由基于基质的离子源产生的离子并由质谱仪的检测器检测。 离子增强系统介于离子源和质谱仪的检测器之间。 与被加热的气体接触的分析物离子被增强以增加由质谱仪的检测器检测到的离子的数量和/或强度。 该方法包括从基于基质的离子源产生分析物离子,用离子增强系统增强分析物离子并用质谱仪的检测器检测分析物离子。