公开(公告)号：US20130001948A1

公开(公告)日：2013-01-03

申请号：US13468218

申请日：2012-05-10

Applicant: Chan-Sun LIM ,  Myeong-Hyo KIM ,  Jong-Sub SHIN ,  Young-Chang SHON ,  Jeong-Hun LEE

Inventor： Chan-Sun LIM ,  Myeong-Hyo KIM ,  Jong-Sub SHIN ,  Young-Chang SHON ,  Jeong-Hun LEE

IPC: H02K7/18 ,  F02C6/02 ,  F02C6/16 ,  F15B1/033 ,  F02C1/04

CPC classification number: F02C7/08 ,  F02C6/16 ,  Y02E60/15

Abstract: A power generation system includes a compression unit which compresses a gas, a storage which stores the compressed gas output from the compression unit, a first expansion unit which generates first power and outputs a first exhaust gas, a heating unit which heats at least the stored gas output from the storage, a second expansion unit which generates second power and outputs a second exhaust gas, a first regenerator which performs a first heat exchange between the second exhaust gas and the stored gas output from the storage, to generate a first heat exchange gas used to generate the first power and a first regenerator gas, and a second regenerator which performs a second heat exchange between the first exhaust gas and the first regenerator gas to generate a second heat exchange gas used to generate the second power after heated at the heating unit.

Abstract translation: 发电系统包括压缩气体的压缩单元，存储从压缩单元输出的压缩气体的存储器，产生第一功率并输出第一排气的第一膨胀单元，至少加热存储的加热单元 从存储器输出的气体，产生第二功率并输出第二废气的第二膨胀单元，在第二排气和从储存器输出的储存气体之间进行第一热交换的第一再生器，以产生第一热交换 用于产生第一功率的气体和第一再生器气体;以及第二再生器，其在第一废气和第一再生器气体之间进行第二热交换，以产生用于在第一再生器加热后产生第二功率的第二热交换气体 加热单元

公开(公告)号：US20130114351A1

公开(公告)日：2013-05-09

申请号：US13404446

申请日：2012-02-24

Applicant: Jeong-Hun LEE

Inventor： Jeong-Hun LEE

IPC: G11C29/00 ,  G11C7/10

CPC classification number: G11C29/021 ,  G11C11/40 ,  G11C29/028 ,  G11C29/1201 ,  G11C29/40 ,  G11C29/48

Abstract: A semiconductor device includes a data storage unit configured to receive input data, outputs the input data with a difference in voltage level between logic levels, and output comparison data whose logic level is distinguished from the input data; a test operation unit configured to determine a logic level of test data periodically in response to a data reference voltage whose voltage level is determined in response to a level test code during a test operation period defined by a test entry command and a test exit command, and generate a test result signal by comparing a logic level of the comparison data with the logic level of the test data; and a test operation sensing signal generation unit configured to generate a test operation sensing signal that is activated in response to the test entry command and inactivated in response to the test result signal.

Abstract translation: 半导体器件包括：数据存储单元，被配置为接收输入数据，输出具有逻辑电平之间的电压电平差的输入数据，以及逻辑电平与输入数据区分的输出比较数据; 测试操作单元，被配置为响应于在由测试输入命令和测试退出命令所定义的测试操作期间响应于电平测试代码确定其电压电平的数据参考电压周期性地确定测试数据的逻辑电平， 并通过将比较数据的逻辑电平与测试数据的逻辑电平进行比较来产生测试结果信号; 以及测试操作感测信号生成单元，被配置为生成响应于测试输入命令被激活并且响应于测试结果信号而被去激活的测试操作感测信号。