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1.发明授权Method and apparatus for inspecting and integrated circuit by measuring voltage on a signal line 有权通过测量信号线上的电压来检查和集成电路的方法和装置公开(公告)号：US06788089B2
公开(公告)日：2004-09-07
申请号：US09819287
申请日：2001-03-28
IPC分类号： G01R3102
CPC分类号： G01R31/3004
摘要： The method for inspecting an integrated circuit comprising a plurality of sub-circuits includes the determination of the supply current into at least one of the sub-circuits. This supply current is determined, while the other sub-circuits are operational, by measuring the voltage over a segment of the supply line through which this supply current flows. This supply line contains no additional components to facilitate the measuring of the voltage.
摘要翻译： 用于检查包括多个子电路的集成电路的方法包括确定进入至少一个子电路的电源电流。 确定该供电电流，而其他子电路可操作，通过测量该电源电流通过的电源线段上的电压。 该电源线不包含额外的组件，以便于测量电压。
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2.发明授权Method and apparatus for obtaining transfer characteristics of a device under test 失效用于获得被测器件转印特性的方法和装置
公开(公告)号：US6097194A
公开(公告)日：2000-08-01
申请号：US070217
申请日：1998-04-30
IPC分类号： G01R27/28 , G01R23/20 , G01R29/26 , G01R31/28 , G01R31/30 , G01R31/316 , H03M1/00 , H03M1/10 , H03M7/30 , G01R27/00
CPC分类号： H03M1/1095 , G01R31/2839 , G01R31/30 , G01R23/20 , G01R29/26
摘要： The invention relates to a time domain method for obtaining transfer characteristics of a device under test (DUT). The method comprises the steps of applying a sine sweep and a cosine sweep to an input of the DUT, and measuring response signals at an output of the DUT. The sine sweep and cosine sweep together establish a complex input signal, whereby to each instant there is related a particular frequency. Similarly, the respective response signals together establish a complex response signal. The magnitudes and phases of both complex signals are calculated and the transfer characteristics of the DUT then follow from the magnitude ratio and the phase difference of the input signal and the response signal. The invention also relates to an arrangement for testing transfer characteristics of a DUT and to an integrated circuit comprising the necessary elements for testing a subcircuit contained therein.
摘要翻译： 本发明涉及一种用于获得被测设备（DUT）的传输特性的时域方法。 该方法包括以下步骤：向DUT的输入端施加正弦扫描和余弦扫描，以及在DUT的输出处测量响应信号。 正弦扫描和余弦扫描一起建立一个复杂的输入信号，从而在每一瞬间都有一个特定的频率。 类似地，各个响应信号一起建立复响应信号。 计算两个复信号的幅度和相位，然后DUT的传输特性遵循输入信号和响应信号的幅度比和相位差。 本发明还涉及用于测试DUT的传输特性和集成电路的装置，该集成电路包括用于测试其中包含的子电路的必要元件。
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3.发明授权Method for inspecting an integrated circuit by measuring a voltage drop in a supply line of sub-circuit thereof 失效通过测量其子电路的电源线中的电压降来检查集成电路的方法公开(公告)号：US06239604B1
公开(公告)日：2001-05-29
申请号：US08859592
申请日：1997-05-20
IPC分类号： G01R3128
CPC分类号： G01R31/3004
摘要： A method for inspecting an integrated circuit having a plurality of sub-circuits includes the determination of the supply current into at least one of the sub-circuits. This supply current is determined, while the other sub-circuits are operational, by measuring the voltage over a segment of the supply line through which this supply current flows. This supply line contains no additional components to facilitate the measuring of the voltage.
摘要翻译： 用于检查具有多个子电路的集成电路的方法包括确定至少一个子电路中的供电电流。 确定该供电电流，而其他子电路可操作，通过测量该电源电流通过的电源线段上的电压。 该电源线不包含额外的组件，以便于测量电压。
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