公开(公告)号：US07969173B2

公开(公告)日：2011-06-28

申请号：US11977134

申请日：2007-10-23

Applicant: John Dunklee

Inventor： John Dunklee

IPC: G01R31/00

CPC classification number: H01L21/68785 ,  G01R31/2887 ,  Y10T279/11 ,  Y10T279/35

Abstract: A chuck for a probe station.

Abstract translation: 用于探针台的卡盘。

公开(公告)号：US07514915B2

公开(公告)日：2009-04-07

申请号：US11977052

申请日：2007-10-23

Applicant: John Dunklee

Inventor： John Dunklee

IPC: G01R31/02

CPC classification number: H01L21/68785 ,  G01R31/2887 ,  Y10T279/11 ,  Y10T279/35

Abstract: A chuck for a probe station.

公开(公告)号：US07352168B2

公开(公告)日：2008-04-01

申请号：US11204910

申请日：2005-08-15

Applicant: John Dunklee

Inventor： John Dunklee

IPC: G01R31/02

CPC classification number: H01L21/68785 ,  G01R31/2887 ,  Y10T279/11 ,  Y10T279/35

Abstract: A chuck for a probe station.

Abstract translation: 用于探针台的卡盘。

公开(公告)号：US20080054885A1

公开(公告)日：2008-03-06

申请号：US11977130

申请日：2007-10-23

Applicant: John Dunklee

Inventor： John Dunklee

IPC: G01R31/28 ,  B23B31/30 ,  G01R31/02

CPC classification number: H01L21/68785 ,  G01R31/2887 ,  Y10T279/11 ,  Y10T279/35

Abstract: A chuck for a probe station.

公开(公告)号：US20070247178A1

公开(公告)日：2007-10-25

申请号：US11820518

申请日：2007-06-20

Applicant: John Dunklee ,  Clarence Cowan

Inventor： John Dunklee ,  Clarence Cowan

IPC: G01R31/02

CPC classification number: G01R31/2851 ,  G01R31/2886 ,  G01R31/2887

Abstract: A probe assembly suitable for high-current measurements of an electrical device.

Abstract translation: 适用于电气设备的高电流测量的探头组件。

公开(公告)号：US07250779B2

公开(公告)日：2007-07-31

申请号：US10672655

申请日：2003-09-25

Applicant: John Dunklee ,  Clarence E. Cowan

Inventor： John Dunklee ,  Clarence E. Cowan

IPC: G01R31/02 ,  G01R31/28

CPC classification number: G01R31/2851 ,  G01R31/2886 ,  G01R31/2887

Abstract: A probe assembly suitable for making test measurements using test signals having high currents. The disclosed probe assembly provides for a test signal exhibiting relatively low inductance when compared to existing probe assemblies by preferably reducing the electrical path distance between the test instrumentation and the electrical device being tested.

Abstract translation: 探针组件，适用于使用具有高电流的测试信号进行测试测量。 所公开的探针组件提供了与现有探针组件相比显示相对较低电感的测试信号，优选地减小测试仪器和被测电气设备之间的电路径距离。

公开(公告)号：US07221146B2

公开(公告)日：2007-05-22

申请号：US11035543

申请日：2005-01-14

Applicant: John Dunklee ,  Greg Norgden ,  C. Eugene Cowan

Inventor： John Dunklee ,  Greg Norgden ,  C. Eugene Cowan

IPC: G01R31/28

CPC classification number: G01R31/2862 ,  G01R1/18 ,  G01R31/2865 ,  G01R31/2886

Abstract: A probe station with an improved guarding structure.

Abstract translation: 具有改进的防护结构的探测台。

公开(公告)号：US20070075716A1

公开(公告)日：2007-04-05

申请号：US11607398

申请日：2006-12-01

Applicant: K. Gleason ,  Tim Lesher ,  Eric Strid ,  Mike Andrews ,  John Martin ,  John Dunklee ,  Leonard Hayden ,  Amr Safwat

Inventor： K. Gleason ,  Tim Lesher ,  Eric Strid ,  Mike Andrews ,  John Martin ,  John Dunklee ,  Leonard Hayden ,  Amr Safwat

IPC: G01R31/02

CPC classification number: G01R1/06772 ,  G01R1/06711 ,  G01R1/06755 ,  G01R1/06777

Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

公开(公告)号：US20050179427A1

公开(公告)日：2005-08-18

申请号：US11083677

申请日：2005-03-16

Applicant: Greg Nordgren ,  John Dunklee

Inventor： Greg Nordgren ,  John Dunklee

IPC: H01L21/66 ,  G01R31/28 ,  H01L21/68 ,  G01R31/02

CPC classification number: G01R31/2886 ,  G01R31/2887 ,  Y10T279/29

Abstract: A probe station for testing a wafer.

Abstract translation: 用于测试晶圆的探测台。

公开(公告)号：US07876115B2

公开(公告)日：2011-01-25

申请号：US12378648

申请日：2009-02-17

Applicant: Craig Stewart ,  Anthony Lord ,  Jeff Spencer ,  Terry Burcham ,  Peter McCann ,  Rod Jones ,  John Dunklee ,  Tim Lesher ,  David Newton

Inventor： Craig Stewart ,  Anthony Lord ,  Jeff Spencer ,  Terry Burcham ,  Peter McCann ,  Rod Jones ,  John Dunklee ,  Tim Lesher ,  David Newton

IPC: G01R31/02 ,  G01R31/00

CPC classification number: G01R31/2887

Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck. The chuck includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.

Abstract translation: 卡盘包括在卡盘上的位置接触被测设备的导电元件。 卡盘包括用于支撑被测器件的上表面和贯穿卡盘延伸到卡盘上表面的导电元件。 导电元件与卡盘的上表面电绝缘，并与由卡盘支撑的任何被测器件电接触。