摘要:
State change transition times of a semiconductor memory device is reduced by reducing contact resistance associated with unshared input/output (I/O) lines. To minimize the difference in transition times between shared I/O lines having dual precharging circuits and non-shared I/O lines which have only a single precharging circuit, effective contact resistance of the non-shared I/O lines are reduced by eliminating unnecessary isolation gates with their attendant impedances. This provides faster transition times for the non-shared I/O lines.
摘要:
A mobile System on Chip (SoC) comprises a microprocessor and a first memory controller configured to control a refresh of a first memory. A temperature sensor detects a temperature in the first memory. When first temperature information received from the temperature sensor indicates that the detected temperature deviates from a predetermined temperature range, the first memory controller controls the first memory so as not to perform a self refresh. When second temperature information received from the temperature sensor indicates that the detected temperature is in the predetermined temperature range, the first memory controller outputs a self refresh command to the first memory.
摘要:
A mobile System on Chip (SoC) comprises a microprocessor and a first memory controller configured to control a refresh of a first memory. A temperature sensor detects a temperature in the first memory. When first temperature information received from the temperature sensor indicates that the detected temperature deviates from a predetermined temperature range, the first memory controller controls the first memory so as not to perform a self refresh. When second temperature information received from the temperature sensor indicates that the detected temperature is in the predetermined temperature range, the first memory controller outputs a self refresh command to the first memory.
摘要:
A semiconductor memory device comprises a memory array including a plurality of bit lines and a plurality of dummy bit lines, a bias application unit configured to supply bias voltages having a plurality of voltage levels to the plurality of dummy bit lines, a standby current measuring unit configured to measure a value of at least one of standby currents between at least one of the plurality of bit lines and at least one of the plurality of dummy bit lines. Each of the standby currents is generated by each of the bias voltages applied by the bias application unit.
摘要:
A semiconductor memory device comprises a memory array including a plurality of bit lines and a plurality of dummy bit lines, a bias application unit configured to supply bias voltages having a plurality of voltage levels to the plurality of dummy bit lines, a standby current measuring unit configured to measure a value of at least one of standby currents between at least one of the plurality of bit lines and at least one of the plurality of dummy bit lines. Each of the standby currents is generated by each of the bias voltages applied by the bias application unit.
摘要:
A semiconductor device includes a bit line, a complementary bit line, a sense amplifier configured to sense and amplify a voltage difference between the bit line and the complementary bit line, and a capacitance adjusting circuit configured to adjust a load capacitance of the complementary bit line in response to a plurality of control signals.
摘要:
A semiconductor memory device includes a memory core unit including a memory cell array including a plurality of memory cells and a sense amplifier to sense and amplify data of the plurality of memory cells, and a self refresh control unit to apply at least one first core voltage to the memory core unit and to control a self refresh operation to be performed at every first self refresh cycle, in a first self refresh mode, and to apply at least one second core voltage to the memory core unit and to control the self refresh operation to be performed at every second self refresh cycle, in a second self refresh mode. In the semiconductor memory, a level of the at least one first core voltage is higher than that of a corresponding one of the at least one second core voltage, and the first self refresh cycle is shorter than the second self refresh cycle.
摘要:
A semiconductor device includes a bit line, a complementary bit line, a sense amplifier configured to sense and amplify a voltage difference between the bit line and the complementary bit line, and a capacitance adjusting circuit configured to adjust a load capacitance of the complementary bit line in response to a plurality of control signals.
摘要:
A semiconductor memory device includes a memory core unit including a memory cell array including a plurality of memory cells and a sense amplifier to sense and amplify data of the plurality of memory cells, and a self refresh control unit to apply at least one first core voltage to the memory core unit and to control a self refresh operation to be performed at every first self refresh cycle, in a first self refresh mode, and to apply at least one second core voltage to the memory core unit and to control the self refresh operation to be performed at every second self refresh cycle, in a second self refresh mode. In the semiconductor memory, a level of the at least one first core voltage is higher than that of a corresponding one of the at least one second core voltage, and the first self refresh cycle is shorter than the second self refresh cycle.