METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A SOLAR CELL
    1.
    发明申请
    METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A SOLAR CELL 审中-公开
    形成与太阳能电池临时接触的方法和装置

    公开(公告)号:US20100045265A1

    公开(公告)日:2010-02-25

    申请号:US12541530

    申请日:2009-08-14

    摘要: In a method and devices for forming a temporary electrical contact to a solar cell for testing purposes, probes form a contact to the electrode terminals of a solar cell held by a sample holder. The probes are held by a probe holder and exhibit an elastic, electrically conductive contact element and at least one reference sensor. In order to form a contact, the solar cell and the probes are positioned in relation to each other, and then a probe is placed on an electrode terminal of the solar cell. To this end, a feed motion of the probe is carried out until a reference sensor of the probe generates a reference signal upon reaching a predefined distance. Then the feed motion is continued by a predefined path that goes beyond the contact element making contact with the electrode terminal, in order to carry out an overtravel.

    摘要翻译: 在用于形成用于测试目的的太阳能电池的临时电接触的方法和装置中,探针与由样品架保持的太阳能电池的电极端子形成接触。 探头由探头支架保持并且展现弹性的导电接触元件和至少一个基准传感器。 为了形成接触,太阳能电池和探针相对于彼此定位,然后将探针放置在太阳能电池的电极端子上。 为此,执行探针的进给运动,直到探针的参考传感器在达到预定距离后产生参考信号。 然后,通过超过接触元件与电极端子接触的预定路径继续进给运动,以便执行超程。

    PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL
    2.
    发明申请
    PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL 审中-公开
    太阳能电池电气接触探头

    公开(公告)号:US20100045264A1

    公开(公告)日:2010-02-25

    申请号:US12539177

    申请日:2009-08-11

    IPC分类号: G01R1/06

    摘要: A probe for temporarily electrically contacting a solar cell for testing purposes, has at least one elastic, electrically conductive contact element for producing the electrical contact, at least one reference sensor for indicating a distance of the contact element to an external reference surface using an electrical signal of the reference sensor, and a mounting plane to which the tip of the contact element is oriented. The probe ensures a secure electrical contact of the solar cell in a testing station with minimal mechanical stress, and is also suitable for use in an industrial continuous production method.

    摘要翻译: 用于临时电接触用于测试目的的太阳能电池的探针具有用于产生电接触的至少一个弹性导电接触元件,至少一个参考传感器,用于使用电气指示接触元件到外部参考表面的距离 参考传感器的信号,以及接触元件的尖端被定向到的安装平面。 该探头确保太阳能电池在测试台中的机械应力极小的电气接触,并且也适用于工业连续生产方法。

    CHUCK WITH TRIAXIAL CONSTRUCTION
    3.
    发明申请
    CHUCK WITH TRIAXIAL CONSTRUCTION 有权
    三叉岔结构

    公开(公告)号:US20080224426A1

    公开(公告)日:2008-09-18

    申请号:US12048323

    申请日:2008-03-14

    IPC分类号: B23B31/12

    摘要: A chuck with triaxial construction comprises a receiving surface for a test substrate and arranged below the receiving surface: an electrically conductive first surface element, an electrically conductive second surface element electrically insulated therefrom, and an electrically conductive third surface element electrically insulated therefrom, and, between the first and the second surface element, a first insulation element and, between the second and the third surface element, a second insulation element. A chuck for very low current measurements which can be used to prevent the occurrence of leakage currents and a triboelectric charge and which is configured favourably in terms of production, is achieved because at least one of the electrically conductive surface elements is mechanically connected to at least one insulation element and has an elasticity that compensates for an expansion difference resulting from differences in different coefficients of expansion between a respective surface element and an adjoining insulation element.

    摘要翻译: 具有三轴结构的卡盘包括用于测试基板的接收表面并且布置在接收表面下方:导电的第一表面元件,与其电绝缘的导电的第二表面元件和与其电绝缘的导电的第三表面元件, 在第一和第二表面元件之间,第一绝缘元件和第二和第三表面元件之间的第二绝缘元件。 实现了用于非常低的电流测量的卡盘,其可用于防止泄漏电流和摩擦电荷的发生,并且在生产方面被有利地配置,这是因为至少一个导电表面元件至少机械地连接到 一个绝缘元件并且具有补偿由相应的表面元件和相邻绝缘元件之间的不同膨胀系数的差异引起的膨胀差的弹性。

    PROBE STATION FOR ON-WAFER-MEASUREMENT UNDER EMI-SHIELDING
    4.
    发明申请
    PROBE STATION FOR ON-WAFER-MEASUREMENT UNDER EMI-SHIELDING 有权
    探测器在EMI屏蔽下进行测量

    公开(公告)号:US20110227602A1

    公开(公告)日:2011-09-22

    申请号:US12818442

    申请日:2010-06-18

    IPC分类号: G01R31/26

    CPC分类号: G01R31/2886 G01R1/18

    摘要: An arrangement is provided for testing DUTs with a chuck that has a support surface for supporting of a DUT as well as for supplying the support surface with a defined potential, or for connecting the DUT. The arrangement further includes a positioning device for positioning the chuck as well as an electromagnetic shielding housing enclosing at least the chuck. Inside the housing and adjacent to the chuck, a signal preamplifier is arranged whose signal port facing the chuck is electrically connected with the support surface, wherein the signal preamplifier is moveable together with the chuck by the positioning device in a way that it holds its position constant relative to the chuck during positioning. The signal preamplifier is connected to a measurement unit outside of the housing via a measurement cable.

    摘要翻译: 提供了一种用于使用具有用于支撑DUT的支撑表面以及用于向支撑表面提供限定电位或用于连接DUT的卡盘来测试DUT的布置。 该装置还包括用于定位卡盘的定位装置以及至少包围卡盘的电磁屏蔽壳体。 在壳体内部和卡盘附近,布置了一个信号前置放大器,其信号端口面向卡盘与支撑表面电连接,其中信号前置放大器可以通过定位装置与卡盘一起移动,使其保持其位置 在定位期间相对于卡盘是恒定的。 信号前置放大器通过测量电缆连接到壳体外部的测量单元。