公开(公告)号：US20120287792A1

公开(公告)日：2012-11-15

申请号：US13103892

申请日：2011-05-09

申请人： Joshua G. Nickel ,  Fernando Urioste ,  Justin Gregg ,  Adil Syed ,  Jason Sloey ,  Jonathan Haylock

发明人： Joshua G. Nickel ,  Fernando Urioste ,  Justin Gregg ,  Adil Syed ,  Jason Sloey ,  Jonathan Haylock

IPC分类号： H04L12/26 ,  G01R31/02

CPC分类号： G01R1/06772 ,  G01R31/2822 ,  H04B17/0085 ,  H04B17/12 ,  H04B17/16

摘要： Wireless electronic devices may include wireless communications circuitry such as a transceiver, antenna, and other wireless circuitry. The transceiver may be coupled to the antenna through a bidirectional switch connector. The switch connector may mate with a corresponding radio-frequency test probe that is connected to radio-frequency test equipment. When the test probe is mated with the switch connector, the transceiver may be decoupled from the antenna. During transceiver testing, radio-frequency test signals may be conveyed between the test unit and the transceiver using the test probe. During antenna testing, radio-frequency test signals may be conveyed between the test unit and the antenna using the test probe. Transceiver testing and antenna testing may, if desired, be conducted in parallel using the test probe.

摘要翻译： 无线电子设备可以包括无线通信电路，例如收发器，天线和其他无线电路。 收发器可以通过双向开关连接器耦合到天线。 开关连接器可以与连接到射频测试设备的相应的射频测试探头配合使用。 当测试探针与开关连接器配合时，收发器可以与天线分离。 在收发器测试期间，可以使用测试探针在测试单元和收发器之间传送射频测试信号。 在天线测试期间，可以使用测试探针在测试单元和天线之间传送射频测试信号。 如果需要，收发器测试和天线测试可以使用测试探头并行进行。

公开(公告)号：US09157930B2

公开(公告)日：2015-10-13

申请号：US13103892

申请日：2011-05-09

申请人： Joshua G. Nickel ,  Fernando Urioste ,  Justin Gregg ,  Adil Syed ,  Jason Sloey ,  Jonathan Haylock

发明人： Joshua G. Nickel ,  Fernando Urioste ,  Justin Gregg ,  Adil Syed ,  Jason Sloey ,  Jonathan Haylock

IPC分类号： G01R31/302 ,  G01R1/067 ,  G01R31/28 ,  H04B17/00 ,  H04B17/12 ,  H04B17/16

CPC分类号： G01R1/06772 ,  G01R31/2822 ,  H04B17/0085 ,  H04B17/12 ,  H04B17/16

摘要： Wireless electronic devices may include wireless communications circuitry such as a transceiver, antenna, and other wireless circuitry. The transceiver may be coupled to the antenna through a bidirectional switch connector. The switch connector may mate with a corresponding radio-frequency test probe that is connected to radio-frequency test equipment. When the test probe is mated with the switch connector, the transceiver may be decoupled from the antenna. During transceiver testing, radio-frequency test signals may be conveyed between the test unit and the transceiver using the test probe. During antenna testing, radio-frequency test signals may be conveyed between the test unit and the antenna using the test probe. Transceiver testing and antenna testing may, if desired, be conducted in parallel using the test probe.

摘要翻译： 无线电子设备可以包括无线通信电路，例如收发器，天线和其他无线电路。 收发器可以通过双向开关连接器耦合到天线。 开关连接器可以与连接到射频测试设备的相应的射频测试探头配合使用。 当测试探针与开关连接器配合时，收发器可以与天线分离。 在收发器测试期间，可以使用测试探针在测试单元和收发器之间传送射频测试信号。 在天线测试期间，可以使用测试探针在测试单元和天线之间传送射频测试信号。 如果需要，收发器测试和天线测试可以使用测试探头并行进行。

公开(公告)号：US08587335B2

公开(公告)日：2013-11-19

申请号：US13163242

申请日：2011-06-17

申请人： Justin Gregg ,  Joshua G. Nickel

发明人： Justin Gregg ,  Joshua G. Nickel

IPC分类号： G01R31/00 ,  G01R31/28

CPC分类号： G01R31/2822

摘要： Wireless electronic devices may include a transceiver, an antenna resonating element coupled to the transceiver via a transmission line path, transceiver and antenna impedance matching circuits, and other circuitry. The transceiver and the impedance matching circuits may be formed on a first substrate. The antenna resonating element may be formed using a second substrate. The antenna resonating element may be decoupled from the first substrate during testing. First and second sets of test points may be formed at first and second locations long the transmission line path. During testing, a test probe may mate with the first set of test points, whereas an impedance adjustment circuit that serves to electrically isolate the antenna impedance matching circuit from the transceiver may mate with the second set of test points. The impedance adjustment circuit need not be used if the antenna impedance matching circuit is decoupled from the transceiver during testing.

摘要翻译： 无线电子设备可以包括收发器，经由传输线路径耦合到收发器的天线谐振元件，收发器和天线阻抗匹配电路以及其它电路。 收发器和阻抗匹配电路可以形成在第一衬底上。 天线谐振元件可以使用第二基板形成。 天线谐振元件可以在测试期间与第一基板分离。 第一和第二组测试点可以在传输线路径的第一和第二位置处形成。 在测试期间，测试探针可与第一组测试点配合，而用于将天线阻抗匹配电路与收发器电隔离的阻抗调节电路可与第二组测试点相配合。 如果在测试期间天线阻抗匹配电路与收发器解耦，则不需要使用阻抗调节电路。

公开(公告)号：US20120319697A1

公开(公告)日：2012-12-20

申请号：US13163242

申请日：2011-06-17

申请人： Justin Gregg ,  Joshua G. Nickel

发明人： Justin Gregg ,  Joshua G. Nickel

IPC分类号： G01R31/28

CPC分类号： G01R31/2822

摘要： Wireless electronic devices may include a transceiver, an antenna resonating element coupled to the transceiver via a transmission line path, transceiver and antenna impedance matching circuits, and other circuitry. The transceiver and the impedance matching circuits may be formed on a first substrate. The antenna resonating element may be formed using a second substrate. The antenna resonating element may be decoupled from the first substrate during testing. First and second sets of test points may be formed at first and second locations long the transmission line path. During testing, a test probe may mate with the first set of test points, whereas an impedance adjustment circuit that serves to electrically isolate the antenna impedance matching circuit from the transceiver may mate with the second set of test points. The impedance adjustment circuit need not be used if the antenna impedance matching circuit is decoupled from the transceiver during testing.

摘要翻译： 无线电子设备可以包括收发器，经由传输线路径耦合到收发器的天线谐振元件，收发器和天线阻抗匹配电路以及其它电路。 收发器和阻抗匹配电路可以形成在第一衬底上。 天线谐振元件可以使用第二基板形成。 天线谐振元件可以在测试期间与第一基板分离。 第一和第二组测试点可以在传输线路径的第一和第二位置处形成。 在测试期间，测试探针可与第一组测试点配合，而用于将天线阻抗匹配电路与收发器电隔离的阻抗调节电路可与第二组测试点相配合。 如果在测试期间天线阻抗匹配电路与收发器解耦，则不需要使用阻抗调节电路。

公开(公告)号：US08903326B2

公开(公告)日：2014-12-02

申请号：US13018348

申请日：2011-01-31

申请人： Justin Gregg ,  Adil Syed ,  Vishwanath Venkataraman

发明人： Justin Gregg ,  Adil Syed ,  Vishwanath Venkataraman

IPC分类号： H04B17/00 ,  H04W24/06 ,  H04L12/26

CPC分类号： H04W24/06 ,  H04L43/0882 ,  H04L43/50

摘要： A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during production testing. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a conducted arrangement through a radio-frequency signal splitter circuit or using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast initialization downlink signals. The multiple DUTs may synchronize with the initialing downlink signals. The signal generator may broadcast test downlink signals at a target output power level. The multiple DUTs may receive the test downlink signals and compute a corresponding downlink transmission performance level based on the received downlink signals. A given DUT is marked as a passing DUT if the downlink performance level is satisfactory. A given DUT may be retested if the downlink performance level fails design criteria.

摘要翻译： 测试台可以包括测试主机，信号发生器和测试室。 在生产测试期间，可以将多个待测设备（DUT）放置在测试室中。 射频信号可以使用通过射频信号分离器电路的传导装置或使用通过测试室中的天线的辐射装置从信号发生器传送到多个DUT。 信号发生器可以广播初始化下行链路信号。 多个DUT可以与初始化下行链路信号同步。 信号发生器可以以目标输出功率电平广播测试下行链路信号。 多个DUT可以接收测试下行链路信号，并且基于所接收的下行链路信号来计算相应的下行链路传输性能等级。 如果下行链路性能水平令人满意，给定的DUT被标记为通过DUT。 如果下行链路性能级别失败设计标准，则可以重新测试给定的DUT。

公开(公告)号：US20120231744A1

公开(公告)日：2012-09-13

申请号：US13044844

申请日：2011-03-10

申请人： Justin Gregg ,  Adil Syed ,  Tomoki Takeya

发明人： Justin Gregg ,  Adil Syed ,  Tomoki Takeya

IPC分类号： H04B17/00

CPC分类号： H04B17/309 ,  H04B17/29 ,  H04W52/143

摘要： A test station may include a test host, a tester, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the tester to the multiple DUTs using a radiated arrangement through an antenna in the test chamber. The tester may broadcast downlink test signals in parallel to the multiple DUTs. The DUTs may simultaneously synchronize with the downlink test signals and measure radio-frequency performance levels while receiving the downlink test signals. The test host may direct the tester to gradually lower its output power level. The DUTs may be used to determine downlink sensitivity by monitoring the measured radio-frequency performance levels as the output power level of the tester is lowered. Simultaneously downlink sensitivity testing may be performed for multiple modulation schemes and data rates for any communications protocol.

摘要翻译： 测试台可以包括测试主机，测试器和测试室。 在设备表征操作期间，可以将多个被测设备（DUT）放置在测试室中。 射频信号可以使用辐射布置通过测试室中的天线从测试仪传送到多个DUT。 测试者可以并行地向多个DUT广播下行链路测试信号。 DUT可以同时与下行链路测试信号同步并且在接收下行链路测试信号的同时测量射频性能水平。 测试主机可以指示测试仪逐渐降低其输出功率电平。 当测试仪的输出功率电平降低时，DUT可以通过监测测量的射频性能水平来确定下行链路灵敏度。 同时可以针对任何通信协议的多个调制方案和数据速率执行下行链路灵敏度测试。

公开(公告)号：US20120122406A1

公开(公告)日：2012-05-17

申请号：US13018348

申请日：2011-01-31

申请人： Justin Gregg ,  Adil Syed ,  Vishwanath Venkataraman

发明人： Justin Gregg ,  Adil Syed ,  Vishwanath Venkataraman

IPC分类号： H04W24/00

CPC分类号： H04W24/06 ,  H04L43/0882 ,  H04L43/50

摘要： A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during production testing. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a conducted arrangement through a radio-frequency signal splitter circuit or using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast initialization downlink signals. The multiple DUTs may synchronize with the initialing downlink signals. The signal generator may broadcast test downlink signals at a target output power level. The multiple DUTs may receive the test downlink signals and compute a corresponding downlink transmission performance level based on the received downlink signals. A given DUT is marked as a passing DUT if the downlink performance level is satisfactory. A given DUT may be retested if the downlink performance level fails design criteria.

摘要翻译： 测试台可以包括测试主机，信号发生器和测试室。 在生产测试期间，可以将多个待测设备（DUT）放置在测试室中。 射频信号可以使用通过射频信号分离器电路的传导装置或使用通过测试室中的天线的辐射装置从信号发生器传送到多个DUT。 信号发生器可以广播初始化下行链路信号。 多个DUT可以与初始化下行链路信号同步。 信号发生器可以以目标输出功率电平广播测试下行链路信号。 多个DUT可以接收测试下行链路信号，并且基于所接收的下行链路信号来计算相应的下行链路传输性能等级。 如果下行链路性能水平令人满意，给定的DUT被标记为通过DUT。 如果下行链路性能级别失败设计标准，则可以重新测试给定的DUT。

公开(公告)号：US20120231745A1

公开(公告)日：2012-09-13

申请号：US13044857

申请日：2011-03-10

申请人： Justin Gregg ,  Adil Syed ,  Vishwanath Venkataraman

发明人： Justin Gregg ,  Adil Syed ,  Vishwanath Venkataraman

IPC分类号： H04B17/00

CPC分类号： H04B17/309 ,  H04B17/29 ,  H04B17/318 ,  H04W52/143

摘要： A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast downlink test signals. The DUTs may synchronize with the downlink test signals and measure radio-frequency performance levels while receiving the downlink test signals. The test host may direct the signal generator to gradually lower its output power level. The DUTs may be used to determine downlink sensitivity by monitoring the measured radio-frequency performance levels as the output power level of the signal generator is lowered. Downlink sensitivity testing may be performed across any desired radio-frequency bands and channels.

摘要翻译： 测试台可以包括测试主机，信号发生器和测试室。 在设备表征操作期间，可以将多个被测设备（DUT）放置在测试室中。 射频信号可以使用辐射布置通过测试室中的天线从信号发生器传送到多个DUT。 信号发生器可以广播下行链路测试信号。 DUT可以与下行链路测试信号同步，并在接收下行链路测试信号的同时测量射频性能水平。 测试主机可以指示信号发生器逐渐降低其输出功率电平。 当信号发生器的输出功率电平降低时，DUT可以通过监视所测量的射频性能水平来用于确定下行链路灵敏度。 可以在任何期望的射频频带和信道上执行下行链路灵敏度测试。

公开(公告)号：US20110301905A1

公开(公告)日：2011-12-08

申请号：US13011695

申请日：2011-01-21

申请人： Justin Gregg ,  Tomoki Takeya ,  Adil Syed

发明人： Justin Gregg ,  Tomoki Takeya ,  Adil Syed

IPC分类号： G06F19/00

CPC分类号： G01R35/005 ,  G01R27/28 ,  G01R31/2822 ,  G01R31/2837 ,  H04B17/0085 ,  H04B17/14 ,  H04B17/318 ,  H04W24/00 ,  H04W24/06 ,  H04W24/10 ,  H04W28/04

摘要： Calibration equipment for calibrating multiple test stations in a test system is provided. Each test station may include a test unit, a test fixture, and a radio-frequency (RF) cable that connects the test unit to the test fixture. A control test setup may be used to calibrate uplink and downlink characteristics associated with each test station (e.g., to determine path loss associated with the RF cable and test fixture and variations associated with the test unit). The control test setup may calibrate each test station at desired frequencies to generate a test station error (offset) table. The test unit of each test station may be individually configured based on the test station error table so that offset is minimized among the different stations and so that the test stations may reliably measure hundreds or thousands of wireless electronic devices during product testing.

摘要翻译： 提供了用于在测试系统中校准多个测试站的校准设备。 每个测试台可以包括测试单元，测试夹具和将测试单元连接到测试夹具的射频（RF）电缆。 可以使用控制测试设置来校准与每个测试站相关联的上行链路和下行链路特性（例如，确定与RF电缆和测试夹具相关联的路径损耗以及与测试单元相关联的变化）。 控制测试设置可以以期望的频率校准每个测试站，以产生测试站错误（偏移）表。 每个测试台的测试单元可以基于测试台错误表单独配置，使得不同站之间的偏移最小化，并且使得测试站可以在产品测试期间可靠地测量数百或数千个无线电子设备。

公开(公告)号：US08600311B2

公开(公告)日：2013-12-03

申请号：US13044857

申请日：2011-03-10

申请人： Justin Gregg ,  Adil Syed ,  Vishwanath Venkataraman

发明人： Justin Gregg ,  Adil Syed ,  Vishwanath Venkataraman

IPC分类号： H04B17/00

CPC分类号： H04B17/309 ,  H04B17/29 ,  H04B17/318 ,  H04W52/143

摘要： A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast downlink test signals. The DUTs may synchronize with the downlink test signals and measure radio-frequency performance levels while receiving the downlink test signals. The test host may direct the signal generator to gradually lower its output power level. The DUTs may be used to determine downlink sensitivity by monitoring the measured radio-frequency performance levels as the output power level of the signal generator is lowered. Downlink sensitivity testing may be performed across any desired radio-frequency bands and channels.

摘要翻译： 测试台可以包括测试主机，信号发生器和测试室。 在设备表征操作期间，可以将多个被测设备（DUT）放置在测试室中。 射频信号可以使用辐射布置通过测试室中的天线从信号发生器传送到多个DUT。 信号发生器可以广播下行链路测试信号。 DUT可以与下行链路测试信号同步，并在接收下行链路测试信号的同时测量射频性能水平。 测试主机可以指示信号发生器逐渐降低其输出功率电平。 当信号发生器的输出功率电平降低时，DUT可以通过监视所测量的射频性能水平来用于确定下行链路灵敏度。 可以在任何期望的射频频带和信道上执行下行链路灵敏度测试。