摘要:
Wireless electronic devices may include wireless communications circuitry such as a transceiver, antenna, and other wireless circuitry. The transceiver may be coupled to the antenna through a bidirectional switch connector. The switch connector may mate with a corresponding radio-frequency test probe that is connected to radio-frequency test equipment. When the test probe is mated with the switch connector, the transceiver may be decoupled from the antenna. During transceiver testing, radio-frequency test signals may be conveyed between the test unit and the transceiver using the test probe. During antenna testing, radio-frequency test signals may be conveyed between the test unit and the antenna using the test probe. Transceiver testing and antenna testing may, if desired, be conducted in parallel using the test probe.
摘要:
Electrical devices may be tested using test equipment. A device may have an associated cable with a connector. The test equipment may have an associated cable with a connector. An adapter may have a pair of connectors. One of the adapter connectors may be connected to the connector of the cable associated with the device and the other of the adapter connectors may be connected to the connector of the cable that is associated with the tester. A retention clip may be attached to a groove in the adapter. Flexible members in the clip may each grasp an opposing side of the adapter within the groove. A retention member in the clip may bear against the connector on the cable that is associated with the device to hold the connectors for the device cable and the adapter together.
摘要:
Wireless electronic devices may include wireless communications circuitry such as a transceiver, antenna, and other wireless circuitry. The transceiver may be coupled to the antenna through a bidirectional switch connector. The switch connector may mate with a corresponding radio-frequency test probe that is connected to radio-frequency test equipment. When the test probe is mated with the switch connector, the transceiver may be decoupled from the antenna. During transceiver testing, radio-frequency test signals may be conveyed between the test unit and the transceiver using the test probe. During antenna testing, radio-frequency test signals may be conveyed between the test unit and the antenna using the test probe. Transceiver testing and antenna testing may, if desired, be conducted in parallel using the test probe.
摘要:
Electrical devices may be tested using test equipment. A device may have an associated cable with a connector. The test equipment may have an associated cable with a connector. An adapter may have a pair of connectors. One of the adapter connectors may be connected to the connector of the cable associated with the device and the other of the adapter connectors may be connected to the connector of the cable that is associated with the tester. A retention clip may be attached to a groove in the adapter. Flexible members in the clip may each grasp an opposing side of the adapter within the groove. A retention member in the clip may bear against the connector on the cable that is associated with the device to hold the connectors for the device cable and the adapter together.
摘要:
A test system for testing a device under test (DUT) is provided. The test system may include a DUT receiving structure configured to receive the DUT during testing and a DUT retention structure that is configured to press the DUT against the DUT receiving structure so that DUT cannot inadvertently shift around during testing. The DUT retention structure may include a pressure sensor operable to detect an amount of pressure that is applied to the DUT. The DUT retention structure may be raised and lowered vertically using a manually-controlled or a computer-controlled positioner. The positioner may be adjusted using a coarse tuning knob and a fine tuning knob. The positioner may be calibrated such that the DUT retention structure applies a sufficient amount of pressure on the DUT during production testing.
摘要:
A wireless electronic device may contain at least one antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test station may be used to measure the radio-frequency characteristics associated with the tuning element. The test station may provide adjustable temperature, power, and impedance control to help emulate a true application environment for the tuning element without having to place the tuning element within an actual device during testing. The test system may include at least one signal generator and a tester for measuring harmonic distortion values and may include at least two signal generators and a tester for measuring intermodulation distortion values. During testing, the antenna tuning element may be placed in a series or shunt configuration.
摘要:
Electronic devices may be provided that contain wireless communications circuitry. The wireless communications circuitry may include radio-frequency transceiver circuitry and antenna structures. The antenna structures may form an antenna having first and second feeds at different locations. The transceiver circuit may have a first circuit that handles communications using the first feed and may have a second circuit that handles communications using the second feed. A first filter may be interposed between the first feed and the first circuit and a second filter may be interposed between the second feed and the second circuit. The first and second filters and the antenna may be configured so that the first circuit can use the first feed without being adversely affected by the presence of the second feed and so that the second circuit can use the second feed without being adversely affected by the presence of the first feed.
摘要:
Electronic devices may be provided that contain wireless communications circuitry. The wireless communications circuitry may include radio-frequency transceiver circuitry and antennas. An antenna may be formed from an antenna resonating element arm and an antenna ground. The antenna resonating element arm may have a shorter portion that resonates at higher communications band frequencies and a longer portion that resonates at lower communications band frequencies. A short circuit branch may be coupled between the shorter portion of the antenna resonating element arm and the antenna ground. A series-connected inductor and switch may be coupled between the longer portion of the antenna resonating element arm and the antenna ground. An antenna feed branch may be coupled between the antenna resonating element arm and the antenna ground at a location that is between the short circuit branch and the series-connected inductor and switch.
摘要:
Wireless electronic devices include wireless communications circuitry such as transceiver circuitry coupled to an antenna resonating element. The transceiver circuitry and the antenna element may be formed on first and second substrates, respectively. In compact wireless devices, transceiver and antenna matching circuits may be formed on the first substrate. During production testing, a radio-frequency test probe with integrated matching circuitry may be used to mate with a corresponding contact point on the first substrate. The integrated matching circuitry may include resistors, capacitors, and inductors soldered in desired series-parallel configurations within the test probe. When the test probe is mated to the contact point on the first substrate, a test unit connected to the test probe may be used to perform radio-frequency measurements to determine whether the transceiver circuitry satisfies design criteria.
摘要:
Wireless electronic devices may include a transceiver, an antenna resonating element coupled to the transceiver via a transmission line path, transceiver and antenna impedance matching circuits, and other circuitry. The transceiver and the impedance matching circuits may be formed on a first substrate. The antenna resonating element may be formed using a second substrate. The antenna resonating element may be decoupled from the first substrate during testing. First and second sets of test points may be formed at first and second locations long the transmission line path. During testing, a test probe may mate with the first set of test points, whereas an impedance adjustment circuit that serves to electrically isolate the antenna impedance matching circuit from the transceiver may mate with the second set of test points. The impedance adjustment circuit need not be used if the antenna impedance matching circuit is decoupled from the transceiver during testing.