-
公开(公告)号:US12016726B2
公开(公告)日:2024-06-25
申请号:US17326335
申请日:2021-05-21
Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
Inventor: Byung Chul Lee , Shinyong Shim , Dong-Hyun Kang , Hae Youn Kim , Hyung Min Kim , Ki Joo Pahk , Maesoon Im
CPC classification number: A61B8/4494 , A61B8/4488 , A61N7/00 , B06B1/0292 , G01S7/52079 , G01S15/8915 , A61N2007/0052 , B06B2201/76
Abstract: A flexible ultrasound transducer according to an embodiment of the present disclosure includes a substrate having a central part and a plurality of extended parts extending from the central part; an ultrasound probe disposed at the central part of the substrate to acquire an ultrasound image of a region of interest; and a focused ultrasound output unit disposed at the extended parts of the substrate to output a focused ultrasound to the region of interest, wherein the focused ultrasound output unit disposed at the extended parts of the substrate has a flexible property and is deformable. According to the structure of an embodiment, it is possible to simultaneously achieve ultrasound imaging and ultrasonic therapy such as lesion stimulation or removal through focused ultrasound, and adjust the focal position of focused ultrasound or improve the focal sensitivity through flexible movement.
-
公开(公告)号:US11957514B2
公开(公告)日:2024-04-16
申请号:US17273308
申请日:2021-02-01
Applicant: KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY
Inventor: Byung Chul Lee , Dong-Hyun Kang , Shinyong Shim
CPC classification number: A61B8/4483 , A61B8/5207
Abstract: The present disclosure relates to a method for determining a relative position between arrays of a flexible array device. The flexible array device according to an embodiment includes a plurality of arrays arranged at a predetermined interval in a deformable substrate, and the method includes measuring the first capacitance between adjacent arrays, measuring the second capacitance between the adjacent arrays after deformation of the substrate, and determining a relative position between the adjacent arrays based on the first capacitance measurement value and the second capacitance measurement value. According to an embodiment, the relative position between the arrays may be determined by measuring the capacitance between the adjacent arrays of the plurality of arrays arranged in the deformable substrate and measuring a change in capacitance caused by the deformation (contraction, relaxation, bending) of the substrate.
-