摘要:
A layout of a power MOSFET includes a first zigzag gate structure located on a substrate of the power MOSFET and having a first side and a second side, a first contact located on the substrate and at the first side of the first zigzag gate structure, and a second contact structure located on the substrate and at the second side of the first zigzag gate structure.
摘要:
A package structure including a first leadframe, a second leadframe, a power pin, a ground pin, a first pin, several first wires, several second wires, and a package body is disclosed. The first leadframe is used for electrically coupling to the drains of a first power transistor and the second power transistor. The ground pin is electrically coupled to the first leadframe. The first pin is connected with the first leadframe through a conductive region used for increasing the amount of current which can be loaded by the first pin. The first wires are used for electrically coupling between the first leadframe and the source of the second power transistor, for reducing the internal resistance of the second power transistor. The second wires are used for electrically coupling between the ground pin and the source of the first power transistor, for reducing the internal resistance of the first power transistor.
摘要:
A test mode controller comprises an enable signal generator, a control signal generator, and a latch. The enable signal generator receives a power signal and a second control signal, and generates a first enable signal and a second enable signal respectively to the latch and the control signal generator. The control signal generator receives a power indicating voltage and a reference voltage, and generates the first control signal to the latch when the first enable signal is enabled. The latch receives the first control signal, and generates the second control signal according to the first control signal when the second enable signal is enabled. The second control signal controls a chip to operate in a test mode or a normal mode. Accordingly, the test mode controller may reduce the test time without a test pin, and may also reduce the chip area and the package cost.
摘要:
A circuit apparatus includes an input end, an output end, an enable module, a first function module and a second function module. The enable module couples to the input end for receiving an input voltage and outputs an enable signal while the input voltage falls within a first voltage scope. The first function module couples to the enable module and the output end, and performs a test mode according to the enable signal so as to output a test result to the output end. The second function module couples to the input end for receiving the input voltage via the input end and performs a standard mode while the input voltage falls within a second voltage scope.
摘要:
A packaging structure comprises a first leadframe, a second leadframe, two grounding pins, two first pins, a plurality of first wires, a plurality of second wires, and a package body. The second leadframe is coupled to the drains of a first power transistor and a second power transistor. The two grounding pins are adjacent together and coupled to the first leadframe. The two first pins are coupled to the source of the second power transistor. The two first pins are connected together through a conductive region for increasing capability of loading current. The plurality of first wires is coupled between the source of the second power transistor and the first pin to decrease the internal resistance of the second power transistor. The plurality of second wires is coupled between the first leadframe and the source of the first power transistor to decrease the internal resistance of the first power transistor.
摘要:
A polarity switch circuit for a charger is disclosed. The circuit includes a polarity switch unit and an input control unit. The polarity switch unit includes an input end, an output end, a correct-direction connecting circuit, and a reverse-direction connecting circuit. The correct-direction connecting circuit has a first switch unit and a second switch unit. When the load is plugged correctly, the positive input node is connected to the positive output node by the first switch unit, and the negative input node is connected to the negative output node by the second switch unit. The reverse-direction connecting circuit includes a third switch unit and a fourth switch unit. When the load is plugged reversely, the positive input node is connected to the negative output node by the third switch unit, and the negative input node is connected to the positive output node by the fourth switch unit.
摘要:
A multi-chip module is disclosed to include a pin frame, an electric power switch chip, and a battery protection chip. The pin frame has a chip placement region and six pins. The second pin and the fifth pin are electrically connected at the chip placement region, and the other pins are set electrically isolated from each other. A bottom surface of the electric power switch chip is electrically connected at the chip placement region, and a top surface thereof is electrically connected to the first pin and the third pin. A bottom surface of the battery protection chip is disposed at the top surface of the electric power switch chip in an electrically isolated fashion. A top surface of the battery protection chip is electrically connected to the top surface of the electric power switch chip, the first pin, the fourth pin, and the sixth pin.