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    Method of evaluation using ultrasonic waves
    1.
    发明授权
    Method of evaluation using ultrasonic waves 有权
    超声波评估方法

    公开(公告)号：US08302479B2

    公开(公告)日：2012-11-06

    申请号：US12512388

    申请日：2009-07-30

    申请人： Kaoru Shibata ,  Noriaki Shigematsu ,  Mitsutaka Igaue ,  Yushi Aoki ,  Noriko Kurimoto

    发明人： Kaoru Shibata ,  Noriaki Shigematsu ,  Mitsutaka Igaue ,  Yushi Aoki ,  Noriko Kurimoto

    IPC分类号： G01N29/04

    CPC分类号： B23K11/115 ,  B23K11/3009 ,  B23K11/3063

    摘要： The intensity of first reflected ultrasonic waves reflected from an end of a first electrode tip is measured while the electrode tip is separated from a workpiece. The intensity of second reflected waves reflected from the end of the electrode tip is measured while the electrode tip contacts with the workpiece. Based on the above intensities, an intensity ratio (reflectance) and the fraction of the waves entering the workpiece are determined from the following equations: reflectance=(intensity of second reflected waves)/(intensity of first reflected waves) fraction of waves entering the workpiece=1−reflectance. From a predetermined correlative relationship between a contact area of a region enabling ultrasonic waves to be incident on the workpiece and the determined fraction of the entering waves, a ratio (contact area ratio) is determined between a total area of the region and a contact area of the region contacting with the workpiece.

    摘要翻译： 在将电极头与工件分离的同时测量从第一电极头的端部反射的第一反射超声波的强度。 在电极尖端与工件接触的同时测量从电极尖端的端部反射的第二反射波的强度。 基于上述强度，从以下等式确定强度比（反射率）和进入工件的波的分数：反射率=（第二反射波的强度）/（第一反射波的强度）进入的波的分数 工件= 1反射率。 根据能够使入射到工件上的超声波的区域的接触面积与所确定的入射波次数之间的预定的相关关系，在该区域的总面积和接触面积之间确定比率（接触面积比） 的区域与工件接触。

    METHOD OF EVALUATION USING ULTRASONIC WAVES
    2.
    发明申请
    METHOD OF EVALUATION USING ULTRASONIC WAVES 有权
    使用超声波的评估方法

    公开(公告)号：US20100024558A1

    公开(公告)日：2010-02-04

    申请号：US12512388

    申请日：2009-07-30

    申请人： Kaoru Shibata ,  Noriaki Shigematsu ,  Mitsutaka Igaue ,  Yushi Aoki ,  Noriko Kurimoto

    发明人： Kaoru Shibata ,  Noriaki Shigematsu ,  Mitsutaka Igaue ,  Yushi Aoki ,  Noriko Kurimoto

    IPC分类号： G01N29/04

    CPC分类号： B23K11/115 ,  B23K11/3009 ,  B23K11/3063

    摘要： The intensity of first reflected ultrasonic waves reflected from an end of a first electrode tip is measured while the electrode tip is separated from a workpiece. The intensity of second reflected waves reflected from the end of the electrode tip is measured while the electrode tip contacts with the workpiece. Based on the above intensities, an intensity ratio (reflectance) and the fraction of the waves entering the workpiece are determined from the following equations. reflectance=(intensity of second reflected waves)/(intensity of first reflected waves) fraction of waves entering the workpiece=1−reflectance From a predetermined correlative relationship between a contact area of a region enabling ultrasonic waves to be incident on the workpiece and the determined fraction of the entering waves, a ratio (contact area ratio) is determined between a total area of the region and a contact area of the region contacting with the workpiece.

    摘要翻译： 在将电极头与工件分离的同时测量从第一电极头的端部反射的第一反射超声波的强度。 在电极尖端与工件接触的同时测量从电极尖端的端部反射的第二反射波的强度。 基于上述强度，根据以下等式确定强度比（反射率）和进入工件的波的分数。 反射率=（第二反射波的强度）/（第一反射波的强度）进入工件的波的分数= 1反射率从能够进入工件的超声波的区域的接触面积与 确定入射波的分数，在区域的总面积和与工件接触的区域的接触面积之间确定比率（接触面积比）。

    Spot welding inspecting apparatus
    3.
    发明授权
    Spot welding inspecting apparatus 有权
    点焊检测仪

    公开(公告)号：US07640809B2

    公开(公告)日：2010-01-05

    申请号：US12133708

    申请日：2008-06-05

    申请人： Kaoru Shibata ,  Noriaki Shigematsu ,  Mitsutaka Igaue ,  Noriko Kurimoto

    发明人： Kaoru Shibata ,  Noriaki Shigematsu ,  Mitsutaka Igaue ,  Noriko Kurimoto

    IPC分类号： G01N9/24

    CPC分类号： G01N29/043 ,  B23K11/36 ,  B23K31/12 ,  G01N29/223 ,  G01N2291/2672

    摘要： A spot welding inspecting apparatus is provided with: a gun chip; a signal transmitting part; an ultrasonic sensor; an inner cylinder; a through hole; a partitioning cylinder; a first flow path; a second flow path; and a third flow path.The inner cylinder is inserted to an outer cylinder of spot welding gun and holds the ultrasonic sensor. The through hole is provided on the inner cylinder. The partitioning cylinder surrounds the through hole and is inserted into a gap between the ultrasonic sensor and the outer cylinder. The first flow path is formed between the inner cylinder and the partitioning cylinder by passing the through hole from an inner portion of the inner cylinder. The second flow path is formed at the gun chip to be circulated around a front end of the partitioning cylinder. The third flow path is formed between the outer cylinder and the partitioning cylinder. A cooling agent flows in an order of the first flow path, the second flow path and the third flow path.

    摘要翻译： 点焊检查装置设有：枪片; 信号发送部; 超声波传感器 内筒 一个通孔; 分隔圆筒; 第一流路; 第二流路; 和第三流路。 将内筒插入到点焊枪的外筒内并保持超声波传感器。 通孔设置在内筒上。 分隔圆筒围绕通孔并插入到超声波传感器和外筒之间的间隙中。 第一流路通过从内筒的内部通过通孔而形成在内筒和分隔筒之间。 第二流路形成在喷枪芯片周围围绕分隔圆筒的前端。 第三流路形成在外筒与分隔筒之间。 冷却剂按照第一流路，第二流路和第三流路的顺序流动。

    Spot welding inspecting apparatus
    4.
    发明申请
    Spot welding inspecting apparatus 有权
    点焊检测仪

    公开(公告)号：US20090031812A1

    公开(公告)日：2009-02-05

    申请号：US12133708

    申请日：2008-06-05

    申请人： Kaoru Shibata ,  Noriaki Shigematsu ,  Mitsutaka Igaue ,  Noriko Kurimoto

    发明人： Kaoru Shibata ,  Noriaki Shigematsu ,  Mitsutaka Igaue ,  Noriko Kurimoto

    IPC分类号： G01N29/00

    CPC分类号： G01N29/043 ,  B23K11/36 ,  B23K31/12 ,  G01N29/223 ,  G01N2291/2672

    摘要： A spot welding inspecting apparatus is provided with: a gun chip; a signal transmitting part; an ultrasonic sensor; an inner cylinder; a through hole; a partitioning cylinder; a first flow path; a second flow path; and a third flow path.The inner cylinder is inserted to an outer cylinder of spot welding gun and holds the ultrasonic sensor. The through hole is provided on the inner cylinder. The partitioning cylinder surrounds the through hole and is inserted into a gap between the ultrasonic sensor and the outer cylinder. The first flow path is formed between the inner cylinder and the partitioning cylinder by passing the through hole from an inner portion of the inner cylinder. The second flow path is formed at the gun chip to be circulated around a front end of the partitioning cylinder. The third flow path is formed between the outer cylinder and the partitioning cylinder. A cooling agent flows in an order of the first flow path, the second flow path and the third flow path.

    摘要翻译： 点焊检查装置设有：枪片; 信号发送部; 超声波传感器; 内筒 一个通孔; 分隔圆筒; 第一流路; 第二流路; 和第三流路。 将内筒插入到点焊枪的外筒内并保持超声波传感器。 通孔设置在内筒上。 分隔圆筒围绕通孔并插入到超声波传感器和外筒之间的间隙中。 第一流路通过从内筒的内部通过通孔而形成在内筒和分隔筒之间。 第二流路形成在喷枪芯片周围围绕分隔圆筒的前端。 第三流路形成在外筒与分隔筒之间。 冷却剂按照第一流路，第二流路和第三流路的顺序流动。

    IMAGING APPARATUS, IMAGING METHOD, AND IMAGING PROGRAM
    5.
    发明申请
    IMAGING APPARATUS, IMAGING METHOD, AND IMAGING PROGRAM 审中-公开
    成像设备，成像方法和成像程序

    公开(公告)号：US20110266416A1

    公开(公告)日：2011-11-03

    申请号：US13096210

    申请日：2011-04-28

    申请人： Noriko Kurimoto ,  Yosuke Hiruma ,  Kaoru Shibata ,  Noriaki Shigematsu

    发明人： Noriko Kurimoto ,  Yosuke Hiruma ,  Kaoru Shibata ,  Noriaki Shigematsu

    IPC分类号： H01L27/146

    CPC分类号： H04N5/349 ,  H04N5/2254

    摘要： An imaging operation is executed by partially shielding, from incident light coming from a subject, a photodetecting element (A(m, n)) including a photodetecting surface (P(m, n)) having a prescribed area and adapted to generate output values corresponding to light quantities received by the photodetecting surface, acquiring output values from the photodetecting element in each of a plurality of states in which different portions of the photodetecting element are shielded, and calculating a pixel information corresponding to a light quantity received by a region that is smaller than the photodetecting surface of the photodetecting element based on differences between the output values acquired in the plurality of states.

    摘要翻译： 通过对来自被摄体的入射光进行部分屏蔽来执行成像操作，所述光检测元件（A（m，n））包括具有规定区域的受光面（P（m，n）），并且适于产生输出值 对应于由光检测面接收的光量，在受光元件的不同部分被屏蔽的多个状态中的每一个状态下从受光元件获取输出值，并且计算与由所述受光元件的不同部分所接收的光量接收的光量对应的像素信息， 基于在多个状态中获取的输出值之间的差异，小于光电检测元件的光电检测表面。