公开(公告)号：US07742565B2

公开(公告)日：2010-06-22

申请号：US12249209

申请日：2008-10-10

申请人： Kazuyasu Kawabe

发明人： Kazuyasu Kawabe

IPC分类号： G01T1/36

CPC分类号： G01N23/2252 ,  H01J2237/22 ,  H01J2237/2561

摘要： A method for precisely measuring and displaying the whole profile of an X-ray spectral waveform, which rises from a background level and finally returns to the background level after passing across a peak. X-rays are counted for a time interval of to at a spectral position, resulting in X-ray N counts not containing statistical fluctuations. A standard deviation Eo representing a variation accompanying the N counts is given by Sqrt(N). Where the variation is greater than a given magnitude (tolerance error Er for display) at a spectral position where the X-ray intensity is high, X-rays are counted for a time interval of tm longer than the time interval to, producing increased counts Nm.

摘要翻译： 一种用于精确测量和显示从背景水平上升并最终在经过峰值后返回到背景水平的X射线谱波形的整体轮廓的方法。 X射线被计数在光谱位置处的时间间隔，导致不包含统计波动的X射线N计数。 表示伴随N个计数的变化的标准偏差Eo由Sqrt（N）给出。 在X射线强度高的光谱位置上的变化大于给定量值（显示的容差误差Er）的情况下，对时间间隔tm进行X射线的计数，比时间间隔长，从而产生增加的计数 Nm。

公开(公告)号：US07864922B2

公开(公告)日：2011-01-04

申请号：US11514689

申请日：2006-09-01

申请人： Kazuyasu Kawabe

发明人： Kazuyasu Kawabe

IPC分类号： G21K1/06

CPC分类号： H01J37/252 ,  G01N23/2252 ,  G21K1/06 ,  G21K2201/062 ,  G21K2201/064 ,  G21K2201/067 ,  H01J37/244 ,  H01J2237/24425

摘要： An X-ray spectrometer which uses at least one curved analyzing crystal and which provides improved wavelength resolution of characteristic X-rays used for analysis and improved ratio of characteristic X-rays to background intensity by using only effective diffractive regions of the analyzing crystal. X-ray blocking plates upstand from an end of a crystal support member supporting the analyzing crystal in the direction of angular dispersion of the crystal toward the inside of a Rowland circle. Incident X-rays going from the point X-ray source toward the crystal and X-rays diffracted by the crystal toward an X-ray detector are partially blocked by the X-ray blocking plates. The shielded regions vary according to the incident angle θ of the incident X-rays. Optimum or nearly optimum effective regions of the surface of the crystal can be used at all times.

摘要翻译： 使用至少一个弯曲分析晶体的X射线光谱仪，其通过仅使用分析晶体的有效衍射区域提供用于分析的特征X射线的改进的波长分辨率和特征X射线与背景强度的比率。 X射线阻挡板从支撑分析晶体的晶体支撑构件的端部朝向Rowland圆的内部朝向晶体的角度分散方向立起。 从X射线源向晶体射出X射线，X射线检测器衍射的X射线被X射线阻挡板部分遮挡。 屏蔽区域根据入射角度而变化; 的事件X射线。 可以随时使用晶体表面的最佳或接近最佳的有效区域。

公开(公告)号：US4988872A

公开(公告)日：1991-01-29

申请号：US386416

申请日：1989-07-27

申请人： Yoshitaka Nagatsuka ,  Masayuki Ohtsuki ,  Masaki Saito ,  Koji Yoshida ,  Kazuyasu Kawabe

发明人： Yoshitaka Nagatsuka ,  Masayuki Ohtsuki ,  Masaki Saito ,  Koji Yoshida ,  Kazuyasu Kawabe

IPC分类号： G01N23/225 ,  G01Q30/02 ,  G01Q30/04 ,  G01Q60/00

CPC分类号： G01N23/2252

摘要： An electron probe microanalyzer equipped with a wavelength-dispersive x-ray spectrometer and also with an energy-dispersive x-ray spectrometer. X-rays emanating from the same sample region are detected by these two spectrometers, and spectra are created from the detected x-rays. Cursors which can be moved at will are superimposed on the spectra. One of the cursors is moved in relation to the other. That is, when one cursor is moved into the position of a desired wavelength or energy, the other is moved into the position of the corresponding energy or wavelength. The use of the cursors enables one to precisely and easily find the existence of a certain element in the sample region from the spectra obtained by the two x-ray spectrometers.

摘要翻译： 配有波长色散X射线光谱仪的电子探针微量分析仪，以及能量色散X射线光谱仪。 通过这两个光谱仪检测从相同样品区发出的X射线，并从检测到的X射线产生光谱。 可以随意移动的光标叠加在光谱上。 其中一个游标相对于另一个移动。 也就是说，当一个光标移动到所需波长或能量的位置时，另一个光标移动到相应能量或波长的位置。 使用光标使得能够从两个x射线光谱仪获得的光谱中精确和容易地发现样品区域中某一元素的存在。

公开(公告)号：US20100284513A1

公开(公告)日：2010-11-11

申请号：US11514689

申请日：2006-09-01

申请人： Kazuyasu Kawabe

发明人： Kazuyasu Kawabe

IPC分类号： G01T1/36

CPC分类号： H01J37/252 ,  G01N23/2252 ,  G21K1/06 ,  G21K2201/062 ,  G21K2201/064 ,  G21K2201/067 ,  H01J37/244 ,  H01J2237/24425

摘要： An X-ray spectrometer which uses at least one curved analyzing crystal and which provides improved wavelength resolution of characteristic X-rays used for analysis and improved ratio of characteristic X-rays to background intensity by using only effective diffractive regions of the analyzing crystal. X-ray blocking plates upstand from an end of a crystal support member supporting the analyzing crystal in the direction of angular dispersion of the crystal toward the inside of a Rowland circle. Incident X-rays going from the point X-ray source toward the crystal and X-rays diffracted by the crystal toward an X-ray detector are partially blocked by the X-ray blocking plates. The shielded regions vary according to the incident angle θ of the incident X-rays. Optimum or nearly optimum effective regions of the surface of the crystal can be used at all times.

摘要翻译： 使用至少一个弯曲分析晶体的X射线光谱仪，其通过仅使用分析晶体的有效衍射区域提供用于分析的特征X射线的改进的波长分辨率和特征X射线与背景强度的比率。 X射线阻挡板从支撑分析晶体的晶体支撑构件的端部朝向Rowland圆的内部朝向晶体的角度分散方向立起。 从X射线源向晶体射出X射线，X射线检测器衍射的X射线被X射线阻挡板部分遮挡。 屏蔽区域根据入射角度而变化; 的事件X射线。 可以随时使用晶体表面的最佳或接近最佳的有效区域。