CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME
    1.
    发明申请
    CHARGED PARTICLE BEAM APPARATUS, AND METHOD OF CONTROLLING THE SAME 有权
    充电颗粒光束装置及其控制方法

    公开(公告)号:US20130063029A1

    公开(公告)日:2013-03-14

    申请号:US13666119

    申请日:2012-11-01

    IPC分类号: H01J19/70 H01J19/82

    摘要: Provided is a charged particle beam apparatus, which can emit a stable electron beam, having high brightness and a narrow energy width. The charged particle beam apparatus comprises a field emission electron source, electrodes for applying an electric field to the field emission electron source, and a vacuum exhaust unit for keeping the pressure around the field emission electron source at 1×10−8 Pa or less. The apparatus is so constituted as to use such one of the electron beams emitted as has an electron-beam-center radiation angle of 1×10−2sr or less, and to use the electric current thereof, the second order differentiation of which is negative or zero with respect to the time, and which reduces at a rate of 10% or less per hour. The charged particle beam apparatus further comprises a heating unit for the field emission electron source, and a detection unit for the electric current of the electron beam. The field emission electron source is repeatedly heated to keep the electric current of the electron beam to be emitted, at a predetermined value or higher.

    摘要翻译: 提供一种带电粒子束装置,其能够发射具有高亮度和窄能量宽度的稳定电子束。 带电粒子束装置包括场发射电子源,用于向场发射电子源施加电场的电极和用于将场致发射电子源周围的压力保持在1×10 -8 Pa以下的真空排气单元。 该装置构成为使用发射的电子束中心辐射角为1×10-2sr以下的电子束,并使用其电流,其二阶微分为负 或相对于时间为零,并以每小时10%或更少的速率减少。 带电粒子束装置还包括用于场发射电子源的加热单元和用于电子束电流的检测单元。 重复加热场致发射电子源以使电子束的电流保持在规定值以上。