Abstract:
Various examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beam spot on a test item; a grid detector configured to receive x-rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with a beam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the material.
Abstract:
A method, system, and sensor for air flow sensing. The system can include a cantilever, a transducer, and a processing module. The method can include measuring beam deflections of one or more cantilevers, extracting information about air flow, and determining one or more of an airspeed, an angle of attack, and a sideslip, based on extracted information. The system and method can exploit nonlinearities in the behavior of the cantilever in fluid flow.