Method for performing burn-in test
    1.
    发明授权
    Method for performing burn-in test 有权
    执行老化测试的方法

    公开(公告)号:US08384405B2

    公开(公告)日:2013-02-26

    申请号:US13090902

    申请日:2011-04-20

    IPC分类号: G01R31/308

    摘要: A method of the invention for performing burn-in test includes assembling, on a fixture stand, a plurality of light source elements and a plurality of light detectors for monitoring a light output from a corresponding one of the plurality of light source elements; and electrifying the plurality of light source elements in a state where at least the plurality of light source elements and the plurality of light detectors are immersed in an insulation liquid. Thereby, it is realized to hold a stable temperature in a short period of time, to maintain a temperature that does not deviate from normal load conditions, and to perform a sorting test between defect parts and good part for light source unit chips without causing damage to the elements.

    摘要翻译: 本发明的用于执行老化测试的方法包括在固定台上组装多个光源元件和多个光检测器,用于监测来自多个光源元件中的相应一个光源元件的光输出; 以及至少将所述多个光源元件和所述多个光检测器浸入绝缘液体的状态使所述多个光源元件通电。 由此,实现了在短时间内保持稳定的温度,保持不偏离正常负载条件的温度,并对光源单元芯片的缺陷部分和良好部分进行分类测试而不会造成损坏 到元素

    METHOD FOR PERFORMING BURN-IN TEST
    2.
    发明申请
    METHOD FOR PERFORMING BURN-IN TEST 有权
    执行烧结测试的方法

    公开(公告)号:US20120269047A1

    公开(公告)日:2012-10-25

    申请号:US13090902

    申请日:2011-04-20

    IPC分类号: G11B11/00

    摘要: A method of the invention for performing burn-in test includes assembling, on a fixture stand, a plurality of light source elements and a plurality of light detectors for monitoring a light output from a corresponding one of the plurality of light source elements; and electrifying the plurality of light source elements in a state where at least the plurality of light source elements and the plurality of light detectors are immersed in an insulation liquid. Thereby, it is realized to hold a stable temperature in a short period of time, to maintain a temperature that does not deviate from normal load conditions, and to perform a sorting test between defect parts and good part for light source unit chips without causing damage to the elements.

    摘要翻译: 本发明的用于执行老化测试的方法包括在固定台上组装多个光源元件和多个光检测器,用于监测来自多个光源元件中的相应一个光源元件的光输出; 以及至少将所述多个光源元件和所述多个光检测器浸入绝缘液体的状态使所述多个光源元件通电。 由此,实现了在短时间内保持稳定的温度,保持不偏离正常负载条件的温度,并对光源单元芯片的缺陷部分和良好部分进行分类测试而不会造成损坏 到元素

    Method for manufacturing thermally-assisted magnetic recording head comprising light source unit and slider
    3.
    发明授权
    Method for manufacturing thermally-assisted magnetic recording head comprising light source unit and slider 有权
    包括光源单元和滑块的制造热辅助磁记录头的方法

    公开(公告)号:US08248897B2

    公开(公告)日:2012-08-21

    申请号:US12899101

    申请日:2010-10-06

    IPC分类号: G11B11/00

    摘要: A method for manufacturing a thermally-assisted magnetic recording head is provided, in which a light source unit including a light source and a slider including an optical system are bonded. A unit substrate is made of a material transmitting light having a predetermined wavelength, and a unit adhesion material layer that contains Sn, Sn alloy, Pb alloy or Bi alloy is formed on the light source unit and/or the slider. The manufacturing method includes: aligning the light source unit and the slider in such a way that a light from the light source can enter the optical system and the unit adhesion material layer is sandwiched therebetween; and causing a light including the predetermined wavelength to enter the unit substrate to melt the unit adhesion material layer. The unit adhesion material layer melted by the light including the predetermined wavelength can ensure high alignment accuracy as well as higher bonding strength and less change with time.

    摘要翻译: 提供了一种用于制造热辅助磁记录头的方法,其中包括光源和包括光学系统的滑块的光源单元被结合。 单位基板由透射具有预定波长的光的材料制成,并且在光源单元和/或滑块上形成包含Sn,Sn合金,Pb合金或Bi合金的单位粘附材料层。 该制造方法包括:使光源单元和滑块对准,使得来自光源的光能够进入光学系统,并且单元粘合材料层夹在其间; 并使包含所述预定波长的光进入所述单元基板以熔化所述单元粘合材料层。 由包含预定波长的光熔化的单元粘合材料层可以确保高对准精度以及更高的粘合强度和较小的随时间的变化。

    Light source unit for thermally-assisted magnetic recording capable of monitoring of light output
    4.
    发明授权
    Light source unit for thermally-assisted magnetic recording capable of monitoring of light output 有权
    用于热辅助磁记录的光源单元,能够监测光输出

    公开(公告)号:US08149653B2

    公开(公告)日:2012-04-03

    申请号:US12728510

    申请日:2010-03-22

    IPC分类号: G11B11/00

    摘要: Provided is a light source unit that is to be joined to a slider to form a thermally-assisted magnetic recording head. The light source unit comprises: a unit substrate having a source-installation surface; a light source provided in the source-installation surface and emitting thermal-assist light; and a photodetector bonded to a rear joining surface of the unit substrate in such a manner that a rear light-emission center of the light source is covered with a light-receiving surface of the photodetector. The photodetector can be sufficiently close to the light source; thus, constant feedback adjustment with high efficiency for the light output of the light source can be performed. This adjustment enables light output from the light source to be controlled in response to changes in light output due to surroundings and to changes with time to stabilize the intensity of light with which a magnetic recording medium is irradiated.

    摘要翻译: 提供一种光源单元,其被连接到滑块以形成热辅助磁记录头。 光源单元包括:具有源安装表面的单元基板; 光源,设置在源安装表面中并发射热辅助光; 以及光电检测器,其以使得光源的后发光中心被光电检测器的光接收表面覆盖的方式结合到单元基板的后接合表面。 光电检测器可以足够靠近光源; 因此,可以执行用于光源的光输出的高效率的恒定反馈调整。 该调整使得能够响应于由于周围环境导致的光输出的变化而控制来自光源的光输出,并且随着时间的变化来稳定照射磁记录介质的光的强度。

    Method of burn-in testing for thermally assisted head
    6.
    发明授权
    Method of burn-in testing for thermally assisted head 有权
    热辅助头的老化测试方法

    公开(公告)号:US08509036B2

    公开(公告)日:2013-08-13

    申请号:US12964168

    申请日:2010-12-09

    IPC分类号: G11B11/00 G11B5/127 G01R31/00

    摘要: A plurality of laser diode units is tested in a bar state, each of the laser diode units in which a laser diode that includes a first electrode and a second electrode formed on surfaces facing each other and that is mounted on a mounting surface of a submount such that the first electrode faces the mounting surface of the submount. The method includes preparing a bar in which mounting areas each of which includes the laser diode unit formed thereon and dicing margins for separating the bar into the separate laser diode units are alternatively aligned along a longitudinal direction wherein a first pad electrically connected with the first electrode of the laser diode is disposed on the mounting surface of each of the mounting areas of the submounts and a second pad electrically connected to the first pad of either one of the mounting areas that are adjacent to the dicing margin is disposed on the mounting surface of each of the dicing margins of the submounts: contacting sheet-shaped probes to the second electrode and the second pad at a slantwise angle with respect to the second electrode and the second pad, and pressing the probes to the second electrode and the second pad while deforming the probes; and providing a potential difference between the second electrode and the second pad through the probes so that the laser diode emits laser light.

    摘要翻译: 在棒状态下测试多个激光二极管单元,每个激光二极管单元中包括形成在彼此面对并且安装在基座的安装表面上的第一电极和第二电极的激光二极管 使得第一电极面向基座的安装表面。 该方法包括准备一个条,其中每个包括形成在其上的激光二极管单元的安装区域和用于将条分离成单独的激光二极管单元的切割边缘沿纵向方向排列,其中第一焊盘与第一电极电连接 激光二极管的安装面设置在基座的每个安装区域的安装表面上,并且电连接到与切割边缘相邻的安装区域中的任一个的第一焊盘的第二焊盘设置在 底座的每个切割边缘:将片状探针以相对于第二电极和第二焊盘倾斜角度的方式接触第二电极和第二焊盘,并将探针按压到第二电极和第二焊盘,同时 使探头变形; 并且通过探针在第二电极和第二焊盘之间提供电位差,使得激光二极管发射激光。

    METHOD OF BURN-IN TESTING FOR THERMALLY ASSISTED HEAD
    7.
    发明申请
    METHOD OF BURN-IN TESTING FOR THERMALLY ASSISTED HEAD 有权
    热辅助头部测试方法

    公开(公告)号:US20120147717A1

    公开(公告)日:2012-06-14

    申请号:US12964168

    申请日:2010-12-09

    摘要: A plurality of laser diode units is tested in a bar state, each of the laser diode units in which a laser diode that includes a first electrode and a second electrode formed on surfaces facing each other and that is mounted on a mounting surface of a submount such that the first electrode faces the mounting surface of the submount. The method includes preparing a bar in which mounting areas each of which includes the laser diode unit formed thereon and dicing margins for separating the bar into the separate laser diode units are alternatively aligned along a longitudinal direction wherein a first pad electrically connected with the first electrode of the laser diode is disposed on the mounting surface of each of the mounting areas of the submounts and a second pad electrically connected to the first pad of either one of the mounting areas that are adjacent to the dicing margin is disposed on the mounting surface of each of the dicing margins of the submounts: contacting sheet-shaped probes to the second electrode and the second pad at a slantwise angle with respect to the second electrode and the second pad, and pressing the probes to the second electrode and the second pad while deforming the probes; and providing a potential difference between the second electrode and the second pad through the probes so that the laser diode emits laser light.

    摘要翻译: 在棒状态下测试多个激光二极管单元,每个激光二极管单元中包括形成在彼此面对并且安装在基座的安装表面上的第一电极和第二电极的激光二极管 使得第一电极面向基座的安装表面。 该方法包括准备一个条,其中每个包括形成在其上的激光二极管单元的安装区域和用于将条分离成单独的激光二极管单元的切割边缘沿纵向方向排列,其中第一焊盘与第一电极电连接 激光二极管的安装面设置在基座的每个安装区域的安装表面上,并且电连接到与切割边缘相邻的安装区域中的任一个的第一焊盘的第二焊盘设置在 底座的每个切割边缘:将片状探针以相对于第二电极和第二焊盘倾斜角度的方式接触第二电极和第二焊盘,并将探针按压到第二电极和第二焊盘,同时 使探头变形; 并且通过探针在第二电极和第二焊盘之间提供电位差,使得激光二极管发射激光。

    Method for performing burn-in test
    8.
    发明授权
    Method for performing burn-in test 有权
    执行老化测试的方法

    公开(公告)号:US08957692B2

    公开(公告)日:2015-02-17

    申请号:US12958692

    申请日:2010-12-02

    摘要: Provided is a method for performing a burn-in test on an object under test in which a plurality of electrodes are provided in positions at different heights. The method comprising steps of: preparing an object under test in which an electrode in a higher position have a higher surface roughness among the plurality of electrodes; bringing a plurality of sheet-type probes into contact with the plurality of electrodes, respectively; and supplying an electric current with the plurality of electrodes through the plurality of sheet-type probes. By implementing the method, the sheet-type probes can be kept in stable contact with the electrodes because electrodes in a higher position have a higher surface roughness Ra than electrodes in a lower position. Consequently, stable and reliable burn-in test can be performed.

    摘要翻译: 提供了一种用于对被测物体进行老化测试的方法,其中多个电极设置在不同高度的位置。 该方法包括以下步骤:制备被测物体,其中较高位置的电极在多个电极中具有较高的表面粗糙度; 使多个片式探针分别与多个电极接触; 并且通过所述多个片式探针向所述多个电极提供电流。 通过实施该方法,片状探针可以保持与电极的稳定接触,因为较高位置的电极具有比较低位置的电极更高的表面粗糙度Ra。 因此,可以进行稳定可靠的老化测试。

    Probe assembly for lapping a bar using a patterned probe
    9.
    发明授权
    Probe assembly for lapping a bar using a patterned probe 有权
    用于使用图案化探针研磨棒的探针组件

    公开(公告)号:US07768281B2

    公开(公告)日:2010-08-03

    申请号:US12073174

    申请日:2008-02-29

    IPC分类号: G01R31/02

    摘要: A probe assembly used to lap a bar, the bar being provided with elements that are to be formed into sliders, is provided. The probe assembly comprises an elastically deflectable probe, and a stopper for applying bending deformation to the probe so as to cause first bending deflection at a leading end of the probe and for maintaining the first bending deflection of the leading end while preventing a bending deformation at the leading end from becoming smaller than the first bending deflection. The leading end of the probe is adapted to be subjected to second bending deflection that is larger than the first bending deflection in a same direction as a direction of the first bending deflection and thereby to abut against an electrode pad to establish electrical connection between the probe and the electrode pad, the electrode pad being provided on a surface of the bar other than a surface to be lapped.

    摘要翻译: 提供了一种用于搭接杆的探针组件,该杆设置有要形成滑块的元件。 探针组件包括可弹性偏转的探针和用于向探针施加弯曲变形的止动件,以便在探针的前端引起第一弯曲偏转,并且用于保持前端的第一弯曲偏转,同时防止弯曲变形 前端从小于第一弯曲偏转。 探针的前端适于在与第一弯曲偏转的方向相同的方向上经受大于第一弯曲偏转的第二弯曲偏转,从而抵靠电极焊盘以在探针之间建立电连接 和电极焊盘,电极焊盘设置在除了要研磨的表面之外的杆的表面上。

    Probe assembly for lapping bar using patterned probe
    10.
    发明申请
    Probe assembly for lapping bar using patterned probe 有权
    使用图案探针的研磨棒的探针组件

    公开(公告)号:US20080223155A1

    公开(公告)日:2008-09-18

    申请号:US12073174

    申请日:2008-02-29

    IPC分类号: G01D21/00

    摘要: A probe assembly used to lap a bar, the bar being provided with elements that are to be formed into sliders, is provided. The probe assembly comprises an elastically deflectable probe, and a stopper for applying bending deformation to the probe so as to cause first bending deflection at a leading end of the probe and for maintaining the first bending deflection of the leading end while preventing a bending deformation at the leading end from becoming smaller than the first bending deflection. The leading end of the probe is adapted to be subjected to second bending deflection that is larger than the first bending deflection in a same direction as a direction of the first bending deflection and thereby to abut against an electrode pad to establish electrical connection between the probe and the electrode pad, the electrode pad being provided on a surface of the bar other than a surface to be lapped.

    摘要翻译: 提供了一种用于搭接杆的探针组件,该杆设置有要形成滑块的元件。 探针组件包括可弹性偏转的探针和用于向探针施加弯曲变形的止动件,以便在探针的前端引起第一弯曲偏转,并且用于保持前端的第一弯曲偏转,同时防止弯曲变形 前端从小于第一弯曲偏转。 探针的前端适于在与第一弯曲偏转的方向相同的方向上经受大于第一弯曲偏转的第二弯曲偏转,从而抵靠电极焊盘以在探针之间建立电连接 和电极焊盘,电极焊盘设置在除了要研磨的表面之外的杆的表面上。