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    Polishing apparatus and method
    1.
    发明申请
    Polishing apparatus and method 审中-公开
    抛光设备和方法

    公开(公告)号：US20060205327A1

    公开(公告)日：2006-09-14

    申请号：US11369652

    申请日：2006-03-07

    申请人： Kuo-Cheng Huang ,  Jung-Ru Yu ,  Ching-Hsiang Kuo

    发明人： Kuo-Cheng Huang ,  Jung-Ru Yu ,  Ching-Hsiang Kuo

    IPC分类号： B24B7/30 ,  B24B29/00

    CPC分类号： B24B13/01 ,  B24B29/02

    摘要： The present invention provides a polishing apparatus and a polishing method, which are particular for the non-spherical lens. The polishing apparatus includes a base for carrying an object; and a polishing head, wherein the polishing head has a polishing layer made of a resin, a diamond and a graphite for polishing the object; a buffer layer connected to the polishing layer for the polishing head to tilt and shift; and a shaft connected to the buffer layer.

    摘要翻译： 本发明提供一种特别用于非球面透镜的抛光装置和抛光方法。 抛光装置包括用于承载物体的基座; 以及研磨头，其中所述抛光头具有由树脂制成的抛光层，用于抛光所述物体的金刚石和石墨; 连接到用于抛光头的抛光层倾斜和移位的缓冲层; 和连接到缓冲层的轴。

    Lens measuring method and device for determining decenter and tilt of the lens
    2.
    发明申请
    Lens measuring method and device for determining decenter and tilt of the lens 失效
    用于确定透镜的倾斜和倾斜的透镜测量方法和装置

    公开(公告)号：US20070201037A1

    公开(公告)日：2007-08-30

    申请号：US11513601

    申请日：2006-08-31

    申请人： Wen Wu ,  Kuo-Cheng Huang ,  Chien-Shing Lee ,  Jung-Ru Yu

    发明人： Wen Wu ,  Kuo-Cheng Huang ,  Chien-Shing Lee ,  Jung-Ru Yu

    IPC分类号： G01B11/02

    CPC分类号： G01B11/272

    摘要： A device for measuring a lens, comprising a first interferometer having a first optical axis and carried on a first adjustment base, a lens holder for holding the lens having a first surface having a first lens optical axis and a second surface having a second lens optical axis, and a platen having a sliding rail and carrying the first adjustment base and the lens holder thereon, wherein the lens holder is movable on the sliding rail, wherein each of the first adjustment base and the lens holder has a tetra-axis adjustment mechanism through which a relative positional relationship of the first optical axis of the first interferometer and the first lens optical axis of the first surface of the lens is adjustable.

    摘要翻译： 一种用于测量透镜的装置，包括具有第一光轴并承载在第一调节基座上的第一干涉仪，用于保持具有第一透镜光轴的第一表面的透镜的透镜保持器和具有第二透镜光学的第二表面 以及具有滑动导轨并在其上承载第一调节基座和透镜架的压板，其中透镜保持件可在滑轨上移动，其中第一调节基座和透镜保持器中的每一个具有四轴调节机构 第一干涉仪的第一光轴与透镜的第一表面的第一透镜光轴之间的相对位置关系可调整。

    Lens measuring method and device for determining decenter and tilt of the lens
    5.
    发明授权
    Lens measuring method and device for determining decenter and tilt of the lens 失效
    用于确定透镜的倾斜和倾斜的透镜测量方法和装置

    公开(公告)号：US07535557B2

    公开(公告)日：2009-05-19

    申请号：US11513601

    申请日：2006-08-31

    申请人： Wen-Hong Wu ,  Kuo-Cheng Huang ,  Chien-Shing Lee ,  Jung-Ru Yu

    发明人： Wen-Hong Wu ,  Kuo-Cheng Huang ,  Chien-Shing Lee ,  Jung-Ru Yu

    IPC分类号： G01B9/00 ,  G01B11/02

    CPC分类号： G01B11/272

    摘要： A device for measuring a lens, comprising a first interferometer having a first optical axis and carried on a first adjustment base, a lens holder for holding the lens having a first surface having a first lens optical axis and a second surface having a second lens optical axis, and a platen having a sliding rail and carrying the first adjustment base and the lens holder thereon, wherein the lens holder is movable on the sliding rail, wherein each of the first adjustment base and the lens holder has a tetra-axis adjustment mechanism through which a relative positional relationship of the first optical axis of the first interferometer and the first lens optical axis of the first surface of the lens is adjustable.

    摘要翻译： 一种用于测量透镜的装置，包括具有第一光轴并承载在第一调节基座上的第一干涉仪，用于保持具有第一透镜光轴的第一表面的透镜的透镜保持器和具有第二透镜光学的第二表面 以及具有滑动导轨并在其上承载第一调节基座和透镜架的压板，其中透镜保持件可在滑轨上移动，其中第一调节基座和透镜保持器中的每一个具有四轴调节机构 第一干涉仪的第一光轴与透镜的第一表面的第一透镜光轴之间的相对位置关系可调整。