摘要:
A sealed battery includes a return type safety valve. An annular projection that projects toward a valve body from a valve port is formed on a valve seat for the safety valve. The projection includes a first projection region and a second projection region that are defined by a shape of a tip of the projection and arranged in parallel in a circumferential direction of the valve port. The first projection region and second projection region have different curvature radii in a cross-section of the projection taken along an axial direction of the valve body. The pressure per unit area applied to the second projection region by the valve body is higher than the pressure per unit area applied to the first projection region by the valve body.
摘要:
A sealed battery includes a return type safety valve. An annular projection that projects toward a valve body from a valve port is formed on a valve seat for the safety valve. The projection includes a first projection region and a second projection region that are defined by a shape of a tip of the projection and arranged in parallel in a circumferential direction of the valve port. The first projection region and second projection region have different curvature radii in a cross-section of the projection taken along an axial direction of the valve body. The pressure per unit area applied to the second projection region by the valve body is higher than the pressure per unit area applied to the first projection region by the valve body.
摘要:
A lens array element has a rectangular plate-like external shape, and includes plate surfaces that functions as light transmission surfaces; and a plurality of cellular lenses that are formed on at least one of the plate surfaces. Each of end faces 4 of the rectangular plate-like external shape forms an inclined surface that slants inward from a plate surface 6 on one side toward a plate surface 2 on the other side, and a reference surface 5 perpendicular to the plate surface is formed on a part of at least two adjoining end faces among the end faces. A front view shape of the reference surface region arranged side-by-side with the inclined surface of the end face is a trapezoid, an oblique side 7 of the trapezoid is disposed so as to extend from a plate surface on one side toward the plate surface 2 on the other side, and an upper side 9 of the trapezoid is disposed on a side of the other of the plate surfaces. Regarding the reference surface provided to the rectangular plate-like end face for optical alignment, the occurrence of inaccuracy due to the releasing properties at the time of molding the lends array element using a metal mold is suppressed.
摘要:
A method for investigating a cause of decrease in frequency of abnormality detections for a certain device mounted on a vehicle, wherein when a plurality of abnormality detection conditions are satisfied, the abnormality detection for the certain device is performed to determine if the certain device is in failure, the method includes (i) when the frequency of the abnormality detections is below a predetermined value, disabling one of the abnormality detection conditions; (ii) when the abnormality detection conditions the one of which has been disabled are satisfied, performing an abnormality detection for the certain device; (iii) repeating the step (ii) a plurality of times; and (iv) determining if the disabled abnormality detection condition at that time is the cause of the decrease in the frequency of the abnormality detections, based on frequency of the abnormality detections in the step (iii).
摘要:
An operation support system for a power plant includes an input unit for inputting measured data of the power plant over a communication network, a data evaluating unit for quantitatively evaluating performance deterioration of the power plant and component equipment thereof and creating operation support data base on the input measured data, and an output unit for outputting the operation support data to a computer for confirming operation support data connected thereto over the communication network.
摘要:
In the method for determining a preceding wafer, at least one semiconductor wafer is determined as a preceding wafer among a plurality of semiconductor wafers constituting one lot. The preceding wafer is then subjected to a given process among a plurality of processes for fabrication of a semiconductor device. The determination of the preceding wafer is based on processing results of an upstream process among the plurality of processes performed for the plurality of semiconductor wafers prior to the given process. After examination of processing results of the given process on the preceding wafer, the given process is performed for the plurality of semiconductor wafers other than the preceding wafer.