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1.
公开(公告)号:US4965214A
公开(公告)日:1990-10-23
申请号:US224810
申请日:1988-07-27
申请人: Kyu H. Choi , Jung H. Lee , Heyung-Sub Lee , Tae-Yoon Yook , Dong-Joo Bae
发明人: Kyu H. Choi , Jung H. Lee , Heyung-Sub Lee , Tae-Yoon Yook , Dong-Joo Bae
IPC分类号: H01L27/10 , H01L21/02 , H01L21/822 , H01L21/8244 , H01L27/04 , H01L27/11
CPC分类号: H01L28/20 , H01L27/11 , H01L27/1112 , Y10S148/136 , Y10S438/934
摘要: Method for manufacturing polycrystalline silicon having high resistance, having a first step for depositing a polycrystalline silicon layer for a resistor area over a silicon semiconductor substrate; a second step for growing a first thermal oxide layer having a first specified depth over the polycrystalline silicon layer, ion-implanting with the nitrogen thereon, and growing a second thermal oxide layer having a second specified depth on the ion-implanted layer; a third step for forming a resistor pattern of the polycrystalline silicon with a photo etching method; and a fourth step for ion-implanting impurities in order to decrease the resistance of the polycrystalline silicon as contact regions to be used in resistance contacts with a fixed semiconductor region on the substrate.
摘要翻译: 具有高电阻的多晶硅的制造方法,具有在硅半导体衬底上沉积用于电阻器区域的多晶硅层的第一步骤; 用于生长具有在所述多晶硅层上的第一指定深度的第一热氧化物层的第二步骤,用其上的氮离子注入,以及在所述离子注入层上生长具有第二特定深度的第二热氧化物层; 用蚀刻法形成多晶硅的电阻图案的第三步骤; 以及用于离子注入杂质的第四步骤,以便降低作为用于与衬底上的固定半导体区域的电阻接触的接触区域的多晶硅的电阻。
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公开(公告)号:US5007025A
公开(公告)日:1991-04-09
申请号:US330917
申请日:1989-03-31
申请人: Sang K. Hwang , Tae S. Jung , Kyu H. Choi
发明人: Sang K. Hwang , Tae S. Jung , Kyu H. Choi
IPC分类号: G11C11/41 , G11C5/02 , G11C5/14 , G11C11/34 , G11C11/401 , H01L21/822 , H01L27/04 , H01L27/10
摘要: A memory cell device having circuitry located between memory cell arrays comprises power and ground lines to the circuitry formed directly above the memory cell arrays. The power and ground lines are parallel and positioned in an adjacent alternating pattern such that a power line is positioned adjacent a ground line, which is positioned adjacent another power line and so on. Signal lines carrying signals to and from the circuitry are also formed directly above memory cell arrays.
摘要翻译: 具有位于存储单元阵列之间的电路的存储单元器件包括到存储单元阵列正上方形成的电路的电源和地线。 电源线和接地线平行并且位于相邻的交替图案中,使得电力线位于邻近另一电力线等的接地线附近。 在电路上传送信号的信号线也直接形成在存储单元阵列上方。
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公开(公告)号:US5242851A
公开(公告)日:1993-09-07
申请号:US730419
申请日:1991-07-16
申请人: Kyu H. Choi
发明人: Kyu H. Choi
IPC分类号: H01L21/82 , H01L21/768 , H01L21/8246 , H01L23/525
CPC分类号: H01L27/11266 , H01L21/76888 , H01L23/5252 , H01L2924/0002
摘要: A programmable interconnect device particularly suitable for field programmable ROM, field programmable gate array and field programmable microprocessor code, includes an intrinsic polycrystalline antifuse dielectric layer.
摘要翻译: 特别适用于现场可编程ROM,现场可编程门阵列和现场可编程微处理器代码的可编程互连设备包括本征多晶反熔介质层。
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