公开(公告)号：US20220214377A1

公开(公告)日：2022-07-07

申请号：US17705639

申请日：2022-03-28

申请人： LEENO INDUSTRIAL INC.

发明人： Changhyun Song ,  Jaehwan Jeong

IPC分类号： G01R1/067 ,  G01R31/70 ,  G01R1/04 ,  G01R31/26 ,  G01R31/28

摘要： A test device for a high-speed/high-frequency test. The test device includes: a conductive block which includes a probe hole; at least one signal probe which is supported in an inner wall of the probe hole without contact, includes a first end to be in contact with a testing contact point of the object to be tested, and is retractable in a lengthwise direction; and a coaxial cable which includes a core wire to be in electric contact with a second end of the signal probe. With this test device, the coaxial cable is in direct contact with the signal probe, thereby fully blocking out noise in a test circuit board.

公开(公告)号：US11726111B2

公开(公告)日：2023-08-15

申请号：US17705639

申请日：2022-03-28

申请人： LEENO INDUSTRIAL INC.

发明人： Changhyun Song ,  Jaehwan Jeong

IPC分类号： G01R1/04 ,  G01R1/067 ,  G01R1/073 ,  G01R1/18 ,  G01R31/26 ,  G01R31/28 ,  G01R31/70

CPC分类号： G01R1/06772 ,  G01R1/045 ,  G01R31/26 ,  G01R31/2886 ,  G01R31/70

摘要： A test device for a high-speed/high-frequency test. The test device includes: a conductive block which includes a probe hole; at least one signal probe which is supported in an inner wall of the probe hole without contact, includes a first end to be in contact with a testing contact point of the object to be tested, and is retractable in a lengthwise direction; and a coaxial cable which includes a core wire to be in electric contact with a second end of the signal probe. With this test device, the coaxial cable is in direct contact with the signal probe, thereby fully blocking out noise in a test circuit board.

公开(公告)号：US20200241044A1

公开(公告)日：2020-07-30

申请号：US16850116

申请日：2020-04-16

申请人： LEENO INDUSTRIAL INC.

发明人： Changhyun Song ,  Jaehwan Jeong

IPC分类号： G01R1/067 ,  G01R1/04 ,  G01R31/26 ,  G01R31/28 ,  G01R31/70

摘要： A test device for a high-speed/high-frequency test. The test device includes: a conductive block which includes a probe hole; at least one signal probe which is supported in an inner wall of the probe hole without contact, includes a first end to be in contact with a testing contact point of the object to be tested, and is retractable in a lengthwise direction; and a coaxial cable which includes a core wire to be in electric contact with a second end of the signal probe. With this test device, the coaxial cable is in direct contact with the signal probe, thereby fully blocking out noise in a test circuit board.