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公开(公告)号:US20110143476A1
公开(公告)日:2011-06-16
申请号:US12638424
申请日:2009-12-15
申请人: LIANJUN LIU , LISA H. KARLIN , ALAN J. MAGNUS
发明人: LIANJUN LIU , LISA H. KARLIN , ALAN J. MAGNUS
IPC分类号: H01L21/78
CPC分类号: B81B7/007 , B81B2207/097 , H01L21/50 , H01L23/10 , H01L24/05 , H01L24/06 , H01L24/94 , H01L2224/04042 , H01L2224/05624 , H01L2224/05644 , H01L2224/05647 , H01L2224/06155 , H01L2224/94 , H01L2924/14 , H01L2924/1461 , H01L2924/157 , H01L2924/16152 , H01L2924/16153 , H01L2924/16235 , H01L2924/16251 , H01L2924/167 , H01L2924/16788 , H01L2224/83
摘要: A method for electrically coupling a first wafer with a second wafer is provided. The method includes bonding the first wafer with the second wafer using a bonding material. The method further includes forming an opening in the first wafer in a scribe area of the second wafer to expose a surface of a conductive structure of the second wafer. The method further includes forming a conductive layer overlying the first wafer and the opening in the first wafer such that the conductive layer forms an electrical contact with the conductive structure of the second wafer thereby electrically coupling the first wafer with the second wafer.
摘要翻译: 提供了一种用于将第一晶片与第二晶片电耦合的方法。 该方法包括使用接合材料将第一晶片与第二晶片接合。 该方法还包括在第二晶片的划线区域中的第一晶片中形成开口以暴露第二晶片的导电结构的表面。 该方法还包括形成覆盖第一晶片和第一晶片中的开口的导电层,使得导电层与第二晶片的导电结构形成电接触,从而将第一晶片与第二晶片电耦合。
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公开(公告)号:US20130043564A1
公开(公告)日:2013-02-21
申请号:US13210563
申请日:2011-08-16
申请人: LISA H. KARLIN , Hemant D. Desai
发明人: LISA H. KARLIN , Hemant D. Desai
CPC分类号: B81C1/00269
摘要: A MEMS is attached to a bonding wafer in part by forming a support layer over the MEMS. A first eutectic layer is formed over the support layer. The eutectic layer is patterned into segments to relieve stress. A second eutectic layer is formed over the bonding wafer. A eutectic bond is formed with the segments and the second eutectic layer to attach the bonding wafer to the MEMS.
摘要翻译: 通过在MEMS上形成支撑层,部分地将MEMS连接到接合晶片。 第一共晶层形成在支撑层上。 共晶层被图案化成段以减轻应力。 在接合晶片上形成第二共晶层。 与段和第二共晶层形成共晶键,以将接合晶片附接到MEMS。
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